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http://dx.doi.org/10.7840/kics.2014.39A.10.616

Lifetime Prediction of RF SAW Duplexer Using Accelerated Life Testing  

Kim, Young-Goo (Electronics and Telecommunications Research Institute)
Kim, Tae-Hong (Electronics and Telecommunications Research Institute)
Kang, Sang-Gee (Kunsan National University Department of Information and Telecommunication Engineering)
Publication Information
The Journal of Korean Institute of Communications and Information Sciences / v.39A, no.10, 2014 , pp. 616-618 More about this Journal
Abstract
In this paper, we designed the accelerated life testing(ALT) and presented the lifetime prediction method of the RF SAW duplexer. We determined RF input power as an accelerated stress when designing an accelerating life testing and defined the lifetime of the duplexer as the period during which the insertion loss increased by 0.5[dB]. Lifetime prediction results of duplexer was estimated for 82,900hours at an ambient temperature of $85^{\circ}C$ and RF input power of 30[dBm].
Keywords
SAW Duplexer; Reliability; Accelerated life testing; Lifetime Prediction;
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