• Journal of the Institute of Electronics Engineers of Korea SC
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• v.44 no.5
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• pp.11-17
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• 2007

The appearance inspection of various electronic products and parts has been executed by the eyesight of human. But inspection by eyesight can't bring about uniform inspection result. Because the appearance inspection result by eyesight of human is changed by condition of physical and spirit of the checker. So machine vision inspection system is currently used to many appearance inspection fields instead of the checker. However the inspection result of machine vision is changed by the illumination of workplace. Therefore we have used a power-law transformation and histogram specification in this paper for improvement of vision inspection accuracy. As a result of these power-law transformation and histogram specification algorithm, we could increase the exactness of vision inspection and prevent system error from physical and spirit condition of human. Also this system has been developed only using PC, CCD Camera and Visual C++ for universal workplace.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.46 no.2
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• pp.22-27
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• 2009

In this paper, an automatic functional inspection system EVT (Emulated Vision Tester) for LCD drive module PCB has been proposed and implemented. Typical automatic inspection system such as probing methods and vision-based systems are widely known and used, however, there exist undetectable defects due to critical timing factors which they may miss to catch from LCD equipments. Especially typical vision-based systems have inconsistency on acquisition of images so that distinction between gray scales can be difficult which results in low level of performance and reliability on the inspection results. The proposed EVT system is pure hardware solution. It directly compares pattern signals from a pattern generator to output signals from LCD drive module. It also inspects variety of analog signals such as voltage, resistance, wave forms and so forth. The EVT system not only shows high performance in terms of reliability and processing speed but reduces costs on inspection and maintenance. Also, full automation of entire production line can be realized when EVT is applied in in-line inspection processes.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.33B no.2
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• pp.65-76
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• 1996

This paper describes the issue relating to the design and implementation of a high-precision vision system for monitor inspection. We present several monitor inspection algorithms which evaluate the geometric distrotions of the patterns on the inspection target monitor. Also, to inspect color distortion acquired form color CCD camera into the XYy coordinate, accurately. The proposed monitor inspection system is implemented on IBM PC/486, and the user interface is developed on microsoft windows to assist unskilled users for easy use. Using the developed vision system, Experiments on the inspection accuracy and speed were performed and the results are presented.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.11
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• pp.61-68
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• 2004

Recently, there has been an increasing demand for computer-vision based inspection and/or measurement system as a part of factory automation equipment. Existing manual inspection method can inspect only specific samples and has low measuring accuracy as well as it increases working time. Thus, in order to improve the objectivity and reproducibility, computer-aided analysis method is needed. In this paper, front and side profile inspection and/or data transfer system are developed using computer-vision during the inspection process on three kinds of pipes coming from a forming line. Straight line and circle are extracted from profiles obtained from vision using Laplace operator. To reduce inspection time, Hough Transform is used with clustering method for straight line detection and the center points and diameters of inner and outer circle are found to determine eccentricity and whether good or bad. Also, an inspection system has been built that each pipe's data and images of good/bad test are stored as files and transferred to the server so that the center can manage them.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.38 no.1
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• pp.59-63
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• 2014

Elliptical gears are used in the oval flowmeter and oval flow meter inspects volume of water thanks to space by the elliptical shape. The purpose of this study is to judge accuracy of processing of the elliptical gear and develop inspection system using machine vision. Demand of machine vision is increasing while the factory automation is spreading and principle factor in-process inspection. But, gear inspection using the machine vision rarely used because of complex shape of gear. In this study, it seems possible that elliptical gear is inspected by inspection software using machine vision and inspection program can judge accuracy of processing of the elliptical gear designed this study.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.23 no.11
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• pp.1384-1390
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• 2019

This paper proposes a technological solution for improving the recognition direction of target objects for automatic vision inspection by machine vision. This paper proposes a technological solution for improving the recognition direction of target objects for automatic vision inspection by machine vision. This enables the automatic machine vision inspection to detect the image of the inspection object regardless of the position and orientation of the object, eliminating the need for a separate inspection jig and improving the automation level of the inspection process. This study develops the technology and method that can be applied to the wire harness manufacturing process as the inspection object and present the result of real system. The results of the system implementation was evaluated by the accredited institution. This includes successful measurement in the accuracy, detection recognition, reproducibility and positioning success rate, and achievement the goal in ten kinds of color discrimination ability, inspection time within one second and four automatic mode setting, etc.

• Journal of the Korean Society for Precision Engineering
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• v.24 no.4 s.193
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• pp.44-56
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• 2007

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2002.04a
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• pp.146-148
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• 2002

An automatic inspection vision systems whose development was the industry applications motor rear side member. This system are connected to the 9 ea camera fur the process inspection the bolt, nuts, units in the rear side member product. This automatic inspection vision systems can perform inspection of not attached the bolt, nuts, units, etc fast and accuracy in react time fashion. And then perform very sophisticated inspection which human workers can not perform.

• Journal of the Korean Society for Precision Engineering
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• v.33 no.6
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• pp.491-497
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• 2016

This study aims to develop a vision inspection system for screw threads. To inspect external defects in screw threads, the vision inspection system was developed using front light illumination from which bright images can be obtained. The front light system, however, requires multiple side images for inspection of the entire thread surface, which can be performed by omnidirectional optics. In this study, an omnidirectional optical system was designed to obtain annular images of screw threads using an image sensor and two reflection mirrors; one large concave mirror and one small convex mirror. Optical simulations using backward and forward ray tracing were performed to determine the dimensional parameters of the proposed optical system, so that an annular image of the screw threads could be obtained with high quality and resolution. Microscale surface defects on the screw threads could be successfully detected using the developed annular inspection system.

• Journal of Institute of Control, Robotics and Systems
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• v.19 no.12
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• pp.1072-1080
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• 2013

In a the present day, many vision inspection techniques are used in productive industrial areas. In particular, in the semiconductor industry the vision inspection system for wafers is a very important system. Also, inspection techniques for semiconductor wafer production are required to ensure high precision and fast inspection. In order to achieve these objectives, parallel processing of the inspection algorithm is essentially needed. In this paper, we propose the GPU (Graphical Processing Unit)-based parallel processing algorithm for the fast inspection of semiconductor wafers. The proposed algorithm is implemented on GPU boards made by NVIDIA Company. The defect detection performance of the proposed algorithm implemented on the GPU is the same as if by a single CPU, but the execution time of the proposed method is about 210 times faster than the one with a single CPU.