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Emulated Vision Tester for Automatic Functional Inspection of LCD Drive Module PCB  

Joo, Young-Bok (Department of Electrical Engineering and Computer Science Kyungpook National University)
Han, Chan-Ho (Department of Broadcasting Visual media and Technology Kanwon National University)
Park, Kil-Houm (Department of Electrical Engineering and Computer Science Kyungpook National University)
Huh, Kyung-Moo (Department of Electronics Engineering Dankook University)
Publication Information
Abstract
In this paper, an automatic functional inspection system EVT (Emulated Vision Tester) for LCD drive module PCB has been proposed and implemented. Typical automatic inspection system such as probing methods and vision-based systems are widely known and used, however, there exist undetectable defects due to critical timing factors which they may miss to catch from LCD equipments. Especially typical vision-based systems have inconsistency on acquisition of images so that distinction between gray scales can be difficult which results in low level of performance and reliability on the inspection results. The proposed EVT system is pure hardware solution. It directly compares pattern signals from a pattern generator to output signals from LCD drive module. It also inspects variety of analog signals such as voltage, resistance, wave forms and so forth. The EVT system not only shows high performance in terms of reliability and processing speed but reduces costs on inspection and maintenance. Also, full automation of entire production line can be realized when EVT is applied in in-line inspection processes.
Keywords
LCD Drive Module; Automatic Inspection; Emulated Vision Tester; Pattern;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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