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A Study on the Vision Inspection System for the Defects Detection of Micro-BGA Device  

Park, Young-Soon ((주)에버테크노)
Kim, Joon-Seek (호서대학교 전자공학과)
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Keywords
BGA; Vision system; Inspection; Calibration; Stereo vision;
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Times Cited By KSCI : 1  (Citation Analysis)
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