• Title/Summary/Keyword: Testing time

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Applying Parallel Processing Technique in Parallel Circuit Testing Application for improve Circuit Test Ability in Circuit manufacturing

  • Prabhavat, Sittiporn;Nilagupta, Pradondet
    • 제어로봇시스템학회:학술대회논문집
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    • 2005.06a
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    • pp.792-793
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    • 2005
  • Circuit testing process is very important in IC Manufacturing there are two ways in research for circuit testing improvement. These are ATPG Tool Design and Test simulation application. We are interested in how to use parallel technique such as one-side communication, parallel IO and dynamic Process with data partition for circuit testing improvement and we use one-side communication technique in this paper. The parallel ATPG Tool can reduce the test pattern sets of the circuit that is designed in laboratory for make sure that the fault is not occur. After that, we use result for parallel circuit test simulation to find fault between designed circuit and tested circuit. From the experiment, We use less execution time than non-parallel Process. And we can set more parameter for less test size. Previous experiment we can't do it because some parameter will affect much waste time. But in the research, if we use the best ATPG Tool can optimize to least test sets and parallel circuit testing application will not work. Because there are too little test set for circuit testing application. In this paper we use a standard sequential circuit of ISCAS89.

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Low Cost Endurance Test-pattern Generation for Multi-level Cell Flash Memory

  • Cha, Jaewon;Cho, Keewon;Yu, Seunggeon;Kang, Sungho
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.17 no.1
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    • pp.147-155
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    • 2017
  • A new endurance test-pattern generation on NAND-flash memory is proposed to improve test cost. We mainly focus on the correlation between the data-pattern and the device error-rate during endurance testing. The novelty is the development of testing method using quasi-random pattern based on device architectures in order to increase the test efficiency during time-consuming endurance testing. It has been proven by the experiments using the commercial 32 nm NAND flash-memory. Using the proposed method, the error-rate increases up to 18.6% compared to that of the conventional method which uses pseudo-random pattern. Endurance testing time using the proposed quasi-random pattern is faster than that of using the conventional pseudo-random pattern since it is possible to reach the target error rate quickly using the proposed one. Accordingly, the proposed method provides more low-cost testing solutions compared to the previous pseudo-random testing patterns.

Unit Testing for the AUTOSAR Software Component (AUTOSAR 소프트웨어 컴포넌트의 유닛 테스트 방법)

  • Kum, Dae-Hyun;Lee, Seong-Hun;Park, Gwang-Min;Son, Byeong-Jeom
    • Journal of KIISE:Computing Practices and Letters
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    • v.16 no.11
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    • pp.1061-1065
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    • 2010
  • AUTOSAR, a standard software platform for automotive, has been developed to manage software complexity and improve software reuseability. However Automated and standardized testing is needed to improve reliability and reduce time and effort on testing. Fundamental functionality of AUTOSAR RTE and basic software modules is guaranteed by using an AUTOSAR tool, but application software components have to be tested thoroughly. In this paper, we suggest a test system for the AUTOSAR software component using TTCN-3, a standardized testing language. Test execution system and test cases for the software component are generated automatically from AUTOSAR XML containing software design information. With the proposed testing techniques we can reduce time and effort to build the testing system.

A study on the short-open testing algorithm of the PCB tester (PCB 검사기의 단락측정 알고리즘에 관한 연구)

  • Lee, Yong-Seok;Joung, Hwa-Ja;Kim, Yong-Deak
    • Proceedings of the KIEE Conference
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    • 1988.07a
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    • pp.269-272
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    • 1988
  • This paper deals with the test strategy on the short-open for the printed circuit board. A group testing algorithm, which is the several testing point to be measured redefined as one of the testing points, was suggested. As a result, the total testing time was reduced to 30${\sim}$50 percent.

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Use of Fast Transfer Analysis Cartridges for Cervical Sampling and Real Time PCR Based High Risk HPV Testing in Cervical Cancer Prevention - a Feasibility Study from South India

  • Vijayalakshmi, Ramshankar;Viveka, Thangaraj Soundara;Malliga, JS;Murugan, Kothandaraman;Kanchana, Albert;Arvind, Krishnamurthy
    • Asian Pacific Journal of Cancer Prevention
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    • v.16 no.14
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    • pp.5993-5999
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    • 2015
  • Background: Molecular testing for human papillomavirus (HPV) is the most objective and reproducible of all cervical cancer screening tests and also less demanding in terms of training and quality assurance. However, there is an impending need for cost effective molecular HPV testing methods with sampling ease, easy storage measures and minimum turn around times suitable for a low resource setting. Objective : Our aim was to evaluate the feasibility of using a fast transfer analysis (FTA) mini elute cartridge for cervical sampling to identify high risk HPV by real time PCR and to compare molecular HPV testing and Pap cytology testing to predict histologically confirmed cervical precancer (CIN 2+ lesions) in a cervical cancer prevention program. Materials and Methods: This was conducted as a pilot study (n=200) on women sampled using FTA mini elute cartridges, genotyped by two different real time PCR assays, detecting 13 high risk HPV (HR HPV) species, including HPV16 along with its physical DNA status. Results obtained from each of the tests were compared and analysed using suitable statistical tests. Results: With FTA mini elute cartridge samples HR HPV positivity was seen in 48/200 (24%). Of these, presence of HPV 16 DNA was observed in 28/48 (58.3%) women. High risk HPV was positive in 20% (37/185) of women with benign cytology and 73.3% (11/15) of women with abnormal cytology findings. A very significant correlation (${\chi}^2=22.090$ ; p=0.000) was observed between cytology and HR HPV findings showing an increasing trend of HR HPV prevalence in 50% (1/2) of LSIL, 75% (3/4) of HSIL and 100% (3/3) of SCC. Of the CIN 2+ lesions identified by histopathology, 88.9% (8/9) had HR HPV. A significant association (${\chi}^2=11.223$ ; p=0.001) of HR HPV and histopathologically confirmed CIN 2+ lesions was found. Sensitivity of the two tests were comparable but specificity of Pap testing was better (90.7% vs 70.4%) to predict histopathologically diagnosed cervical precancers. Conclusions: The current study explored the feasibility of using a FTA mini elute cartridge for cervical sampling for the first time in India as a part of a community based cervical cancer prevention program. We suggest that FTA based sampling is suitable and feasible for real time based HPV testing. Molecular HR HPV testing can be more sensitive and useful to identify high risk women requiring Pap testing which is more specific to detect histologically confirmed cervical precancer.

A Study on the operation and Maintenance system for optical subscriber loops using a broadband light source (넓은 대역 광원을 이용한 광 가입자 선로 운용보전 시스템에 관한 연구)

  • 이용기;이영호;박봉근
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.25 no.3B
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    • pp.504-509
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    • 2000
  • This paper presents a noble operation and maintenance system for the optical subscriber loops and its feasibility through several experiments. In this system, a broadband CW (Continuous Wave) light source I used as monitoring of testing signals. and a FGF(Fiber Grating Filter) of which reflective wavelength is independent, is inserted somewhere in each subscriber loop for the reflection of monitoring of testing signals. The propose of the system is quick decision. whether the loop is just fault or not. rather than detailed information of loop state. At present, most of operation and maintenance system for the optical subscriber loops adopts OTDR(optical time domain reflectometer) for testing function. the OTDR is useful for detailed test, but not adequate for simple test because of long testing time . And it is difficult to test PON network by using general OTDR that has a single-wavelength light source. Compared to using OTDR, the proposed system can afford to shorten testing time and to test PON network. Moreover, we can cut down the system cost by simplifying circuits of the optical light sources. Our results show that the proposed system operates well according to the purpose mentioned above.

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Real-time Hybrid Testing a Building Structure Equipped with Full-scale MR dampers and Application of Semi-active Control Algorithms (대형 MR감쇠기가 설치된 건축구조물의 실시간 하이브리드 실험 및 준능동 알고리즘 적용)

  • Park, Eun-Churn;Lee, Sung-Kyung;Lee, Heon-Jae;Moon, Suk-Jun;Jung, Hyung-Jo;Min, Kyung-Won
    • Journal of the Computational Structural Engineering Institute of Korea
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    • v.21 no.5
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    • pp.465-474
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    • 2008
  • The real-time hybrid testing method(RT-HYTEM) is a structural testing technique in which the numerical integration of the equation of motion for a numerical substructure and the physical testing for an experimental substructure are performed simultaneously in real-time. This study presents the quantitative evaluation of the seismic performance of a building structure installed with an passive and semi-active MR damper by using RT-HYTEM. The building model that was identified from the force-vibration testing results of a real-scaled 5-story building is used as the numerical substructure, and an MR damper corresponding to an experimental substructure is physically tested by using the universal testing machine(UTM). The RT-HYTEM implemented in this study is validated because the real-time hybrid testing results obtained by application of sinusoidal and earthquake excitations and the corresponding analytical results obtained by using the Bouc-Wen model as the control force of the MR damper respect to input currents were in good agreement. Also for preliminary study, some semi-active control algorithms were applied to the MR damper in order to control the structural responses optimally. Comparing between the test results of semi-active control using RT-HYTEM and numerical analysis results show that the RT-HYTEM is more resonable than numerical analysis to evaluate the performance of semi-active control algorithms.

The time domain testing technique of RFIC based on specifications (설계사양기반 RF 집적회로의 시간영역 테스팅 기법)

  • Han Seok-Bung;Baek Han-Suk;Kim Kang-Chul
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.5 s.347
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    • pp.34-47
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    • 2006
  • In this paper, a new testing technique for core components of wireless transceiver was proposed. That was, band fault models (including the information of specifications in the analogue and RF IC) and methods which can test specifications in the time domain easily by observing a variation of band fault models in the circuit output were proposed and developed. This technique had an advantage over testing technique in frequency domain because it didn't need expensive test equipments and could reduce the time required. Test technique proposed in this paper was adapted to the test of 5.25 GHz low noise amplifier and proved that this testing technique was efficient in RF IC including low noise amplifier.

Transient Analysis of Electromagnetic Scattering From Dielectric Objects Using Time-Domain Magnetic Field Integral Equation (시간영역 자장 적분방정식을 이용한 유전체의 전자파 산란 과도해석)

  • 서정훈;정백호;한상호;안현수
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.52 no.9
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    • pp.412-417
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    • 2003
  • In this Paper, we propose a time-domain magnetic field integral equation (TD-MFIE) formulation for analyzing the transient electromagnetic response from three-dimensional (3-D) dielectric bodies. The solution method in this paper is based on the Galerkin's method that involves separate spatial and temporal testing procedures. Triangular patch basis functions are used for spatial expansion and testing functions for arbitrarily shaped 3-D dielectric structures. The time-domain unknown coefficients of the equivalent electric and magnetic currents are approximated tv a set of orthonormal basis function that is derived from the Laguerre polynomials. These basis functions are also used for the temporal testing. Numerical results computed by the proposed method are presented and compared.

Study on the Hydrogen Delayed Fracture Property of TRIP Steel by Slow Strain Rate Testing Method (일정 변형률 시험에 의한 TRIP강의 수소 지연파괴 특성연구)

  • Cho, J.H.;Lee, J.K.
    • Corrosion Science and Technology
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    • v.10 no.4
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    • pp.131-135
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    • 2011
  • The demands of high-strength steel have been steadily increased to reduce the weight of vehicles. Although the TRIP steel has been the promising candidate material for the purpose, high strength hinders the application due to the susceptibility to hydrogen delayed fracture in the corrosive environment. Moreover, the testing method was not specified in the ISO standards. In this work, the test method to evaluate the susceptibility of hydrogen delayed fracture was studied by slow strain rate testing technique. The four test experimental parameters were studied : strain rate, hydrogen charging time, holding time after hydrogen charging, and holding time after cadmium plating. The steel was fractured by hydrogen in case the strain rate was in the range of $1{\times}10^{-4}{\sim}5{\times}10^{-7}/sec$. It was confirmed that the slow strain rate test is effective method to evaluate the susceptibility to hydrogen delayed fracture. The holding time over 24 hrs after hydrogen charging, nullified the hydrogen effect, that is, the specimen was no more susceptible to hydrogen after 24 hrs even though the specimen was fully hydrogen-charged. Moreover, cadmium electroplating could not prevent from diffusing out the hydrogen from the steel in the experiment. The effective experimental procedures were discussed.