대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 1988년도 전기.전자공학 학술대회 논문집
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- Pages.269-272
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- 1988
PCB 검사기의 단락측정 알고리즘에 관한 연구
A study on the short-open testing algorithm of the PCB tester
- Lee, Yong-Seok (Dept. of Electronics Eng., Ajou University) ;
- Joung, Hwa-Ja (Dept. of Electronics Eng., Ajou University) ;
- Kim, Yong-Deak (Dept. of Electronics Eng., Ajou University)
- 발행 : 1988.07.01
초록
This paper deals with the test strategy on the short-open for the printed circuit board. A group testing algorithm, which is the several testing point to be measured redefined as one of the testing points, was suggested. As a result, the total testing time was reduced to 30
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