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The time domain testing technique of RFIC based on specifications  

Han Seok-Bung (Dept. of Electronic Engineering, Gyeongsang National University, Engineering Research Institute)
Baek Han-Suk (Korea Aerospace Inc.)
Kim Kang-Chul (Dept. of Computer Engineering, Chonnam National University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.43, no.5, 2006 , pp. 34-47 More about this Journal
Abstract
In this paper, a new testing technique for core components of wireless transceiver was proposed. That was, band fault models (including the information of specifications in the analogue and RF IC) and methods which can test specifications in the time domain easily by observing a variation of band fault models in the circuit output were proposed and developed. This technique had an advantage over testing technique in frequency domain because it didn't need expensive test equipments and could reduce the time required. Test technique proposed in this paper was adapted to the test of 5.25 GHz low noise amplifier and proved that this testing technique was efficient in RF IC including low noise amplifier.
Keywords
time domain testing; RFIC; specification testing; band fault modeling;
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