Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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The time domain testing technique of RFIC based on specifications

설계사양기반 RF 집적회로의 시간영역 테스팅 기법

  • Han Seok-Bung (Dept. of Electronic Engineering, Gyeongsang National University, Engineering Research Institute) ;
  • Baek Han-Suk (Korea Aerospace Inc.) ;
  • Kim Kang-Chul (Dept. of Computer Engineering, Chonnam National University)
  • Published : 2006.05.01
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Abstract

In this paper, a new testing technique for core components of wireless transceiver was proposed. That was, band fault models (including the information of specifications in the analogue and RF IC) and methods which can test specifications in the time domain easily by observing a variation of band fault models in the circuit output were proposed and developed. This technique had an advantage over testing technique in frequency domain because it didn't need expensive test equipments and could reduce the time required. Test technique proposed in this paper was adapted to the test of 5.25 GHz low noise amplifier and proved that this testing technique was efficient in RF IC including low noise amplifier.

본 논문에서는 무선 트랜시버 구성소자들의 완제품 테스팅을 용이하게 할 수 있는 새로운 테스팅 기법을 제안하였다. 즉 RF 집적회로에 존재하는 고장들에 대하여 설계사양의 정보를 포함하는 구간고장모델(band fault model)을 제안하고 이 구간고장모델들의 변화를 회로의 출력에서 그대로 관찰할 수 있도록 함으로써 시간영역에서 설계사양에 대한 테스트를 용이하게 할 수 있는 방식을 제시하였다. 이 방식은 주파수 영역에서 테스트를 행하는 기존의 설계사양 테스트를 시간영역에서 용이하게 테스트할 수 있도록 함으로써 고가의 테스트 장비가 필요 없으며 테스트 시간이 단축되는 장점이 있다. 본 논문에서 제시된 테스팅 기법을 5.25 GHz 저잡음증폭기의 테스트에 적용하여 설계사양을 고려한 시간영역 테스팅 기법이 저잡음증폭기를 비롯한 RF 집적회로의 테스트에 매우 효과적임을 입증하였다.

Keywords

References

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