• Proceedings of the Safety Management and Science Conference
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• 2011.11a
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• pp.535-549
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• 2011

Control chart is most widely used in SPC(Statistical Process Control), Recently it is a critical issue that the standard control chart is not suitable to non-normal process with very small percent defective. Especially, this problem causes serious errors in the reliability procurement, such as semiconductor, high-precision machining and chemical process etc. Procuring process control technique for non-normal process with very small percent defective and perturbation is becoming urgent. Control chart technique in non-normal distribution become very important issue. In this paper, we investigate on research trend of control charts under non-normal distribution with very small percent defective and perturbation, and propose some variable-transformation methods applicable to CUSUM control charts in non-normal process.

• Journal of the Korea Safety Management & Science
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• v.14 no.3
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• pp.167-174
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• 2012

In the manufacturing process the most widely used $\bar{X}$ chart has been applied to control the process mean. Also, Accelerated Life Test(ALT) is commonly used for efficient assurance of product life in development phases, which can be applied in production reliability acceptance test. When life data has lognormal distribution, through censored ALT design so that censored ALT data has asymptotic normal distribution, $ALT\bar{X}$ control chart integrating $\bar{X}$ chart and ALT procedure could be applied to control the mean of process in the manufacturing process. In the situation that process variation is controlled, $Z_p$ control chart is an effective method for the very small fraction nonconforming of quality characteristic. A simultaneous control scheme with $ALT\bar{X}$ control chart and $Z_p$ control chart is designed for the very small fraction nonconforming of product lifetime.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.21 no.45
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• pp.237-246
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• 1998

In most statistical process control(SPC), control charts are used in which samples are taken and a suitable statistic is determined and plotted. In these control charts, control limits, ${\mu}{\pm}textsc{k{\sigma}}$, from which a decision is made are mostly ${\mu}{\pm}3{\sigma}$ and current literature in control charts are mainly concerned with detecting a shift in the mean. Therefore, when $\sigma$ is increased considerably after a long time, using control limits set at the first time causes a great deal of economic loss. In this paper the solutions to determine new control limits which maximizes the profit per unit produced and reduce $\sigma$ to economically optimal level for a certain cost when $\sigma$ is increased due to process deterioration are proposed. By applying new control limits, $\alpha$ error decreases considerably compared to apply initial control limits when $\sigma$ is increased due to process deterioration. Therefore, false alarm investigation cost drops down to the level of initial a error. And also this solution provides useful information regarding replacement of a process when the process is reviewed regularly.

• Journal of Institute of Control, Robotics and Systems
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• v.4 no.2
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• pp.246-255
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• 1998

This paper presents a novel method for real-time malfunction detection of plasma etching process using EPD signal traces. First, many reference EPD signal traces are collected using monochromator and data acquisition system in normal etching processes. Critical points are defined by applying differentiation and zero-crossing method to the collected reference signal traces. Critical parameters such as intensity, slope, time, peak, overshoot, etc., determined by critical points, and frame attributes transformed signal-to symbol of reference signal traces are saved. Also, UCL(Upper Control Limit) and LCL(Lower Control Limit) are obtained by mean and standard deviation of critical parameters. Then, test EPD signal traces are collected in the actual processes, and frame attributes and critical parameters are obtained using the above mentioned method. Process malfunctions are detected in real-time by applying SPC(Statistical Process Control) method to critical parameters. the Real-time malfunction detection method presented in this paper was applied to actual processes and the results indicated that it was proved to be able to supplement disadvantages of existing quality control check inspecting or testing random-selected devices and detect process malfunctions correctly in real-time.

• Communications for Statistical Applications and Methods
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• v.17 no.3
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• pp.357-365
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• 2010

This paper considers the integrated process control procedure for detecting special causes in an IMA(1,1) noise process that is being adjusted using a minimum mean squared error adjustment. As a SPC procedure, we use a GLR chart for detecting special causes whose effects are the sustained shift or the sustained drift in the process mean, and the sustained shift in the process variance. For the design of the GLR chart, we derive expressions for the control limit which accurately satisfies the given in-control ARL.

• Journal of Korean Society for Quality Management
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• v.30 no.4
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• pp.1-14
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• 2002

Traditional SPC techniques are looking out variation of process by fixed sampling interval and fixed sample size about every hour, the process of in-control or out-of-control couldn't be detected actually when the sample points are plotted near control limits, and it takes no notice of expense concerned with such sample points. In this paper, to overcome that, consider VSI(variable sampling interval) EWMA control charts which VSI method is applied. The VSI control charts use a short sampling internal if previous sample points are plotted near control limits, then the process has high probability of out-of-control. But it uses a long sampling interval if they are plotted near centerline of the control chart, since process has high possibility of in-control. And then a comparison and analysis between FSI(fixed sampling interval) and VSI EWMA in the statistical aspect and economic aspect is studied. Finally, we show that VSI EWMA control chart is more efficient than FSI EWMA control chart in the both aspects.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.26 no.3
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• pp.39-49
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• 2003

Statistical process cintrol is intended to assist operators of a stable system in monitoring whether a change has occurred in the process, and it uses several control charts as main tools. In design and use of control chart, it is rational that probability of false alarm is minimized in stable process and probability of detecting shifts is maximized in out-of-control. In this study, we establish bootstrap control limits for robust M-estimator chart by applying the bootstrap method, called resampling, which could not demand assumptions about pre-distribution when the process is skewed and/or the normality assumption is doubt. The results obtained in this study are summarized as follows : bootstrap M-estimator control chart is developed for applying bootstrap method to M-estimator chart, which is more robust to keep ARL when process contain contaminate quality characteristic.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.36 no.2
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• pp.56-62
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• 2013

Control chart is representative tool of Statistical Process Control (SPC). But, it is not given information about the economic loss that occurs when a product is produced characteristic value does not match the target value of the process. In order to manage the process, we should consider not only stability of the variation also produce products with a high degree of matching the target value that is most ideal quality characteristics. There is a need for process control in consideration of economic loss. In this paper, we design a new control chart using the quadratic loss function of Taguchi. And we demonstrate effectiveness of new control chart by compare its ARL with ${\overline{x}}-R$ control chart.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.25 no.2
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• pp.1-10
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• 2002

Process capability indices are widely used in industries and quality assurance system. In past years, process capability analysis have been used to characterize process performance on the basis of univariate quality characteristics. However, in actual manufacturing industrial, statistical process control (SPC) often entails characterizing or assessing processes or products based on more than one engineering specification or quality characteristic. Therefore, the analysis have to be required a multivariate statistical technique. This paper introduces to multivariate capability indices and then selects a multivariate process capability index incorporated both the process variation and the process deviation from target among these indices under the multivariate normal distribution. We propose a new multivariate capability index $MC_{pm}^+$ using quality loss function instead of the process variation and this index is compared with the proposed indices when quality characteristics are independent and dependent of each other.

• Proceedings of the IEEK Conference
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• 2002.07a
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• pp.22-25
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• 2002

The Mass production of ceramic heater has encountered with the estimation for the proper parameters of the printing conditions. This paper presents a method to estimate the squeegee pressure. It uses resistance distribution from the trial run with approximate squeegee pressure which comes from statistical process control (SPC). Then, the resistance distribution and its total resistance are input to the backpropagation neural networks that can recognize resistance's distribution patterns. The value of output network derived from the input value can identify to the appropriate squeegee pressure. The experimental results are demonstrated In ensure the efficiency and the reliability of this method with the accuracy 96.75 percent. Indeed, embedded on this method will aid us to reduce the loss from the normal mass production.