• 대한치과보철학회지
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• 제34권1호
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• pp.143-150
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• 1996

The purpose of this study was to evaluate the tensile strength of solder joint between gold alloy and nickel-chromium alloy. The specimens were made with type III gold alloys and Ni-Cr-Be alloy and Degular Lot 2 solder. Eighteen paired specimens were made, and subdivided into three groups. Group I specimens were gold alloy-gold alloy combination, Group II specimens were gold alloy-Ni-Cr alloy combination, Group III specimens were Ni-Cr alloy-Ni-Cr alloy combination. Solder block were made with solder investment(Degussa A,G, Germany) and stored in room temperature for 24 hours. To reduce the formation of metallic oxide and increase wetting properties, flux was used before preheating and soldering procedure. The specimens were preheated at $650^{\circ}C$ and flux were applied again and gas-oxygen torch was used to solder the specimen. All soldered specimens were subjected to a tensile force in the Instron universal testing machine : the crosshead speed was 1 mm/mim. Tensile strength values of three soldered joint groups were 1. Gold alloy-Gold alloy solder joint : $$48.8kg/mm^2$$ 2. Gold alloy-Ni-Cr alloy solder joint : $$30.9kg/mm^2$$ 3. Ni-Cr alloy-Ni-Cr alloy solder joint : $$31.8kg/mm^2$$ The microscopic examination of fracture site showed cohesive and combination fracture modes in gold alloy specimens, but showed all adhesive fracture modes in Ni-Cr alloy containing specimens.

• 마이크로전자및패키징학회지
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• 제9권3호
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• pp.31-36
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• 2002

PBGA에 비해 상대적으로 큰 칩을 실장하는 고속 SRAM용 153 FC-BGA을 대상으로 2차 솔더접합부의 신뢰성을 평가하였다. 실험은 열사이클 시험에서 발생하는 단면과 양면 실장, 패키지 구조, 언더 필 재료, 기판의 종류와 두께, 솔더 볼의 크기에 따른 영향을 분석하였다. BT기판의 두께가 0.95mm에서 1.20mm로 증가하고, 낮은 영률 의 언더 필 재료에서 솔더접합부의 피로 수명이 30% 향상됨을 확인하였다. 또한 솔더 볼의 크기가 0.76 mm에서 0.89mm로 증가하면, 솔더접합부에서 균열에 대한 저항성은 2배 정도 증가하였다.

• Journal of Welding and Joining
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• 제33권3호
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• pp.19-24
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• 2015

Joint properties of electric control unit (ECU) module using Sn-Cu-(X)Al(Si) lead-free solder alloy were investigated for automotive electronics module. In this study, Sn-0.5Cu-0.01Al(Si) and Sn-0.5Cu-0.03Al(Si) (wt.%) lead-free alloys were fabricated as bar type by doped various weight percentages (0.01 and 0.03 wt.%) of Al(Si) alloy to Sn-0.5Cu. After fabrications of lead-free alloys, the ball-type solder alloys with a diameter of 450 um were made by rolling and punching. The melting temperatures of 0.01Al(Si) and 0.03Al(Si) were 230.2 and $230.8^{\circ}C$, respectively. To evaluation of properties of solder joint, test printed circuit board (PCB) finished with organic solderability perseveration (OSP) on Cu pad. The ball-type solders were attached to test PCB with flux and reflowed for formation of solder joint. The maximum temperature of reflow was $260^{\circ}C$ for 50s above melting temperature. And then, we measured spreadability and shear strength of two Al(Si) solder materials compared to Sn-0.7Cu solder material used in industry. And also, microstructures in solder and intermetallic compounds (IMCs) were observed. Moreover, thickness and grain size of $Cu_6Sn_5$ IMC were measured and then compared with Sn-0.7Cu. With increasing the amounts of Al(Si), the $Cu_6Sn_5$ thickness was decreased. These results show the addition of Al(Si) could suppress IMC growth and improve the reliability of solder joint.

• 마이크로전자및패키징학회지
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• 제17권2호
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• pp.41-47
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• 2010

PCB와 BGA 패드의 형태가 무연솔더 접합부의 기계적 특성에 미치는 영향을 연구하었다. 현재 BGA/PCB 패드의 형태는 NSMD (Non-Solder Mask Defined)와 SMD (Solder Mask Defined) 두 가지 구조로 형성되어 있다. 본 연구에서는 OSP 도금처리한 무연솔더(Sn-3.0Ag-0.5Cu, Sn-1.2Ag-0.5Cu)의 패드 형태를 NSMD, SMD로 달리하여 낙하충격시험, 굽힘충격시험, 고속전단시험을 통한 솔더 접합부의 기계적 특성을 연구하였다. 낙하충격과 굽힘충격시험의 경우 패드 구조에 따른 솔더볼 접합부의 특성수명은 동일한 경향을 나타내었으며, 솔더접합부의 기계적 특성은 SMD가 NSMD보다 우수하였다. 이 이유는 SMD의 경우 낙하충격 시험과 고속 전단시험 모두 IMC에서 파단이 일어난 반면에 NSMD의 경우 낙하충격 시험 후의 파단면은 패턴을 감싸고 있는 랜드 상단 모서리 부분에서 파단이 일어났기 때문인 것으로 판단된다. 전단시험의 경우에는 NSMD 접합부에서 패드 lift현상이 발생하였다. 따라서 BGA/PCB의 패드구조의 조합은 SMD/SMD > SMD/NSMD > NSMD/SMD > NSMD/NSMD 순으로 기계적 특성 수명이 우수하였다.

• 대한금속재료학회지
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• 제47권4호
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• pp.261-266
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• 2009

The mechanical and electrical properties of ball grid array (BGA) solder joints were measured, consisting of Sn-3.5Ag, with organic solderability preservative (OSP)-finished Cu pads and Electroless Nickel/Immersion Gold (ENIG) surface finishes. The mechanical properties were measured by die shear test. When ENIG PCB was upper joint and OSP PCB was lower joint, the highest shear force showed at the third reflow. When OSP PCB was upper joint and ENIG PCB was lower joint, the highest shear force showed at the forth reflow. For both joints, after the die shear results reached the highest shear force, shear force decreased as a function of increasing reflow number. Electrical property of the solder joint decreased with the function of increasing reflow number. The scanning electron microscope results show that the IMC thickness at the bonding interface gets thicker while the number of reflow increases.

• Applied Microscopy
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• 제46권3호
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• pp.167-169
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• 2016

Solder/electroless nickel immersion gold (ENIG) joint sample which is comprised of dissimilar materials with different mechanical properties has limited the level of success in preparing thin samples for transmission electron microscopy (TEM). This short technical note reports the operation parameters for ultramicrotomy of solder joint sample and TEM analysis results. The solder joint sample was successfully sliced to 50~70 nm thick lamellae at slicing speed of 0.8~1.2 mm/s using a boat-type $45^{\circ}$ diamond knife. Ultramicrotomy can be applied as a routine sample preparation technique for TEM analysis of solder joints.

• 제어로봇시스템학회논문지
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• 제7권3호
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• pp.246-254
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• 2001

In this paper, we described an approach to the automation of visual inspection of BGA solder joint defects of surface mounted components on printed circuit board by using neural network. Inherently, the BGA solder joints are located underneath its own package body, and this induces a difficulty of taking good image of the solder joints by using conventional imaging systems. To acquire the cross-sectional image of BGA sol-der joint, X-ray cross-sectional imaging method such as laminography and digital tomosynthesis has been cur-rently utilized. However, the cross-sectional image obtained by using laminography or DT methods, has inher-ent blurring effect and artifact. This problem has been a major obstacle to extract suitable features for classifi-cation. To solve this problem, a neural network based classification method is proposed int his paper. The per-formance of the proposed approach is tested on numerous samples of printed circuit boards and compared with that of human inspector. Experimental results reveal that the method provides satisfactory perform-ance and practical usefulness in BGA solder joint inspection.

• Advances in materials Research
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• 제1권1호
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• pp.83-92
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• 2012

The effect of under-bump-metallization (UBM) on electromigration was investigated at temperatures ranging from $135^{\circ}C$ to $165^{\circ}C$. The UBM structures were examined: 5-${\mu}m$-Cu/3-${\mu}m$-Ni and $5{\mu}m$ Cu. Experimental results show that the solder joint with the Cu/Ni UBM has a longer electromigration lifetime than the solder joint with the Cu UBM. Three important parameters were analyzed to explain the difference in failure time, including maximum current density, hot-spot temperature, and electromigration activation energy. The simulation and experimental results illustrate that the addition 3-${\mu}m$-Ni layer is able to reduce the maximum current density and hot-spot temperature in solder, resulting in a longer electromigration lifetime. In addition, the Ni layer changes the electromigration failure mode. With the $5{\mu}m$ Cu UBM, dissolution of Cu layer and formation of $Cu_6Sn_5$ intermetallic compounds are responsible for the electromigration failure in the joint. Yet, the failure mode changes to void formation in the interface of $Ni_3Sn_4$ and the solder for the joint with the Cu/Ni UBM. The measured activation energy is 0.85 eV and 1.06 eV for the joint with the Cu/Ni and the Cu UBM, respectively.

• Journal of Welding and Joining
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• 제32권3호
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• pp.74-80
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• 2014

Due to environmental regulations (RoHS, WEEE and ELV) of the European Union, electronics and automotive electronics have to eliminate toxic substance from their devices and system. Especially, reliability issue of lead-free solder joint is increasing in car electronics due to ELV (End-of-Life Vehicle) banning from 2016. We have prepared engine control unit (ECU) modules soldered with Sn-40Pb and Sn-3.0Ag-0.5Cu (SAC305) solders, respectively. Degradation characteristics of solder joint strength were compared with various conditions of automobile environment such as cabin and engine room. Thermal cycle test (TC, $-40^{\circ}C$ ~ ($85^{\circ}C$ and $125^{\circ}C$), 1500 cycles) were conducted with automotive company standard. To compare shear strength degradation rate with eutectic and Pb-free solder alloy, we measured shear strength of chip components and its size from cabin and engine ECU modules. Based on the TC test results, finally, we have known the difference of degradation level with solder alloys and use environmental conditions. Solder joints degradation rate of engine room ECU is superior to cabin ECU due to large CTE (coefficient of thermal expansion) mismatch in field condition. Degradation rate of engine room ECU is 50~60% larger than cabin room electronics.

• 한국안전학회지
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• 제27권6호
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• pp.7-13
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• 2012

A lack of study on the dynamic tensile strengths of Sn-based solder joints at high strain rates was the motivation for the present study. A modified miniature Charpy impact testing machine instrumented with an impact sensor was built to quantitatively evaluate the dynamic impact strength of a solder joint under tensile impact loading. This study evaluated the tensile strength of lead-free solder ball joints at strain rates from $1.8{\times}10^3s^{-1}$ and $8.5{\times}10^3s^{-1}$. The maximum tensile strength of the solder ball joint decreases as the load speed increases in the testing range. This tensile strength represented that of the interface because of the interfacial fracture site. The tensile strengths of solder joints between Sn-3.0Ag-0.5Cu and copper substrate were between 21.7 MPa and 8.6 MPa in the high strain range.