• 마이크로전자및패키징학회지
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• 제20권3호
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• pp.45-51
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• 2013

3차원 적층 패키지를 위한 Cu/Sn-3.5Ag 미세범프의 솔더 구조에 따른 금속간화합물 성장거동을 분석하기 위해 솔더 두께가 각각 $6{\mu}m$, $4{\mu}m$인 서로 다른 구조의 미세범프를 $130^{\circ}C$, $150^{\circ}C$, $170^{\circ}C$ 조건에서 실시간 주사전자현미경을 이용하여 실시간 금속간화합물 성장 거동을 분석하였다. Cu/Sn-3.5Ag($6{\mu}m$) 미세범프의 경우, 많은 양의 솔더로 인해 접합 직후 솔더가 넓게 퍼진 형상을 나타내었고, 열처리 시간경과에 따라 $Cu_6Sn_5$ 및 $Cu_3Sn$금속간화합물이 성장한 후, 잔류 Sn 소모 시점 이후 $Cu_6Sn_5$가 $Cu_3Sn$으로 상전이 되는 구간이 존재하였다. 반면, Cu/Sn-3.5Ag($4{\mu}m$) 미세범프의 경우, 적은양의 솔더로 인해 접합 직후 솔더의 퍼짐 현상이 억제 되었고, 접합 직후 잔류 Sn상이 존재하지 않아서 금속간화합물 성장구간이 억제되고, 열처리 시간경과에 따라 $Cu_6Sn_5$가 $Cu_3Sn$으로 상전이 되는 구간만 존재하였다. 두 시편의 $Cu_3Sn$상의 활성화 에너지의 값은 Cu/Sn-3.5Ag($6{\mu}m$) 및 Cu/Sn-3.5Ag($4{\mu}m$) 미세범프가 각각 0.80eV, 0.71eV로 나타났고, 이러한 차이는 반응기구 구간의 차이에 따른 것으로 판단된다. 따라서, 솔더의 측면 퍼짐 보다는 접합 두께가 미세범프의 금속간화합물 반응 기구를 지배하는 것으로 판단된다.

• 한국진공학회지
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• 제10권1호
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• pp.16-21
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• 2001

4원 화합물 반도체인 $Ag_2CdSnSe_4$ 및 $Ag_2CdSnSe_4$:$CO^{2+}$ 단결정을 화학수송법으로 성장시켜 광학적 특성을 조사하였다. 성장된 결정들은 wurtzite 결정구조로서 격자상수는 각각 a = 4.357 $\AA$, c = 7.380 $\AA$($Ag_2CdSnSe_4$:$CO^{2+}$)이었다. 298k에서의 광 흡수 측정으로부터 구한 에너지 띠 간격은 순수한 $Ag_2$CdSnSe의 경우 1.21eV, cobalt 불순물로 첨가한 $Ag_2CdSnSe_4$의 경우 1.02ev이었으며, cobalt를 불순물로 첨가함에 따라 190meV의 에너지 띠 간격의 감소를 보였다. $Ag_2CdSnSe_4$ 결정의 광 흡수 스펙트럼에서 4개의 흡수 피크들을 관측하였으며, 이들 피크 들은 $T_d$결정장내에서 스핀 - 궤도결합효과에 의한 $Co^{2+}$ 이온의 분리된 준위사이의 전자전이에 의한 것으로 설명되었다.

• 한국재료학회지
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• 제15권9호
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• pp.598-603
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• 2005

To develope new lead-free solders with the melting temperature close to that of Sn-37Pb$(183^{\circ}C)$, Sn-0.7Cu-5Pb-1Ga, Sn-0.7Cu-5Pb-1Ag, Sn-0.7Cu-5Pb-5Bi-1Ag, and Sn-0.7Cu-SBi-1Ag alloys were composed by adding low-netting elements such as Ga, Bi, Pb, and Ag to Sn-0.7Cu. Then the melting temperatures, microstructures, wettability, and adhesion properties of these alloys were evaluated. DSC analysis showed that the melting temperature of Sn-0.7Cu-SPb-1Ga was $211^{\circ}C$, and those of other alloys was in the range of $192\~200^{\circ}C$. Microstructures of these alloys after heat-treatment at $150^{\circ}C$ for 24 hrs were basically composed of coarsely- grown $\beta-Sn$ grains, and $Cu_6Sn_5$ and $Ag_3Sn$ intermetallic precipitates. Sn-0.7Cu-5Pb-1Ga and Sn-0.7Cu-5Pb-5Bi-1Ag showed excellent wettability, while Sn-0.7Cu-5Bi-1Ag and Sn-0.7Cu-5Pb-5Bi-1Ag revealed good adhesion strength with the Cu substrates. Among 4 alloys, Sn-0.7Cu-5Pb-5Bi-1Ag with the lowest melting temperature $(192^{\circ}C)$ and relatively excellent wettability and adhesion strength was suggested to be the best candidate solder to replace Sn-37Pb.

• 마이크로전자및패키징학회지
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• 제18권3호
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• pp.33-37
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• 2011

본 연구에서는 Ag-에폭시계 도전성접착제와 Sn도금 부품의 접합체를 이용하여 고온 고습 분위기($85^{\circ}C$/85%RH) 중에서의 미세조직과 전기저항의 변화를 중심으로 계면열화에 미치는 Cl의 영향을 검토하였다. $85^{\circ}C$/85%RH 분위기에서 전형적인 Cl량이 함유된 Ag-에폭시계 도전성접착제를 사용한 접합체의 전기저항은 Cl 함유량이 적은 접합제를 사용한 접합체에 비해 시간의 경과에 따라 급격히 증가하는 경향을 나타내었다. 그 원인을 밝히기 위해 미세조직을 분석한 결과, 고Cl 접합체의 경우, Sn 산화물과 Sn-Cl-O가 Sn도금/Ag-에폭시계 도전성접착제의 계면에 불균일하게 생성되어 있는 반면, 저Cl 접합체에서는 Sn-Cl-O생성이 관찰되지 않았고, Sn산화물도 비교적 적은 것을 알았다. 이러한 결과들을 통해 Ag-에폭시계 도전성접착제에 함유된 Cl이 Ag-에폭시계 도전성접착제와 Sn도금 부품 접합체의 전기적 열화를 가속시키는 원인 중의 하나임을 알았다.

• Journal of Welding and Joining
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• 제29권1호
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• pp.41-45
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• 2011

SnAgCu lead-free solder alloy is considered as the best alternative to eutectic tin-lead solder. However, the detailed material properties of SnAgCu solder are not available in public. Hence, this paper presents an estimation of mechanical properties of SnAgCu lead-free solder. In particular, the weight percent of Ag was varied as 1.0wt%, 2.5wt%, 3.0wt%, and 4.5wt% in order to estimate the effect of Ag in the Sn-xAg-0.5Cu ternary alloy system. For this purpose, four types of SnAgCu bars were first molded by casting and then standard specimens were cut out of molded bars. Micro-Vickers hardness, tensile tests were finally performed to estimate the variations in mechanical properties according to the weight percent of Ag. Test results reveal that the higher the weight percent of Ag is, the higher the hardness, yield strength, and ultimate tensile strength become. More material properties will be further investigated in the future work.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2003년도 기술심포지움 논문집
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• pp.106-109
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• 2003

With the variation of Ag concentration in bath, current density, additive and agitation for electroplating of Sn-Ag solder, the compositions and the morphologies of solder were studied. It was possible to control Ag content in Sn-Ag solder by varying Ag concentration in bath and current density The microstructure size of Sn-Ag solder decreased with increasing current density. Duty cycle of pulse electroplating and quantity of additive affected on Ag content of deposit and surface roughness. In this work eutectic Sn-Ag solder bumps with fine pitch of 30m and height of 15m was formed successfully. The Ag content of electrodeposited solder was confirmed by EDS and WDS analyses and the surface morphologies was analyzed by SEM and 3D surface analyzer.

• 마이크로전자및패키징학회지
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• 제10권4호
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• pp.81-86
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• 2003

상부 칩과 하부 기판이 모두 Si으로 구성되어 있는 플립칩 패키지 시편을 제조하여 Sn-3.5Ag 솔더범프의 electromigration 거동을 분석하였다. Sn-3.5Ag 솔더범프의 electromigration 테스트 초기부터 파단이 일어나기 직전까지는 플립칩 시편의 저항이 거의 변하지 않았으나, 파단이 발생하는 순간 저항값이 크게 증가하였다. 전류밀도 $3\times 10^4$∼$4\times 10^4$A/$\textrm{cm}^2$에서 Sn-3.5Ag 솔더범프의 electromigration에 대한 활성화 에너지는 ∼0.7 eV로 분석되었다. Sn-3.5Ag 솔더범프의 cathode 부위의 솔더/UBM 계면에서 void의 형성 및 전파에 의해 솔더범프의 파단이 발생하였다.

• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 2002년도 Proceedings of the International Welding/Joining Conference-Korea
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• pp.481-486
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• 2002

We have investigated the effects of plating materials for Cu lead (Sn-lOPb, AwPdJNi, Sn-3.5Ag, Sn-3Bi and Sn-0.7Cu) on properties of QFP joints using a Sn-8Zn-3Bi solder. The results were compared with the joints using Sn-3. 5Ag-0. 7Cu and Sn-37Pb solders. As a result, the joints with the Sn-3.5Ag, Sn-3Bi and Sn-0.7Cu plated Cu lead had the reliability comparable to those of the Sn-3.5Ag-0.7Cu and Sn-37Pb soldered joints with respect to the joint strength after the high temperature holding tests at 348K to 423k. In particular, the joint with the Sn-3.5Ag plated Cu lead had the best reliability. This is caused by the low growth rate of a Cu-Sn interfacial reaction layer that degrades the joint strength of the soldered joints. Consequently, the Sn-3.5Ag plating was found to be most feasible plating for the Sn-8Zn-3Bi soldered joint.

• Corrosion Science and Technology
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• 제6권2호
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• pp.50-55
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• 2007

The smaller size and higher integration of advanced electronic package systems result in severe electrochemical reliability issues in microelectronic packaging due to higher electric field under high temperature and humidity conditions. Under these harsh conditions, electronic components respond to applied voltages by electrochemical ionization of metal and the formation of a filament, which leads to short-circuit failure of an electronic component, which is termed electrochemical migration. This work aims to evaluate electrochemical migration susceptibility of the pure Sn, Sn-3.5Ag, Sn-3.0Ag-0.5Cu solder alloys in $Na_{2}SO_{4}$. The water drop test was performed to understand the failure mechanism in a pad patterned solder alloy. The polarization test and anodic dissolution test were performed, and ionic species and concentration were analyzed. Ag and Cu additions increased the time to failure of Pb-free solder in 0.001 wt% $Na_{2}SO_{4}$ solution at room temperature and the dendrite was mainly composed of Sn regardless of the solders. In the case of SnAg solders, when Ag and Cu added to the solders, Ag and Cu improved the passivation behavior and pitting corrosion resistance and formed inert intermetallic compounds and thus the dissolution of Ag and Cu was suppressed; only Sn was dissolved. If ionic species is mainly Sn ion, dissolution content than cathodic deposition efficiency will affect the composition of the dendrite. Therefore, Ag and Cu additions improve the electrochemical migration resistance of SnAg and SnAgCu solders.

• 한국전기전자재료학회논문지
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• 제30권2호
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• pp.119-125
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• 2017

We have studied the effects of Ag on the characteristics of $Sn_{43}Bi_{57}Ag_x$(wt%) lead-free solders for photovoltaic ribbon. Ag atoms in the solder formed an alloy phase of Ag3Sn after reacting with some part of Sn atoms, while they did not react with Bi atoms, but decreased the mean size of Bi solid phase and the thickness of solder. When Ag atoms of 3.0 wt% was added to eutectic $Sn_{43}Bi_{57}$(wt%) solder, it showed the optimally useful results that the peel strength of photovoltaic ribbon greatly increased and the sheet resistance of the solder decreased. In the meanwhile, the eutectic $Sn_{43}Bi_{57}$(wt%) solder showed a low melting temperature of $138.9^{\circ}C$, and showed a very similar result regardless of the added amount of Ag atoms.