• Journal of Korean Society for Quality Management
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• v.28 no.3
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• pp.18-30
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• 2000

Recent studies have shown that the $\bar{X}$ chart with variable sampling intervals(VSI) and the $\bar{X}$ chart with variable sample size(VSS) are much quicker than Shewhart $\bar{X}$ chart in detecting shiks in the process. Shewhart $\bar{X}$ chart has been beneficial to detect large shifts but it is hard to apply Shewhart $\bar{X}$ chart in detecting moderate shifts in the process mean. In this article the $\bar{X}$ chart using variable sample size(VSS) and variable sampling Intervals(VSI) has been proposed to supplement the weak point mentioned above. So the purpose of this paper is to consider finding the design parameters which minimize expected loss costs for unit process time and measure the performance of VSSI(variable sample size and sampling interval) $\bar{X}$ chart. It is important that assignable causes be detected to maintain the process controlled. This paper has been studied under the assumption that one cycle is from starting of the process to eliminating the assignable causes in the process. The other purpose of this article is to represent the expected loss costs in one cycle with three process parameters(sample size, sampling interval and control limits) function and find the three parameters.

• Journal of Korean Society for Quality Management
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• v.32 no.4
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• pp.156-168
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• 2004

This research investigates the statistical efficiency of variable sampling size & sampling interval(VSSI) $\bar{X}$ charts under two assignable causes. Algorithms for calculating the average run length(ARL) and average time to signal(ATS) of the VSSI $\bar{X}$ chart are proposed by employing Markov chain method. States of the process are defined according to the process characteristics after the occurrence of an assignable cause. Transition probabilities are carefully derived from the state definition. Statistical properties of the proposed chart are also investigated. A simple procedure for designing the proposed chart is presented based on the properties. Extensive sensitivity analyses show that the VSSI $\bar{X}$ chart is superior to the VSS or VSI $\bar{X}$ chart as well as to the Shewhart $\bar{X}$ chart in statistical sense, even tinder two assignable causes.

• Journal of Korean Institute of Industrial Engineers
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• v.34 no.3
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• pp.308-317
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• 2008

This research investigates economic characteristics of 2 of 2 runs rules under the Shewhart $\bar{X}$ control chart scheme. A Markov chain approach is employed in order to calculate the in-control average run length (ARL) and the average length of analysis cycle. States of the process are defined according to the process conditions at sampling time and transition probabilities are derived from the state definitions. A steady state cost function is constructed based on the Lorezen and Vance(1986) model. Numerical examples show that 2 of 2 runs rules are economically superior to the Shewhart $\bar{X}$ chart in many cases.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.10 no.16
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• pp.101-106
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• 1987

Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the $\bar{X}$-chart, $\bar{X}$-chart, $\bar{X}$-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart $\bar{X}$-chart. which is the most widely used one in Kora, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for the more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the $\bar{X}$-chart; the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the $\bar{X}$-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based oh a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $\chi$$^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the proposed median chart and the $\bar{X}$ chart was also performed with these examples and the median chart turned out to be superior to the $\bar{X}$-chart.

• Proceedings of the Korean Society for Quality Management Conference
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• 2004.04a
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• pp.64-69
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• 2004

This research investigates statistical characteristics of variable sampling size & interval(VSSI) X charts under two assignable causes. Algorithms for calculating the average run length(ARL) and average time to signal(ATS) of the VSSI X chart are proposed by employing Markov chain method. Extensive sensitivity analysis shows that the VSSI. X chart is superior to the VSS or VSI X chart as well as to the Shewhart X chart in statistical sense, even under two assignable causes.

• Proceedings of the Korean Society for Quality Management Conference
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• 2004.04a
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• pp.507-512
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• 2004

This research investigates economic-statistical characteristics of variable sampling size & interval(VSSI) X charts under two assignable causes. We propose the procedure for designing VSSI X charts, based on Lorenzen and Vance model. Computational experiments show that the VSSI X chart Is superior to the Shewhart X chart in the economic-statistical sense, even under two assignable causes

• Journal of Korean Institute of Industrial Engineers
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• v.31 no.1
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• pp.87-98
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• 2005

This research investigates economic-statistical characteristics of variable sampling size and interval (VSSI)$\bar{X}$charts under two assignable causes. A Markov chain approach is employed in order to calculate average run length (ARL) and average time to signal (ATS). Six transient states are derived by carefully defining the state. A steady state cost rate function is constructed based on Lorenzen and Vance(1986) model. The cost rate function is optimized with respect to six design parameters for designing the VSSI $\bar{X}$ charts. Computational experiments show that the VSSI $\bar{X}$ chart is superior to the Shewhart $\bar{X}$ chart in the economic-statistical sense, even under two assignable causes. A comparative study shows that the cost rate may increase up to almost 30% by overlooking the second cause. Critical input parameters are also derived from a sensitivity study and a few guideline graphs are provided for determining the design parameters.

• Journal of Korean Institute of Industrial Engineers
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• v.39 no.5
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• pp.422-428
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• 2013

In many cases, an $\bar{X}$ control chart which is based on the performance variable is used in industrial fields. However, if the performance variable is too costly or impossible to measure and a less expensive surrogate variable is available, the process may be more efficiently controlled using surrogate variables. In this paper, we propose a model for the economic design of a VSI (Variable Sampling Interval) $\bar{X}$ control chart using a surrogate variable that is linearly correlated with the performance variable. The total average profit model is constructed, which involves the profit per cycle time, the cost of sampling and testing, the cost of detecting and eliminating an assignable cause, and the cost associated with production during out-of-control state. The VSI $\bar{X}$ control charts using surrogate variables are expected to be superior to the Shewhart FSI (Fixed Sampling Interval) $\bar{X}$ control charts using surrogate variables with respect to the expected profit per unit cycle time from economic viewpoint.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.22 no.52
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• pp.347-354
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• 1999

Statistical Process Control(SPC) which uses control charts is widely used to inspect and improve manufacturing process as a effective method. A parametric method is the most common in statistical process control. Shewhart chart was made under the assumption that measurements are independent and normal distribution. In practice, this assumption is often excluded, for example, in case of (equation omitted) chart, when the subgroup sample is small or correlation, it happens that measured data have bias or rejection of the normality test. A bootstrap method can be used in such a situation, which is calculated by resampling procedure without pre-distribution assumption. In this study, applying bootstrap percentile method to (equation omitted) chart, it is compared and evaluated standard process control limit with bootstrap percentile control limit. Also, under the normal and non-normal distributions, where parameter is 0.5, using computer simulation, it is compared standard parametric with bootstrap method which is used to decide process control limits in process quality.

• International Journal of Quality Innovation
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• v.7 no.3
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• pp.107-115
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• 2006

Control charts are important tools of statistical quality control. In 1956, Duncan first proposed the economic design of $\bar{x}-control$ charts to control normal process means and insure that the economic design control chart actually has a lower cost, compared with a Shewhart control chart. An moving average (MA) control chart is more effective than a Shewhart control chart in detecting small process shifts and is considered by some to be simpler to implement than the CUSUM. An economic design of MA control chart has also been proposed in 2005. The weaknesses to only the economic design are poor statistics because it dose not consider type I or type II errors and average time to signal when selecting design parameters for control chart. This paper provides a construction of an economic-statistical model to determine the optimal parameters of an MA control chart to improve economic design. A numerical example is employed to demonstrate the model's working and its sensitivity analysis is also provided.