• Title/Summary/Keyword: Sapphire

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Enhancement in the light extraction efficiency of 405 nm light-emitting diodes by adoption of a Ti-Al reflection layer (Ti-Al 반사막을 이용한 405 nm LED의 광추출 효율 향상)

  • Kim, C.Y.;Kwon, S.R.;Lee, D.H.;Noh, S.J.
    • Journal of the Korean Vacuum Society
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    • v.17 no.3
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    • pp.211-214
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    • 2008
  • GaN-based light-emitting diodes (LEDs) of a 405 nm wavelength have been fabricated on a sapphire substrate by metal organic chemical vapor deposition (MOCVD). In order to reflect the photons, which are generated in the InGaN active region and emitted to the backside, to the front surface, a reflection layer was deposited onto the back of the substrate. Aluminum was used as the reflection layer and Al was deposited on the sample followed by Ti evaporation for firm adhesion of the reflection layer to the substrate. The light extraction efficiency was enhanced 52 % by adoption of the Ti-Al reflection layer.

RF Sputtering으로 증착한 In2O3:C 박막의 구조 전이 연구

  • Kim, Ju-Hyeon;Gang, Hyeon-Cheol
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.422-422
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    • 2012
  • In2O3 계열의 산화물 전도성 투명 전극은 최근 디스플레이, 태양전지 등 전자산업에서 중요한 소재로 전 세계적으로 많이 연구되고 있다. 또한 3.6 eV의 wide bandgap을 가짐으로서 센서 등의 반도체 소자로의 응용가능성이 매우 큰 것으로 알려져 있다. 기존의 연구는 In2O3에 SnO2, Al2O3, Ga2O3 등을 혼합하여 화합물 형태의 투명전극 소재를 개발하고, 전도성 및 투과율 등을 개선시키는데 초점이 맞춰져왔다. 최근에 들어서 나노스케일 물질의 제조 기술 개발로 낮은 차원의 In2O3 나노구조는 센서나 발광다이오드와 같은 전자기기의 제작을 위해서 연구 되었는데, 본 논문에서는 Carbon을 doping하여 p-형 반도체로의 응용 가능성을 고찰하였다. 본 논문에서는 In2O3:C 박막을 radio-frequency magnetron sputtering 방법으로 sapphire(0001) 기판위에 증착하였다. 통상적으로 ceramic target에 carbon을 혼합하여 sintering하여 제작한 ceramic target 대신, In2O3 powder와 CNT를 혼합하여 powder형태의 sputter target을 사용하였다. 박막의 증착 초기에는 매우 평평한 층구조로 성장하였고, 박막의 두께가 증가함에 따라 섬조직이 생성되기 시작하여 표면거칠기가 매우 크게 증가하였다. 박막의 두께가 500 nm 이상이 되면 나노 피라미드가 생성되는데, 이는 In2O3의 결정구조에 기인한 것으로 판단된다.

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Photoluminescence Studies of ZnO Thin Films on Porous Silicon Grown by Plasma-Assisted Molecular Beam Epitaxy

  • Kim, Min-Su;Nam, Gi-Woong;Kim, So-A-Ram;Lee, Dong-Yul;Kim, Jin-Soo;Kim, Jong-Su;Son, Jeong-Sik;Leem, Jae-Young
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.310-310
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    • 2012
  • ZnO thin films were grown on porous silicon (PS) by plasma-assisted molecular beam epitaxy (PA-MBE). The optical properties of the ZnO thin films grown on PS were studied using room-temperature, low-temperature, and temperature-dependent photoluminescence (PL). The full width at half maximum (FWHM) of the near-band-edge emission (NBE) from the ZnO thin films was 98 meV, which was much smaller than that of ZnO thin films grown on a Si substrate. This value was even smaller than that of ZnO thin films grown on a sapphire substrate. The Huang-Rhys factor S associated with the free exciton (FX) emission from the ZnO thin films was found to be 0.124. The Eg(0) value obtained from the fitting was 3.37 eV, with ${\alpha}=3.3{\times}10^{-2}eV/K$ and ${\beta}=8.6{\times}10^3K$. The low- and high-temperature activation energies were 9 and 28 meV, respectively. The exciton radiative lifetime of the ZnO thin films showed a non-linear behavior, which was established using a quadratic equation.

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Single-Crystal like MgB2 thin films grown on c-cut sapphire substrates

  • Duong, Pham Van;Ranot, Mahipal;Kang, Won Nam
    • Progress in Superconductivity and Cryogenics
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    • v.16 no.3
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    • pp.7-9
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    • 2014
  • Single-crystal like $MgB_2$ thin film was grown on (000l) $Al_2O_3$ substrate by using hybrid physical-chemical vapor deposition (HPCVD) system. Single crystal properties were studied by X-ray diffraction (XRD) and the full width at half maximum (FWHM) of the (0001) $MgB_2$ peak is $15^{\circ}$, which is very close to that has been reported for $MgB_2$ single-crystal. It indicates that the crystalline quality of thin film is good. Temperature dependence on resistivity was investigated by physical property measurement system (PPMS) in various applied fields from 0 to 9 T. The upper critical field ($H_{c2}$) and irreversibility field ($H_{irr}$) were determined from PPMS data, and the estimated values are comparable with that of $MgB_2$ single-crystals. The thin film shows a high critical temperature ($T_c$) of 40.4 K with a sharp superconducting transition width of 0.2 K, and a high residual resistivity ratio (RRR=21), it reflects that $MgB_2$ thin film has a pure phase structure.

Preparation of Porous Polymer Monoliths in Supercritical Carbon Dioxide (초임계 이산화탄소를 이용한 다공성 고분자 Monolith 제조)

  • Kang, Se Ran;Ju, Chang Sik
    • Korean Chemical Engineering Research
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    • v.43 no.1
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    • pp.21-26
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    • 2005
  • Experimental researches on the preparation of porous polymeric monoliths in supercritical carbon dioxide have been performed and the effects of monomer and polymerization parameters on the physical properties of the monolith prepared were examined. Polymerizations were carried out in the high pressure stainless steel reactor with sapphire window to show the phase change during the polymerization reaction, and continuous and dry porous monolithic polymer could be obtained. The specific surface area of monolithic polymer increased with monomer contents in reaction mixture and reaction pressure. The Rockwell hardness could be enhanced by the addition of co-monomer MMA in reaction mixtures.

Direct write patterning of ITO film by Femtosecond laser ablations

  • Farson, Dave;Choi, Hae-Woon;Kim, Kwang-Ryul;Hong, Soon-Kug
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07a
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    • pp.583-588
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    • 2005
  • Indium tin oxide (ITO) is a commonly used conducting transparent oxide film (CTO) used in flat panel display applications. Direct write laser ablation is sometimes employed for ITO patterning and it is important that the substrate material and remaining ITO be affected as little as possible by the laser ablation. In this investigation, femtosecond laser ablation of ITO was studied to identify laser processing parameters which cleanly ablated ITO with a minimum of damage to a glass substrate and surrounding ITO. The Ti:Sapphire chirp pulse amplified femtosecond laser used for the experiments had a wavelength of 775nm and produced pulses with a duration of 150fs at a rate of 2 kHz. Ablation was carried out at a sufficiently high panel scanning speed that single ablation spots could be studied. The pulse energy was adjusted to determine feasible spot diameters and depths which could be ablated into the ITO without damaging the glass substrate. Next, ablation of lines without glass damage was also demonstrated. Experiments were also performed with a high repetition rate (100kHz) femtosecond laser.

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Sensing Characteristics of ZnO-based Ethanol Gas Sensor on Ga-doped Nanowires by Hot Walled Pulsed Laser Deposition (온벽 펄스 레이저 증착법을 이용해 합성한 Ga 도핑된 산화아연계 나노선 에탄올 가스 센서의 특성)

  • Jung, Da-Woon;Kim, Kyoung-Won;Lee, Deuk-Hee;Debnath, Pulak Chandra;Kim, Sang-Sig;Lee, Sang-Yeol
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.24 no.7
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    • pp.594-598
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    • 2011
  • We have investigated the sensing properties of ethanol gas sensor with pure ZnO and Ga-doped ZnO nanowires on Au coated (0001) sapphire substrates grown by hot walled pulsed laser deposition. Randomly aligned ZnO nanowires arrays were grown on a Au-electrode patterned under ambient conditions. ZnO nanowires have various sizes and shapes with a different substrate position inside a furnace. The average of length and diameter of the ZnO nanowires were $8\;{\mu}m$ and 100 nm respectively, and confirmed by field emission scanning electron microscopy. Sensitivity chanege characterization of the gas sensor was found that measured sensitivities of the ethanol gas sensors were 83.3% and 68.3% at $300^{\circ}C$ respectively.

Growth and Properties of GaN by Vapor Transport Epitaxy (Vapor Transport Epitaxy에 의한 GaN의 성장과 특성)

  • Lee, Jae-Bum;Kim, Seon-Tai
    • Korean Journal of Materials Research
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    • v.16 no.8
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    • pp.479-484
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    • 2006
  • Highly c-axis oriented poly-crystalline GaN with a dimension of $1{\sim}3\;{\mu}m$ was deposited on $c-Al_2O_3$ substrate by vapor transport epitaxy (VTE) method at the temperature range of $900{\sim}1150^{\circ}C$. XRD intensities from (00'2) plane of grown GaNs were increased with reaction conditions which indicate the improvement of the crystal quality. In the PL spectra measured at 10 K, the spectrum composed with the neutral-donor bound exciton-related emission at 3.47 eV, crystal defect-related emission band at 3.42 eV and with its phonon replicas. The fact that intensity of $I_2$ were increased and FWHM were decreased with growth conditions means that the quality of GaN crystals were improved. With this simple VTE technology, we confirm that the GaNs were simply deposited on sapphire substrate and crystal quality related to optical properties of GaN grown by VTE were relatively good. PL emission without deep level emission in spite of polycrystalline structure can be applicable to the fabrication of large area and low cost optical devices using poly-GaN grown by VTE.

Comparison of Nitrogen and Oxygen Annealing Effects on the Structural, Optical and Electrical Properties of ALD-ZnO Thin Films (ALD법으로 증착한 ZnO 박막의 열처리 분위기에 따른 구조적, 전기적 특성 비교)

  • Park Y. K.;Park A. N.;Lee C. M.
    • Korean Journal of Materials Research
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    • v.15 no.8
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    • pp.514-517
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    • 2005
  • Effects of nitrogen and oxygen annealing on the carrier concentration, carrier mobility, electrical resistivity and PL characteristics as well as the crystallinity of ZnO films deposited on sapphire substrates by atomic layer deposition (ALD). X-ray diffraction (XRD), Scanning electron microscope (SEM), photoluminescence (PL) analyses, and Hall measurement were performed to investigate the crystallinity, optical properties and electrical properties of the ZnO thin films, respectively. According to the XRD analysis results the crystallinity of the ZnO film annealed in an oxygen atmosphere is better than that of the ZnO film annealed in a nitrogen atmosphere. Annealing undoped ZnO films grown by ALD at a high temperature above $600^{\circ}C$ improves the crystallinity and enhances W emission but deteriorates the electrical conductivity of the flms. The resistivity of the ZnO film annealed particularly at $800^[\circ}C$ in a nitrogen atmosphere is much higher than that annealed at the same temperature in an oxygen atmosphere.

Preparation of Zn-Doped GaN Film by HVPE Method (HVPE법에 의한 Zn-Doped GaN 박막 제조)

  • Kim, Hyang Sook;Hwang, Jin Soo;Chong, Paul Joe
    • Journal of the Korean Chemical Society
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    • v.40 no.3
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    • pp.167-172
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    • 1996
  • For the preparation of single-crystalline GaN film, heteroepitaxial growth on a sapphire substrate was carried out by halide vapor phase epitaxy(HVPE) method. The resulting GaN films showed n-type conductivity. The insulator type GaN film was made by doping with Zn(acceptor dopant), which showed emission peaks around 2.64 and 2.43 eV. The result of this study indicates that GaN can be obtained in an epitaxial structure of MIS(metal-insulator-semiconductor) junction. The observed data are regarded as fundamental in developing GaN epitaxial films for light emitting devices of hetero-structure type.

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