• 한국표면공학회:학술대회논문집
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• 한국표면공학회 2003년도 추계학술발표회초록집
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• pp.58-58
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• 2003

Silver doped ZnO (SZO) films were prepared by rf magnetron sputtering on glass substrates with extraordinary designed ZnO target. With the doping source for target, use AgNO$_3$ powder on a various rate (0, 2, and 4 wt.%). We investigated dependence of coating parameter such as dopant content in target and substrate temperature in the SZO films. The SZO films have a preferred orientation in the (002) direction. As amounts of the Ag dopant in the target were increased, the crystallinity and the transmittance and optical band gap were decreased. And the substrate temperature were increased, the crystallinity and the transmittance were increased. But the crystallinity and the transmittance of SZO films were retrograde at 200$^{\circ}C$. Upside facts were related with composition. In addition, the Oxygen K-edge features of the SZO films were investigated by using near edge X-ray absorption fine structure (NEXAFS) spectroscopy. Changes of optical band gap of the SZO films were explained compared with XRD, XPS and NEXAFS spectra.

• 한국진공학회지
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• 제6권3호
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• pp.227-234
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• 1997

ITO, AZO, SZO 투명전도박막의 수소 플라즈마에 대한 안정성에 관하여 연구하였 다. ITO는 Corning 사의 제품을 사용하였고, AZO와 SZO는 rf magnetron sputtering 방법 으로 증착한 것을 이용하였다. 이 세가지 투명전도박막을 PECVD 챔버 내에 장착한 다음, 수소 플라즈마에 노출시켰다. 이 때 ITO 박막의 광투과도는 시편 표면의 온도와 시간이 증 가할수록 감소하였는데 특히 $300^{\circ}C$에서 30분간 노출시켰을 때 10~20%정도의 광투과도를 나타내었으며, 박막의 전도성을 완전히 잃어 버렸다. 반면 AZO와 SZO의 경우, 수소 플라즈 마 노출 온도와 시간에 대해 전반적으로 광투과도 손실이 나타나지 않았다. 하지만 박막내 수소의 유입으로 인하여 흡수대가 단파장 쪽으로 이동하는 'Burstein-Moss'효과가 나타났 다. 또한 표면구조에서도 AZO와 SZO가 수소 플라즈마 노출에 대해 안정성을 보인 반면 ITO의 표면은 indium과 tin의 금속입자로의 환원으로 인해 매우 거칠어짐을 보였다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2015년도 제46회 하계학술대회
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• pp.1151-1152
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• 2015

Silicon zinc oxide (SZO) thin films were deposited via co-sputtering. Two kinds of post-treatment, furnace annealing and hot pressing, were carried out on the deposited SZO films. The effects of the post-treatment on the chemical bond and surface roughness of the deposited SZO films were analyzed as functions of the post-treatment conditions that were used. It was observed from the X-ray photoelectron spectroscopy (XPS) results that the amount of Si-O bonds in the SZO film drastically increased after the low-temperature furnace annealing. The experiment results showed that the hot pressing method would be favorable as it could improve the electrical characteristics of the SZO-TFTs.

• 한국전기전자재료학회논문지
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• 제24권6호
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• pp.480-485
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• 2011

ZnO is an n-type semiconductor with a wide band gap near 3.37 eV. It was known that ZnO films with a resistivity of the order of $10^{-4}\;{\Omega}cm$ is not easy to obtain. 1, 3, and 5wt% Si element were added into ZnO in ordre to improve the electrical and optical characteristics. The Si-doped ZnO (SZO) was grown on a glass substrate by radio frequency (RF) magnetron sputtering at the temperature range from 100 to $500^{\circ}C$. X-ray diffraction (XRD) patterns of SZO film showed preferable crystal orientation of (002) plane. It was confirmed that the lowest resistivity of the SZO films was $2.44{\times}10^{-3}{\Omega}cm$ and SZO films were significantly influenced by the working temperature. The average transmittance of the films was over 80% in the visible ranges.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.218-218
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• 2010

본 연구에서는 투명 전극 대체 물질로써 유망한 ZnO의 전기적 특성 향상을 위하여 IV족 원소인 Si을 1, 3, 5 wt% 첨가하여 SZO 박막을 제작하여 dopant의 앙, 온도 변화에 따른 전기적, 광학적, 구조적 특성을 분석하였다. Rf-magnetron sputtering system을 이용하여 slide glass위에 증착 하였으며 $100{\sim}500^{\circ}C$ 온도 변화를 주었다. 결정성 분석을 위한 XRD 분석 결과 온도 증가에 따라 (002) peak의 세기가 증가하며, Si 첨가량과 관계없이 동일한 2 theta에서 peak가 관측되었다. 미세 구조 분석 결과 입자 크기 또한 온도 증가에 따라 증가함을 확인하였으며, 박막 두께는 대략 300nm로 확인하였다. 모든 SZO 박막은 가시광선 영역에서 80% 이상의 투과율을 보였으며 PL 분석 결과 Si 첨가량과 관계없이 동일한 스펙트럼을 가지며 380 nm, 540 nm 근처에서 peak를 확인하였다. 최소 비저항 값은 5SZO 막에서 $2.44{\times}10^{-3}\;{\Omega}cm^{-1}$을 보였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.283-284
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• 2008

Electrical and optical characteristics of indium tin oxide (ITO) and indium zinc oxide (IZO) films without and with $(SiO_2)_3(ZnO)_7$ at.% (SZO) film deposited on poly(ethylene naphthalate) (PEN) and poly(ethylene terephthalate (PET) substrates as a gas barrier layer for flexible display were studied. The ITO and IZO films with SZO gas barrier layer showed the improved properties which were both the high transmittance of average 80% in the visible light range and the decreased sheet resistance as compared to those of ITO and IZO films without SZO layer. Particularly, the PEN substrate with only SZO gas barrier layer had a low water vapor transmission rate (WVTR) of $\sim10^{-3}g/m^2$/day. Thus, we suggest that the SZO film with protection ability against the water vapor permeation can be applied to gas barrier layer for flexible display.

• Transactions on Electrical and Electronic Materials
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• 제16권6호
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• pp.334-337
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• 2015

Pure ZnO, ZnO nanowires doped with 3 wt.% Ga (3GZO) and doped with 3 wt.% Ag (3SZO) were grown by a hot-walled pulse laser deposition (HW-PLD) technique. The optical and chemical properties of Ga and Ag doped nanowires was analyzed. Nanowires were determined to be under 200 nm in diameter and several μm in length. Change of significant resistance was observed and the gas detection sensitivities of ZnO, 3GZO and 3SZO nanawires were compared. The sensitivities of ZnO, 3GZO, and 3SZO nanowire sensors were measured at 300℃ for 1 ppm of ethanol gas at 97%, 48%, and 203%, respectively.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2009년도 제38회 동계학술대회 초록집
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• pp.138-138
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• 2010

플렉서블 디스플레이에 사용되고 있는 기판은 광학적 투과율이 우수하고 휘어지는 폴리머 기판이 많이 활용되고 있으나 대기중의 수분 및 산소와 같은 가스성분들이 기판을 통해 침투하여 디스플레이의 수명을 감소시킨다. 이러한 문제점을 해결하기 위해 투명하면서 절연특성이 뛰어나고 수분투과 방지 특성이 뛰어난 실리콘 화합물을 기반으로 하는 가스차단막의 연구가 활발히 진행되고 있다. 본 실험에서는 기존의 스퍼터링 장치에 비해 저온공정이면서 구조적으로 뛰어난 박막특성을 얻을 수 있는 대향타겟식 스퍼터링(Facing Targets System, FTS)법을 이용하여 PEN기판 위에 $SiO_x$, $SiO_xN_y$, $(SiO_2)_x(ZnO)_{100-x}$ (SZO)를 단일층또는 다층으로 증착한 박막들의 광학적, 구조적 및 수분 투과 방지 특성들을 알아보았다. $SiO_x$, $SiO_xN_y$, SZO박막들의 광학적 특성을 알아보기 위해 Shimadzu사의 UV-VIS spectrophotometer 장비를 사용하여 측정한 결과 가시광 영역에서 80%이상의 높은 광투과율을 나타내었다. 박막의 수분투과 방지 특성으로 Mocon사의 Permatran W3/31 system을 이용한 투습율을 측정결과 가스 차단막이 없는 Bare PEN에 비해 PEN기판 위에 $SiO_x$와 $SiO_xN_y$ 박막들을 단층 또는 다층으로 증착한 박막의 투습율이 감소한 것을 확인 할 수 있었다. 특히 SZO 박막의 경우 다른 가스차단막들과 비교해 가장 낮은 수분투과율을 나타내었다. 이는 향후 SZO를 기반으로 한 단층박막이나 무기/무기 또는 유기/무기의 다층 박막 형태를 가지는 가스차단막이 플렉서블 디스플레이에 적용 가능할 것이라 사료된다.

• Transactions on Electrical and Electronic Materials
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• 제15권5호
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• pp.262-264
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• 2014

Pristine ZnO, 3 wt.% Ga-doped (3GZO) and 3 wt.% Ag-doped (3SZO) ZnO nanowires (NWs) were grown using the hot-walled pulse laser deposition (HW-PLD) technique. The doping of Ga and Ag in ZnO NWs was observed by analyzing the optical and chemical properties. We optimized the synthesis conditions, including processing temperature, time, gas flow, and distance between target and substrate for the growth of pristine and doped ZnO NWs. The diameter and length of pristine and doped ZnO NWs were controlled under 200 nm and several ${\mu}m$, respectively. Low temperature photoluminescence (PL) was performed to observe the optical property of doped NWs. We clearly observed the shift of the near band edge (NBE) emission by using low temperature PL. In the case of 3GZO and 3SZO NWs, the center photon energy of the NBE emissions shifted to low energy direction using the Burstein Moss effect. A strong donor-bound exciton peak was found in 3 GZO NWs, while an acceptor-bound exciton peak was found in 3SZO NWs. X-ray photoelectron spectroscopy (XPS) also indicated that the shift of binding energy was mainly attributed to the interaction between the metal ion and ZnO NWs.

• 한국전기전자재료학회논문지
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• 제22권11호
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• pp.969-973
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• 2009

In this study, the electrical and optical properties of $(SiO_2)_x(ZnO)_{100-x}$ (SZO) films prepared on the coming 7059 glass substrates by using rf-magnetron sputtering method are investigated. The deposition rate becomes maximum near 3 wt.% and gradually decreases when the $SiO_2$ content further increases. The growth rates of the SZO film with $SiO_2$ content of 3 wt.% is $4\;{\AA}/s$. We found that the average transmittance of all films is over 80% in the wavelength range above 500 nm. The optical band gap were decreased from 3.52 to 3.33 eV as an increase the deposition thickness. X-ray diffraction patterns showed that the film with a relatively low $SiO_2$ content (< 4 wt.%) is amorphous. SZO film with the $SiO_2$ contents of 2 wt.% showed the resistivity of about $3.8{\times}10^{-3}\;{\Omega}{\cdot}cm$. The sheet resistance decreases with increasing the heat treatment temperature.