• Title/Summary/Keyword: SOC (system on chip)

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Embedded ARM based SoC Implementation for 5.8GHz DSRC Communication Modem (임베디드 ARM 기반의 5.8GHz DSRC 통신모뎀에 대한 SOC 구현)

  • Kwak, Jae-Min;Shin, Dae-Kyo;Lim, Ki-Taek;Choi, Jong-Chan
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.43 no.11 s.353
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    • pp.185-191
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    • 2006
  • DSRC((Dedicated Short Range Communication) is dedicated short range communication for wireless communications between RSE(Road Side Equipment) and OBE(On-Board Unit) within vehicle moving high speed. In this paper, we implemented 5.8GHz DSRC modem according to Korea TTA(Telecommunication Technology Association) standard and investigated implementation results and design process for SoC(System on a Chip) embedding ARM CPU which control overall signal and process arithmetic work. The SoC is implemented by 0.11um design technology and 480pins EPBGA package. In the implemented SoC ($Jaguar^{TM}$), 5.8GHz DSRC PHY(Physical Layer) modem and MAC are designed and included. For CPU core ARM926EJ-S is embedded, and LCD controller, smart card controller, ethernet MAC, and memory controller are designed as main function.

An Efficient Test Access Mechanism for System On a Chip Testing (시스템 온 칩 테스트를 위한 효과적인 테스트 접근 구조)

  • Song, Dong-Seop;Bae, Sang-Min;Gang, Seong-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.39 no.5
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    • pp.54-64
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    • 2002
  • Recently System On a Chip(SoC) design based on IP cores has become the trend of If design To prevent the testing problem from becoming the bottleneck of the core-based design, defining of an efficient test architecture and a successful test methodology are mandatory. This paper describes a test architecture and a test control access mechanism for SoC based on IEEE 1149.1 boundary,scan. The proposed SoC test architecture is fully compatible with IEEE P1500 Standard for Embedded Core Test(SECT), and applicable for both TAPed cores and Wrapped cores within a SOC with the same test access mechanism. Controlled by TCK, TMS, TDI, and TDO, the proposed test architecture provides a hierarchical test feature.

Double Precision Integer Divider Using Multiplier (곱셈기를 사용한 배정도 정수 나눗셈기)

  • Song, Hong-Bok;Cho, Gyeong-Yeon
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.14 no.3
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    • pp.637-647
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    • 2010
  • This paper suggested an algorithm that uses a multiplier, 'w bit $\times$ w bit = 2w bit', to process $\frac{N}{D}$ integer division of 2w bit integer N and w bit integer D. An algorithm suggested of the research, when the divisor D is '$D=0.d{\times}2^L$, 0.5 < 0.d < 1.0', approximate value of $\frac{1}{D}$, '$1.g{\times}2^{-L}$', which satisfies '$0.d{\times}1.g=1+e$, e < $2^{-w}$', is defined as over reciprocal number and the dividend N is segmented in small word more than 'w-3' bit, and partial quotient is calculated by multiplying over reciprocal number in each segmented word, and quotient of double precision integer division is evaluated with sum of partial quotient. The algorithm suggested in this paper doesn't require additional correction, because it can calculate correct reciprocal number. In addition, this algorithm uses only multiplier, so additional hardware for division is not required to implement microprocessor. Also, it shows faster speed than the conventional SRT algorithm. In conclusion, results from this study could be used widely for implementation SOC(System on Chip) and etc. which has been restricted to microprocessor and size of the hardware.

Cold Cathode using Avalanche Phenomenon at the Inversion Layer (반전층에서의 애벌런치 현상을 이용한 냉음극)

  • Lee, Jung-Yong
    • Journal of the Korean Vacuum Society
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    • v.16 no.6
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    • pp.414-423
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    • 2007
  • Field Emission Display(FED) has significant advantages over existing display technologies, particularly in the area of small and high quality display. In order to test the feasibility of fabricating the System-on-Chip(SOC) with FED, we conducted the experiment to use the p-n junction as an electron beam source for the flat panel display. A novel structure was constructed to form p-n junctions by generating inversion layer with the electric field from the cantilever style gate. When we applied more than 220V at the cantilever style gate which has a height of $1{\mu}m$, avalanche breakdown onset was successfully achieved. The characteristics was compared with the electron emission from the ultra shallow junction in the avalanche region. The experiment result and the future direction were discussed.

Adaptive Memory Controller for High-performance Multi-channel Memory

  • Kim, Jin-ku;Lim, Jong-bum;Cho, Woo-cheol;Shin, Kwang-Sik;Kim, Hoshik;Lee, Hyuk-Jun
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.6
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    • pp.808-816
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    • 2016
  • As the number of CPU/GPU cores and IPs in SOC increases and applications require explosive memory bandwidth, simultaneously achieving good throughput and fairness in the memory system among interfering applications is very challenging. Recent works proposed priority-based thread scheduling and channel partitioning to improve throughput and fairness. However, combining these different approaches leads to performance and fairness degradation. In this paper, we analyze the problems incurred when combining priority-based scheduling and channel partitioning and propose dynamic priority thread scheduling and adaptive channel partitioning method. In addition, we propose dynamic address mapping to further optimize the proposed scheme. Combining proposed methods could enhance weighted speedup and fairness for memory intensive applications by 4.2% and 10.2% over TCM or by 19.7% and 19.9% over FR-FCFS on average whereas the proposed scheme requires space less than TCM by 8%.

Physical-Aware Approaches for Speeding Up Scan Shift Operations in SoCs

  • Lee, Taehee;Chang, Ik Joon;Lee, Chilgee;Yang, Joon-Sung
    • ETRI Journal
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    • v.38 no.3
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    • pp.479-486
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    • 2016
  • System-on-chip (SoC) designs have a number of flip-flops; the more flip-flops an SoC has, the longer the associated scan test application time will be. A scan shift operation accounts for a significant portion of a scan test application time. This paper presents physical-aware approaches for speeding up scan shift operations in SoCs. To improve the speed of a scan shift operation, we propose a layout-aware flip-flop insertion and scan shift operation-aware physical implementation procedure. The proposed combined method of insertion and procedure effectively improves the speed of a scan shift operation. Static timing analyses of state-of-the-art SoC designs show that the proposed approaches help increase the speeds of scan shift operations by up to 4.1 times that reached under a conventional method. The faster scan shift operation speeds help to shorten scan test application times, thus reducing test costs.

An Efficient Technique to Improve Compression for Low-Power Scan Test Data (저전력 테스트 데이터 압축 개선을 위한 효과적인 기법)

  • Song, Jae-Hoon;Kim, Doo-Young;Kim, Ki-Tae;Park, Sung-Ju
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.10 s.352
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    • pp.104-110
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    • 2006
  • The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time.

Development of Convergent IOT Managing Mindmap System (마인드맵 기반의 사물인터넷 융합 관리 시스템의 개발)

  • Ho, Won;Lee, Dae-Hyun;Bae, Ho-Chul
    • Journal of the Korea Convergence Society
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    • v.10 no.1
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    • pp.45-51
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    • 2019
  • The use of the Internet of things plays a major role in the Fourth Industrial Revolution, and a series of tasks of accumulating, converging, analyzing and reusing various data and services becomes very important. Because the pace and scope if the paradigm shift in Fourth Industrial Revolution is so rapid and unpredictable, the development and utilization of a system to fulfill this role for IOT are urgently required. In this paper, we introduce the Web-based IOT management system, which connects the IOT with OKMindmap, which is a domestic open source software and service, and the Node-RED service. This system combines the advantages of OKMindmap with the advantages of Node-RED, which is capable of visual component based programming, so that it can easily and flexibly connect the IOT based on Web browsers, and various data and services can be integrated and linked. We developed a camera module, a temperature and humidity sensor module, and the motor control module in Raspberry PI basically, and tested the operation successfully. We plan to extend the IOT component gradually by using Arduino and System On Chip.

MLC NAND-type Flash Memory Built-In Self Test for research (MLC NAND-형 Flash Memory 내장 자체 테스트에 대한 연구)

  • Kim, Jin-Wan;Kim, Tae-Hwan;Chang, Hoon
    • Journal of the Institute of Electronics and Information Engineers
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    • v.51 no.3
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    • pp.61-71
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    • 2014
  • As the occupancy rate of the flash memory increases in the storage media market for the embedded system and the semi-conductor industry grows, the demand and supply of flash memory is increasing by a big margin. They are especially used in large quantity in the smart phones, tablets, PC, SSD and Soc(System on Chip) etc. The flash memory is divided into the NOR type and NAND type according to the cell arrangement structure and the NAND type is divided into the SLC(Single Level Cell) and MLC(Multi Level Cell) according to the number of bits that can be stored in each cell. Many tests have been performed on NOR type such as BIST(Bulit-In Self Test) and BIRA(Bulit-In Redundancy Analysis) etc, but there is little study on the NAND type. For the case of the existing BIST, the test can be proceeded using external equipments like ATE of high price. However, this paper is an attempt for the improvement of credibility and harvest rate of the system by proposing the BIST for the MLC NAND type flash memory of Finite State Machine structure on which the pattern test can be performed without external equipment since the necessary patterns are embedded in the interior and which uses the MLC NAND March(x) algorithm and pattern which had been proposed for the MLC NAND type flash memory.

The study of sound source synthesis IC to realize the virtual engine sound of a car powered by electricity without an engine (엔진 없이 전기로 구동되는 자동차의 가상 엔진 음 구현을 위한 음원합성 IC에 관한 연구)

  • Koo, Jae-Eul;Hong, Jae-Gyu;Song, Young-Woog;Lee, Gi-Chang
    • The Journal of the Acoustical Society of Korea
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    • v.40 no.6
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    • pp.571-577
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    • 2021
  • This study is a study on System On Chip (SOC) that implements virtual engine sound in electric vehicles without engines, and realizes vivid engine sound by combining Adaptive Difference PCM (ADPCM) method and frequency modulation method for satisfaction of driver's needs and safety of pedestrians. In addition, by proposing an electronic sound synthesis algorithm applying Musical Instrument Didital Interface (MIDI), an engine sound synthesis method and a constitutive model of an engine sound generation system are presented. In order to satisfy both drivers and pedestrians, this study uses Controller Area Network (CAN) communication to receive information such as Revolution Per Minute (RPM), vehicle speed, accelerator pedal depressed amount, torque, etc., transmitted according to the driver's driving habits, and then modulates the frequency according to the appropriate preset parameters We implemented an interaction algorithm that accurately reflects the intention of the system and driver by using interpolation for the system, ADPCM algorithm for reducing the amount of information, and MIDI format information for making engine sound easier.