• 제목/요약/키워드: Residual Silicon

검색결과 170건 처리시간 0.027초

산화막 CMP에서 리테이닝 링의 인서트 재질이 연마정밀도에 미치는 영향 (Effects of Insert Materials of Retaining Ring on Polishing Finish in Oxide CMP)

  • 박기원;박동삼
    • 한국기계가공학회지
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    • 제18권8호
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    • pp.44-50
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    • 2019
  • CMP is the most critical process in the manufacture of silicon wafers, and the use of retaining rings, which are consumable parts used in CMP equipment, is increasingly important. Since the retaining ring is made of plastic, it is not only weak in strength but also has the problem of taking a long time for the flattening operation of the ring itself performed before the CMP process, and of the imbalance of force due to bolt tightening causing uneven wear. In order to solve this problem, the retaining ring and the insert ring are integrally used, and the flatness of the retaining ring may be affected depending on the material of the insert ring. Also, the residual stress generated in the manufacturing process of the insert ring may cause distortion of the ring, which may adversely affect the precision polishing. In this study, when the insert ring is made of Zn or STS304, the thickness variation and the flatness of the retaining ring are compared and, finally, the material removal rate is analyzed by polishing the wafer by the oxide CMP process. Through these experiments, the effects of the insert ring material on the polishing accuracy of the wafers were investigated.

반도체·디스플레이 탄소중립을 위한 PECVD 챔버세정용 NF3대체가스 개발연구 (Research Progress on NF3 Substitute Gas of PECVD Chamber Cleaning Process for Carbon Neutrality)

  • 조세윤;홍상진
    • 반도체디스플레이기술학회지
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    • 제22권4호
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    • pp.72-75
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    • 2023
  • Carbon neutrality has been emerged as important mission for all the manufacturing industry to reduce energy usage and carbon emission equivalent. Korean semiconductor and display manufacturing industries are also in huge interest by minimize the energy usage as well as to find a less global warming product gases in both etch and cleaning. In addition, Korean government is also investing long term research and development plan for the safe environment in various ways. In this paper, we revisit previous research activities on carbon emission equivalent and current research activities performed in semiconductor process diagnosis research center at Myongji University with respect to the reduction of NF3 usage for the PECVD chamber cleaning, and we present the analytical result of the exhaust gas with residual gas analysis in both 6 inches and 12 inches PECVD equipment. The presented result can be a reference study of the development of new substitution gas in near future to compare the cleaning rate of the silicon oxide deposition chamber.

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60 nm 와 20 nm 두께의 수소화된 비정질 실리콘에 따른 저온 니켈실리사이드의 물성 변화 (Property of Nickel Silicide with 60 nm and 20 nm Hydrogenated Amorphous Silicon Prepared by Low Temperature Process)

  • 김종률;박종성;최용윤;송오성
    • 한국진공학회지
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    • 제17권6호
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    • pp.528-537
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    • 2008
  • ICP-CVD를 사용하여 수소화된 비정질 실리콘(a-Si:H)을 60 nm 또는 20 nm 두께로 성막 시키고, 그 위에 전자총증착장치(e-beam evaporator)를 이용하여 30 nm Ni 증착 후, 최종적으로 30 nm Ni/(60 또는 20 nm a-Si:H)/200 nm $SiO_2$/single-Si 구조의 시편을 만들고 $200{\sim}500^{\circ}C$ 사이에서 $50^{\circ}C$간격으로 40초간 진공열처리를 실시하여 실리사이드화 처리하였다. 완성된 니켈실리사이드의 처리온도에 따른 면저항값, 상구조, 미세구조, 표면조도 변화를 각각 사점면저항측정기, HRXRD, FE-SEM과 TEM, SPM을 활용하여 확인하였다. 60 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 $400^{\circ}C$이후부터 저온공정이 가능한 면저항값을 보였다. 반면 20 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 $300^{\circ}C$이후부터 저온공정이 가능한 면저항값을 보였다. HRXRD 결과 60 nm 와 20 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 열처리온도에 따라서 동일한 상변화를 보였다. FE-SEM과 TEM 관찰결과, 60 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 저온에서 고저항의 미반응 실리콘이 잔류하고 60 nm 두께의 니켈실리사이드를 가지는 미세구조를 보였다. 20 nm a-Si:H 기판위에 형성되는 니켈실리사이드는 20 nm 두께의 균일한 결정질 실리사이드가 생성됨을 확인하였다. SPM 결과 모든 시편은 열처리온도가 증가하면서 RMS값이 증가하였고 특히 20 nm a-Si:H 기판 위에 생성된 니켈실리사이드는 $300^{\circ}C$에서 0.75 nm의 가장 낮은 RMS 값을 보였다.

나노급 다결정 실리콘 기판 위에 형성된 니켈실리사이드의 물성과 미세구조 (Property and Microstructure Evolution of Nickel Silicides on Nano-thick Polycrystalline Silicon Substrates)

  • 김종률;최용윤;송오성
    • 한국산학기술학회논문지
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    • 제9권1호
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    • pp.16-22
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    • 2008
  • 10nm Ni/30 nm와 70nm poly Si/200nm $SiO_2/Si(100)$ 구조로부터 니켈실리사이드의 열적안정성을 연구하기 위해서 쾌속열처리기를 이용하여 실리사이드화 온도 $300{\sim}1100^{\circ}C$에서 40초간 열처리하여 실리사이드를 제조하였다. 준비된 실리사이드의 면저항값 변화, 미세구조, 상 분석, 표면조도 변화를 각각 사점면저항측정기, FE-SEM, TEM, HRXRD, SPM을 활용하여 확인하였다. 30 nm 다결정실리콘 기판 위에 형성된 실리사이드는 $900^{\circ}C$까지 열적안정성이 있었다. 반면에 70 nm 다결정실리콘 기판 위에 형성된 실리사이드는 기존연구결과와 동일한 $700^{\circ}C$ 이상에서 고저항상인 $NiSi_2$로 상변화 하였다. HRXRD로 확인한 결과, 30 nm 두께의 기판 위에 니켈실리사이드는 $900^{\circ}C$ 고온에서도 NiSi상이 유지되다가 $1000^{\circ}C$에서 $NiSi_2$로 상변화 하였다. FE-SEM 과 TEM 관찰결과, 30 nm 두께의 다결정실리콘 기판에서는 $700^{\circ}C$의 저온처리에는 잔류 다결정실리콘 없이 매우 균일하고 평탄한 40 nm의 NiSi가 형성되었고, $1000^{\circ}C$에는 선폭 $1.0{\mu}m$급의 미로형 응집상이 생성됨을 확인하였다. 70 nm 두께의 다결정실리콘 기판에서는 불균일한 실리 사이드 형성과 잔류 다결정실리콘이 존재하였다. SPM결과에서 전체 실험구간에서의 RMS 표면조도 값도 17nm 이하로 CMOS공정의 FUSI게이트 적용의 가능성을 보여주었다. 다결정실리콘 게이트의 높이를 감소시키면 니켈실리사이드는 상안정화가 용이하며 저저항구간을 넓힐 수 있는 장점이 있었다.

Sol-gel 법으로 합성된 SiC-C 복합분말을 사용하여 제조된 Si-SiC의 기계적 특성 및 전기저항 특성 (Mechanical and Electrical Properties of Si-SiC Fabricated Using SiC-C Composite Powders Synthesized by Sol-gel Process)

  • 윤성일;조경선;염미래;임대순;박상환
    • 한국세라믹학회지
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    • 제51권5호
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    • pp.459-465
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    • 2014
  • In this study, Si-SiC composites were fabricated using a Si melt infiltration method using ${\beta}$-SiC/C composite powders synthesized by the carbothermal reduction of $SiO_2-C$ precursors made from a TEOS and a phenol resin. The purity of the synthesized SiC-C composite powders was higher than 99.9993 wt% and the average particle size varied from 4 to $6{\mu}m$ with increasing carbon contents of the $SiO_2-C$ precursors. It was found that the Si-SiC composites fabricated in this study consist of ${\beta}$-SiC and residual Si, without any trace of ${\alpha}$-SiC. The 3-point bending strengths of the fabricated Si-SiC composites were measured and found to be higher than 550 MPa, although the density of the fabricated Si-SiC composite was less than $2.9g/cm^3$. The bending strengths and the densities of the fabricated Si-SiC composites were found to decrease with increasing C/Si mole ratios in the SiC-C composite powders. The specific resistivities of the Si-SiC composites fabricated using the SiC-C composite powders were less than $0.018{\Omega}cm$. With increasing C content in the SiC-C composite powders used for the fabrication of Si-SiC composites, the specific resistivity of the Si-SiC composites was found to slightly increase from 0.0157 to $0.018{\Omega}cm$.

반응소결 탄화규소 다공체의 기계적 특성 (Mechanical Properties of Porous Reaction Bonded Silicon Carbide)

  • 황성식;박상환;한재호;한경섭;김찬목
    • 한국세라믹학회지
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    • 제39권10호
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    • pp.948-954
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    • 2002
  • 차세대 발전 시스템에서 사용되는 고온 가스 필터용 지지층 소재를 제조하기 위하여 용융 Si 침윤 방법으로 기공율이 32∼36%, 주기공 크기가 37∼90 ${\mu}m$ 범위를 갖는 고강도 다공질 반응소결 탄화규소(RBSC)를 개발하였다. 반응소결 탄화규소 다공체의, 최대 파괴강도는 120MPa이었으며, 용융 Si 침윤 방법으로 제조된 반응소결 탄화규소 다공체에서는 SiC 입자 사이에 SiC/Si로 이루어진 기지상이 형성되어 있기 때문에 파괴 강도 및 열충격 특성이 점토 결합 탄화규소 다공체 보다 우수하였다. 반응소결 탄화규소 다공체의 기공율 및 기공 크기는 잔류 Si의 양 및 성형체에 사용한 SiC 입자 크기에 따라 다르게 나타났다.

SiC의 염소화에 의한 다공성 탄소 입자 제조 (Preparation of Porous Carbon by Chlorination of SiC)

  • 박회경;박균영;강태원;장희동
    • 한국입자에어로졸학회지
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    • 제8권4호
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    • pp.173-180
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    • 2012
  • SiC particles, 8.3 ${\mu}m$ in volume average diameter, were chlorinated in an alumina tubular reactor, 2.4 cm in diameter and 32 cm in length, with reactor temperature varied from 100 to $1200^{\circ}C$. The flow rate of the gas admitted to the reactor was held constant at 300 cc/min, the mole fraction of chlorine in the gas at 0.1 and the reaction time at 4 h. The chlorination was negligibly small up to the temperature of $500^{\circ}C$. Thereafter, the degree of chlorination increased remarkably with increasing temperature until $900^{\circ}C$. As the temperature was increased further from 900 to $1200^{\circ}C$, the increments in chlorination degree were rather small. At $1200^{\circ}C$, the chlorination has nearly been completed. The surface area of the residual carbon varied with chlorination temperature in a manner similar to that with the variation of chlorination degree with temperature. The surface area at $1200^{\circ}C$ was 912 $m^{2}/g$. A simple model was developed to predict the conversion of a SiC under various conditions. A Langmuir-Hinshelwood type rate law with two rate constants was employed in the model. Assuming that the two rate constants, $k_{1}$ and $k_{2}$, can be expressed as $A_{1e}^{-E_{1}/RT}$ and $A_{2e}^{-E_{2}/RT}$, the four parameters, $A_{1}$, $E_{1}$, $A_{2}$, and $E_{2}$ were determined to be 32.0 m/min, 103,071 J/mol, 2.24 $m^{3}/mol$ and 39,526 J/mol, respectively, through regression to best fit experimental data.

기계적 가공과 무전해 선택적 증착기술을 이용한 나노/마이크로 금속패턴 제작에 관한 연구 (A Study on Nano/micro Pattern Fabrication of Metals by Using Mechanical Machining and Selective Deposition Technique)

  • 조상현;윤성원;강충길
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2005년도 춘계학술대회 논문집
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    • pp.1507-1510
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    • 2005
  • This study was carried out as a part of the research on the development of a maskless and electroless process for fabricating metal micro/nanostructures by using a nanoindenter and an electroless deposition technique. $2-\mu{m}-deep$ indentation tests on Ni and Cu samples were performed. The elastic recovery of the Ni and Cu was 9.30% and 9.53% of the maximum penetration depth, respectively. The hardness and the elastic modulus were 1.56 GPa and 120 GPa for Ni and 1.49 GPa and 100 GPa for Cu. The effect of single-point diamond machining conditions such as the Berkovich tip orientation (0, 45, and $90^{\circ}$) and the normal load (0.1, 0.3, 0.5, 1, 3, and 5 mN), on both the deformation behavior and the morphology of cutting traces (such as width and depth) was investigated by constant-load scratch tests. The tip orientation had a significant influence on the coefficient of friction, which varied from 0.52-0.66 for Ni and from 0.46-0.61 for Cu. The crisscross-pattern sample showed that the tip orientation strongly affects the surface quality of the machined area during scratching. A selective deposition of Cu at the pit-like defect on a p-type Si(111) surface was also investigated. Preferential deposition of the Cu occurred at the surface defect sites of silicon wafers, indicating that those defect sites act as active sites for the deposition reaction. The shape of the Cu-deposited area was almost the same as that of the residual stress field.

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High aspect ratio wrinkled patterns on polymers by glancing angle deposition

  • Ko, Tae-Jun;Ahmed, Sk. Faruque;Lee, Kwang-Ryeol;Oh, Kyu-Hwan;Moon, Myoung-Woon
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제40회 동계학술대회 초록집
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    • pp.335-335
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    • 2011
  • Instability of a thin film attached to a compliant substrate often leads to emergence of exquisite wrinkle patterns with length scales that depend on the system geometry and applied stresses. However, the patterns that are created using the current techniques in polymer surface engineering, generally have low aspect ratio of undulation amplitude to wavelength, thus, limiting their application. Here, we present a novel and effective method that enables us to create wrinkles with a desired wavelength and high aspect ratio of amplitude over wavelength as large as to 2.5:1. First, we create buckle patterns with high aspect ratio of amplitude to wavelength by deposition of an amorphous carbon film on a surface of a soft polymer poly(dimethylsiloxane) (PDMS). Amorphous carbon films are used as a protective layer in structural systems and biomedical components, due to their low friction coefficient, strong wear resistance against, and high elastic modulus and hardness. The deposited carbon layer is generally under high residual compressive stresses (~1 GPa), making it susceptible to buckle delamination on a hard substrate (e.g. silicon or glass) and to wrinkle on a flexible or soft substrate. Then, we employ glancing angle deposition (GLAD) for deposition of a high aspect ratio patterns with amorphous carbon coating on a PDMS surface. Using this method, pattern amplitudes of several nm to submicron size can be achieved by varying the carbon deposition time, allowing us to harness patterned polymers substrates for variety of application. Specifically, we demonstrate a potential application of the high aspect wrinkles for changing the surface structures with low surface energy materials of amorphous carbon coatings, increasing the water wettability.

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MOCVD법에 의한 TiO2 박막의 제조에 미치는 산소의 영향 (Effects of Oxygen on Preparation of TiO2 Thin Films by MOCVD)

  • 유성욱;박병옥;조상희
    • 한국결정학회지
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    • 제6권2호
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    • pp.111-117
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    • 1995
  • 화학증착법에 의해 TiO2 박막을 Si-wafer(100)위에 제조하였다. Titanium tetraisopropoxide (TTIP)를 출발물질로 하여 200-500℃의 온도범위에서 증착을 행하였다. 증착된 박막의 두께는 Ellipsometry 및 SEM을 사용하여 측정하였으며, 산소의 함량에 따른 증착층의 성분분석은 ESCA를 사용하였다. TiO2 박막의 증착속도는 산소의 함량에 따라 증가하였고, 반응가스인 산소를 공급하지 않았을 때 증착층내에 불순물로 탄소가 존재하였으며, 증착층의 성분은 내부로 갈수록 TiO2에서 Ti로 변하였다. 산소를 600scm 공급하였을 때 증착층내에 소량의 탄소가 존재하였으며, 증착층의 성분은 내부로 갈수록 TiO2에서 TiO, Ti로 됨을 알 수 있었다. 산소를 1200scm공급하였을 때 증착층내에 탄소가 존재하지 않았으며, 증착층 성분은 표면에는 TiO2를 이루나 증착층 내부로 갈수록 Ti복합화합물을 이루고 있었다.

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