1 |
J. S. Yi, J. the Kor. Vacuum Soc. 16(3), 161-166 (2007)
과학기술학회마을
DOI
ScienceOn
|
2 |
J. D. Hwang and K. S. Lee, Journal of The Electrochemical Society, 155, H259-H262 (2008)
DOI
ScienceOn
|
3 |
E. G. Colgan, J. P. Gambino, and Q. Z. Hong, Mater. Sci. Engin., 16, 43 (1996)
DOI
ScienceOn
|
4 |
B. A. Julies, D. Knoesen, R. Pretorius, and D. Adams, Thin Solid Films, 347, 201-207 (1999)
DOI
ScienceOn
|
5 |
Y. Kawazu, H, Kudo, S. Onari, and T. Arai, Japanese J. Appl. Phys., 29(4), 729-738 (1990)
DOI
|
6 |
D. Striakhilev, A. Nathan, Y. Vyganenko, P. Servati, C. H. Lee, and A. Sazonov, Journal of display technology, 2, 364-370 (2006)
DOI
ScienceOn
|
7 |
R. Hattori, Y. Tanida, and J. Shirafuji, Mar. Res. Soc. Proce., 345, 217-222 (1994)
DOI
|
8 |
D. B. Williams, and C. B. Carter, Transmission Electron Microscopy Diffraction II(Plenum Press, NewYork, U.S.A., 1996), pp.273-280
|
9 |
L. A. Clevenger, and C.V. Thompson, J. Appl. Phys., 67(3), 1325-1333 (1990)
DOI
|
10 |
C. H. Pang, K. H. Park, D. G. Jung, and H. Y. Chae, J. the Kor. Vacuum Soc. 16(3), 167-171 (2007)
과학기술학회마을
DOI
ScienceOn
|
11 |
M. C. Poon, C. H. Ho, F. Deng, S. S. Lau, and H. Wong, Microelectronics Reliability, 38, 1495-1498 (1998)
DOI
ScienceOn
|
12 |
D. B. Williams, and C. B. Carter, Transmission Electron Microscopy Basic (Plenum Press, NewYork, U.S.A., 1996), pp.152-170
|
13 |
J. Jang, Materials Today, 9(4), 46-52 (2006)
|
14 |
N. Ibaraki, Mar. Res. Soc. Proce., 345, 3-10 (1994)
DOI
|
15 |
C. W. Mclaughlin, Microdisplay Market Opportunities, in Microdisplay Int. Conference Digest of Tech. Papers, 21-23 (2001)
|
16 |
G. P. Crawford, Flexible Flat Panel Display (John Wiley & Sons Ltd, West Sussex,2005), pp. 264-312
|
17 |
J. P. Gambino and E. G. Colgan, Mater. Chem. Phys., 52, 99 (1998)
DOI
ScienceOn
|
18 |
Lavoie, F. M. d`Heurle, C. Detavernier, and C. Cabral, J. Microelectronic Engin., 70, 144 (2003)
DOI
ScienceOn
|