• Korean Journal of Optics and Photonics
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• v.14 no.6
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• pp.643-648
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• 2003

The phase-shifting diffraction-grating interferometer proposed in the investigation uses a diffraction grating that performs manifold functions of beam splitting, beam recombination, and phase shifting. The reference and measurement waves generated by means of diffraction have different amplitudes depending on their orders of diffraction, so the interference fringe pattern resulting from the two waves tends to yield poor visibility. To cope with this problem, we select a phase grating of reflection type and attempt to improve the interference visibility with optimization of the groove shape of the grating through electromagnetic analysis.

• Journal of the Optical Society of Korea
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• v.10 no.1
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• pp.48-54
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• 2006

White-light scanning interferometry (WLI) and phase shifting interferometry (PSI) are increasingly used for surface topography measurements, particularly for areal measurements. In this paper, we compare surface profiling results obtained from above two optical methods with those obtained from stylus instruments. For moderately rough surfaces ($Ra{\approx}500\;nm$), roughness measurements obtained with WLI and the stylus method seem to provide close agreement on the same roughness samples. For surface roughness measurements in the 50 nm to 300 nm range of Ra, discrepancies between WLI and the stylus method are observed. In some cases the discrepancy is as large as 109% of the value obtained with the stylus method. By contrast, the PSI results are in good agreement with those of the stylus technique.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.31 no.6 s.261
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• pp.659-664
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• 2007

$Moire\'{e}$ interferometry is a useful technique to assess the reliability of electronic package because $Moire\'{e}$ interferometry can measure the whole-field and real-time deformations. The shear strain of a small crack site is important to the reliability assessment of electronic package. The optical limitation of $Moire\'{e}$ interferometry makes ambiguous the shear strain of a small area. An atomic force microscope (AFM) is used to measure the profile of a micro site. High resolution of AFM can apply to the $Moire\'{e}$ technique. AFM $Moire\'{e}$ technique is useful to measure the shear strain of a small area. In this research, the method to accurately measure the deformation of a small area by using AFM $Moire\'{e}$ is proposed. A phase-shifting method is applied to improve the resolution of AFM $Moire\'{e}$.

• Journal of IKEEE
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• v.25 no.1
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• pp.42-46
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• 2021

A novel key exchange cryptographic method utilizing biometric finger print as a user's private key is proposed. Each unknown users' finger print is encrypted by optical phase-shifting interferometry principle and is changed into two ciphers, which are exchanged with the other party over a public communication network for secret key sharing. The transmitted ciphers generate a complex hologram, which is used to calculate a shared secret key for each user. The proposed method provides high security when applied to a secret key sharing encryption system.

• Korean Journal of Optics and Photonics
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• v.14 no.4
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• pp.392-398
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• 2003

We present a novel concept of a phase-shifting diffraction-grating interferometer, which is intended for the optical testing of concave mirrors with high precision. The interferometer is configured with a single reflective diffraction grating, which performs multiple functions of beam splitting, beam recombination, and phase shifting. The reference and test wave fronts are generated by means of reflective diffraction at the focal plane of a microscope objective with large numerical aperture, which allows testing fast mirrors with low f-numbers. The fiber-optic confocal design is adopted for the microscope objective to focus a converging beam on the diffractive grating, which greatly reduces the alignment error between the focusing optics and the diffraction grating. Translating the grating provides phase shifting, which allows measurement of the figure errors of the test mirror to nanometer accuracy.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.6
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• pp.116-123
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• 1998

An interferometric microscope with an improved lateral resolution is presented. The nanometer resolution XY stage is integrated into standard temporal phase shifting interferometer. The nanometer resolution XY stage is used to position specimen in subpixel of CCD detector, therefore CCD detector's sampling is improved. Two scanning algorithms and those simulation results are also presented. The simulation results show that scanning algorithms improve CCD detector's sampling significantly, and interferometeric microscope's lateral resolution is improved also.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.47 no.2
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• pp.51-60
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• 2010

This paper proposes a new scheme to obtain enhanced 3D shape information rapidly for WLPSI(White Light Phase Shifting Interferometry). WLPSI is a convenient method to measure the height of the micro products. First we propose an effective method of limiting search interval for detecting the peak of the visibility function in order to obtain 3D shpae information rapidly. Second we propose an automatic base level decision method basad on image processing and a correction algorithm using the least square approximation method to overcome the global tilt problem of the conventional WLPSI algorithms. Third we propose an adaptive filtering method to remove the distortion known as bat-wing effect which appears near the step discontinuity. Experimental results show that the proposed overall technique is fast and provides more enhanced 3D shape information compared with the conventional WLPSI algorithms.

• Current Optics and Photonics
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• v.4 no.6
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• pp.483-499
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• 2020

In this paper, a novel analog signature scheme is proposed by modifying an RSA-based digital signature scheme with optical phase-shifting digital holography. The purpose of the proposed method is generating an analog signature to provide data confidentiality and security during the data transfer, compared to the digital signature. The holographic encryption technique applied to a hash value reveals an analog-type of pseudo-random pattern in the analog signature scheme. The public key and secret key needed to verify the analog signature are computed from public key ciphers which are generated by the same holographic encryption. The proposed analog signature scheme contains a kind of double encryption in the process of generating signature and key, which enhances security level more than the digital signature. The results of performance simulations show the feasibility of the highly secure signature scheme, and security analysis shows high robustness against known-message attacks and chosen-message attacks. In addition, the proposed method can apply to one-time signature schemes which can be used to sign only one message and it can also apply to authentication, e-mails, electronic banking and electronic data interchange.

• Proceedings of the Korean Society of Broadcast Engineers Conference
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• 2010.07a
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• pp.283-284
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• 2010

디지털 홀로그래피(holography) 기술은 3차원 물체의 정보를 디지털 영상으로 기록하고 복원하는 기술이다. PSI(Phase-shifting interferometry) 디지털 홀로그래피는 여러 장의 간섭 패턴 영상으로부터 홀로그램(hologram)을 합성하고, 이로부터 3차원 영상을 복원하는 대표적인 기법이다. 본 논문에서는 PSI 디지털 홀로그램 생성에 사용되는 여러 장의 간섭 패턴 영상의 효율적인 압축 기법을 제안한다. 먼저 네 개의 간섭패턴 영상에서 JPEG2000 기반의 비트율-왜곡(rate-distortion) 특성을 분석한다. 이에 기반하여 주어진 비트량을 일정 크기 단위로 사용할 때, 복원 영상의 왜곡을 가장 효과적으로 줄일 수 있는 간섭 패턴 영상에 우선적으로 비트량을 할당한다. 실험을 통하여 제안하는 알고리듬은 네 개의 간섭패턴 영상마다 동일한 비트량을 할당하여 압축하는 기존의 방법에 비해 비트율-왜곡 측면에서 복원 영상의 왜곡을 더 효과적으로 줄일 수 있음을 확인한다.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.27 no.11
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• pp.1534-1541
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• 2003

A new window-based, user-friendly fringe analysis system is developed, especially for analyzing noisy interferograms. The system integrates three major techniques, that is fringe tracking, Phase shifting, and Fourier transform, into a single shell by employing a unified procedure. Since the system is made in a modular fashion and all processing modules can be shared for any technique, a user can select necessary modules and easily edit the applying order of them based on the user's analysis strategy, which should be changed depending on the noise level of the image. The system provides a high-level GUI and a variety of image handling tools and therefore users can easily access the system and produce the optimal results without giving up in the middle of a process even for severely noise-contaminated interferometric images.