1 |
P. Sandoz, R. Devillers, and A. Plata, "Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry," J. Mod. Opt. 44, 1997.
|
2 |
안우정, "백색광 위상천이 간섭계에서의 위상 오차의 수치해석 보정," 서울대학교 대학원 박사학위논문, 2005.
|
3 |
Akiko Harasaki, Joanna Schmit, and James C. Wyant, "Improved vertical-scanning interferometry," Appl. Opt. Vol. 39, No. 13, May 2000.
|
4 |
Jonna Schmit and Artur Olszak, "High-Precision Shape Measurement by White-Light Interferometry with Real-Time Scanner Error Correction," Appl. Opt, Vol. 41, No. 28, October 2002.
|
5 |
G. B. Henning, "Masking effects of low-frequency sinusoidal gratings on the detection of contrast modulation in high-frequency carriers," Opt. Soc. Am. Vol. 21, No. 4, 2004.
|
6 |
J. Schwider, R. Burow, J. Grzanna, R. Spolaczyk, and K. Merkel, "Digital Wave Front Measuring Interferometry : Some Systematic Error Suorces," Appl. Opt. 22, 3421-3432, 1983.
DOI
ScienceOn
|
7 |
P. Sandoz, "An algorithm for profilometry by white-light phase-shifting interferometry." J. Mod. Opt. 43, 1996.
|
8 |
J. Schwider, "Phase Shifting Interferometry : Reference Phase Error Reduction," Appl. Opt. 28, pp. 3889-3892, 1989.
DOI
ScienceOn
|
9 |
J. Douglas Faires and Richard Burden, "Numerical Methods," Brooks/Cole Publishing Company, pp. 323-365, 1998.
|
10 |
K.G. Larkin, "Effective nonlinear algorithm for envelope detection in white light interferometry," J. Opt. Soc. Am. A. 4, 1996.
DOI
|