• Title/Summary/Keyword: One-Dimension

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Image Enhancement for Two-dimension bar code PDF417

  • Park, Ji-Hue;Woo, Hong-Chae
    • 한국정보기술응용학회:학술대회논문집
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    • 한국정보기술응용학회 2005년도 6th 2005 International Conference on Computers, Communications and System
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    • pp.69-72
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    • 2005
  • As life style becomes to be complicated, lots of support technologies were developed. The bar code technology is one of them. It was renovating approach to goods industry. However, data storage ability in one dimension bar code came in limit because of industry growth. Two-dimension bar code was proposed to overcome one-dimension bar code. PDF417 bar code most commonly used in standard two-dimension bar codes is well defined at data decoding and error correction area. More works could be done in bar code image acquisition process. Applying various image enhancement algorithms, the recognition rate of PDF417 bar code is improved.

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순위차원라우팅을 사용한 완전 이진트리의 3차원 메쉬로의 링크 충돌 없는 임베딩 (Link-Disjoint Embedding of Complete Binary Trees into 3D-Meshes using Dimension-Ordered Routing)

  • 박상명;이상규;문봉희
    • 한국정보과학회논문지:시스템및이론
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    • 제27권2호
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    • pp.169-176
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    • 2000
  • 본 논문에서는 령크 충돌을 최소화 하는데 중점을 두고 순위차원 라우팅을 사용하여 완전이진트리를 3차원 메쉬로 임베딩하는 방법을 제안한다. 기존의 연구[14]에서는, 완전이진트리를 3차원 메쉬에 임베딩 할 때 순위차원 라우팅을 사용하는 경우 1, 2 차원에서 링크 충돌이 발생하였고, 순위차원 라우팅을 따르지 않는 경우 1차원에서만 링크 충돌이 존재하도록 하는 임베딩 방법을 보였었다. 이와 비교하여 본 논문에서는 순위차원 라우팅을 사용하고 링크 충돌이 존재하지 않는 임베딩 방법을 제안하며, 이 방법에 의해 임베딩을 수행한 결과, 임베딩을 위해 사용된 메쉬의 크기가 최적크기의 1.27 배를 넘지 않음을 증명한다.

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총의치 수직고경 설정에 대한 고찰 (Vertical Dimension in Complete Denture : A Literature Review & Clinical Procedures)

  • 정준용
    • 구강회복응용과학지
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    • 제18권3호
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    • pp.185-195
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    • 2002
  • Purpose This article describes the historic and clinical aspects of the determination of the vertical dimension of occlusion and the synoptic procedure of the determination of the vertical dimension of occlusion in complete denture. The determining procedure of the susceptible vertical dimension of occlusion is one of the most important steps in construction of complete denture and prosthodontic treatment. It is considered essential for the improvement and the recovery of facial esthetics and stomatognathic functions. Results Several methods have been suggested for measurement of the vertical dimension of occlusion in the construction of complete denture and the prosthodontic rehabilitation. These range from pre-extraction records to the use of physiologic rest position, swallowing, phonetics, esthetics and facial proportion, etc. But, there is no universally accepted or completely accurate method. There seems to be no significant advantages of one technique other than those of cost, time and equipment requirements, and seems to be in controversial in determining the vertical dimension. Conclusion The vertical dimension of occlusion should be determined and reinspected carefully by dentist for a successful prosthesis with several methods. The more investigations are necessary for more objective and scientific techniques in determining the vertical dimension of occlusion.

COMINIMAXNESS WITH RESPECT TO IDEALS OF DIMENSION ONE

  • Irani, Yavar
    • 대한수학회보
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    • 제54권1호
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    • pp.289-298
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    • 2017
  • Let R denote a commutative Noetherian (not necessarily local) ring and let I be an ideal of R of dimension one. The main purpose of this note is to show that the category ${\mathfrak{M}}(R,\;I)_{com}$ of I-cominimax R-modules forms an Abelian subcategory of the category of all R-modules. This assertion is a generalization of the main result of Melkersson in [15]. As an immediate consequence of this result we get some conditions for cominimaxness of local cohomology modules for ideals of dimension one. Finally, it is shown that the category ${\mathcal{C}}^1_B(R)$ of all R-modules of dimension at most one with finite Bass numbers forms an Abelian subcategory of the category of all R-modules.

The Gain Estimation of a Fabry-Perot Cavity (FPC) Antenna with a Finite Dimension

  • Kwon, Taek-Sun;Lee, Jae-Gon;Lee, Jeong-Hae
    • Journal of electromagnetic engineering and science
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    • 제17권4호
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    • pp.241-243
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    • 2017
  • In this paper, we have presented an equation for estimating the gain of a Fabry-Perot cavity (FPC) antenna with a finite dimension. When an FPC antenna has an infinite dimension and its height is half of a wavelength, the maximum gain of that FPC antenna can be obtained theoretically. If the FPC antenna does not have a dimension sufficient for multiple reflections between a partially reflective surface (PRS) and the ground, its gain must be less than that of an FPC antenna that has an infinite dimension. In addition, the gain of an FPC antenna increases as the dimension of a PRS increases and becomes saturated from a specific dimension. The specific dimension where the gain starts to saturate also gets larger as the reflection magnitude of the PRS becomes closer to one. Thus, it would be convenient to have a gain equation when considering the dimension of an FPC antenna in order to estimate the exact gain of the FPC antenna with a specific dimension. A gain versus the dimension of the FPC antenna for various reflection magnitudes of PRS has been simulated, and the modified gain equation is produced through the curve fitting of the full-wave simulation results. The resulting empirical gain equation of an FPC antenna whose PRS dimension is larger than $1.5{\lambda}_0$ has been obtained.

반도체 제조공정의 Critical Dimension 변동에 대한 통계적 분석 (Statistical Analysis on Critical Dimension Variation for a Semiconductor Fabrication Process)

  • 박성민;이정인;김병윤;오영선
    • 산업공학
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    • 제16권3호
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    • pp.344-351
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    • 2003
  • Critical dimension is one of the most important characteristics of up-to-date integrated circuit devices. Hence, critical dimension control in a semiconductor wafer fabrication process is inevitable in order to achieve optimum device yield as well as electrically specified functions. Currently, in complex semiconductor wafer fabrication processes, statistical methodologies such as Shewhart-type control charts become crucial tools for practitioners. Meanwhile, given a critical dimension sampling plan, the analysis of variance technique can be more effective to investigating critical dimension variation, especially for on-chip and on-wafer variation. In this paper, relating to a typical sampling plan, linear statistical models are presented for the analysis of critical dimension variation. A case study is illustrated regarding a semiconductor wafer fabrication process.

On robustness in dimension determination in fused sliced inverse regression

  • Yoo, Jae Keun;Cho, Yoo Na
    • Communications for Statistical Applications and Methods
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    • 제25권5호
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    • pp.513-521
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    • 2018
  • The goal of sufficient dimension reduction (SDR) is to replace original p-dimensional predictors with a lower-dimensional linearly transformed predictor. The sliced inverse regression (SIR) (Li, Journal of the American Statistical Association, 86, 316-342, 1991) is one of the most popular SDR methods because of its applicability and simple implementation in practice. However, SIR may yield different dimension reduction results for different numbers of slices and despite its popularity, is a clear deficit for SIR. To overcome this, a fused sliced inverse regression was recently proposed. The study shows that the dimension-reduced predictors is robust to the numbers of the slices, but it does not investigate how robust its dimension determination is. This paper suggests a permutation dimension determination for the fused sliced inverse regression that is compared with SIR to investigate the robustness to the numbers of slices in the dimension determination. Numerical studies confirm this and a real data example is presented.