• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제51권11호
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• pp.541-545
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• 2002

This paper proposes the new narrow erase method to erase wall charges formed in an AC plasma display panel (PDP) cell. In the proposed method, pulse timing of switch at the sustain period is adjusted for inducing, a weak discharge. Then, after the narrow erase, the voltage of the X electrode is set to differ from that of the Y electrode. For the proposed method, the measured maximum address voltage margin was 38.3V at Y_Rest voltage of 100V and sustain voltage of 180${\sim}$185V. However, for the conventional method, in which the X and Y electrodes are set to be of equal voltage after the narrow erase, the measured maximum address voltage margin was 31.3V at Y_Rest voltage of 150V and sustain voltage of 180V. This result shows that the measured maximum voltage margin for the proposed method is about 7V(22%) higher than that for the conventional method.

• 전자공학회논문지SC
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• 제40권6호
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• pp.39-47
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• 2003

본 논문에서는 세폭소거 방식에 관한 연구를 하였으며, 종래에는 세폭소거 이후 전극에 벽전하가 쌓이지 않게 하기 위해 X전극과 Y전극의 전압 레벨을 같게 하여 벽전하를 소거한 반면, 본 논문에서는 세폭소거 이후 X전극과 Y전극의 전압 레벨을 다르게 하고 유지구간에서 스위치의 펄스 타이밍을 조절하여 약한 방전을 일으키게 한 뒤 벽전하를 소거하였다. 실험결과 종래의 방식은 Y_Reset 전압이 150V, 서스테인 전압이 180V일 때 어드레스 전압 마진이 31.3V로 가장 크게 나타났다. 본 논문에서 제안한 방식은 Y_Reset 전압이 100V, 서스테인 전압이 180V, 185V일 때, 어드레스 전압 마진이 38.3Y로 가장 크게 나타났다. 본 논문에서 제안한 방식으로 인하여 종래의 방식 보다 약 7V(22%)정도의 전압마진을 더 확보할 수가 있었다.

• 전기전자학회논문지
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• 제24권1호
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• pp.161-169
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• 2020

무선충전기, USB 타입-C 등의 응용에 사용되는 MCU 칩은 제조 원가를 줄이기 위해 3~5개의 추가 공정 마스크가 필요한 DP-EEPROM(Double Poly EEPROM)보다는 추가 마스크가 한 장 이내이면서 메모리 셀 사이즈가 작은 MTP(Multi-Time Programmable) 메모리가 요구된다. 그리고 E/P(Erase/Program) cycling에 따른 MTP 메모리 셀의 endurance 특성과 데이터 retention 특성을 좋게 하기 위해서 V_TP(Program Threshold Voltage)와 V_TE(Erase Threshold Voltage)의 산포는 좁은 것이 필요하다. 그래서 본 논문에서는 short pulse의 erase와 program pulse를 여러 번 수행하면서 목표 전류와 비교한 뒤 전류스펙을 만족하면 더 이상 program이나 erase 동작을 수행하지 않게 하므로 program V_T 산포나 erase V_T 산포를 줄이는 알고리즘과 current-type BL S/A(Bit-Line Sense Amplifier) 회로, WM(Write Mask) 회로, BLD(BL Driver) 회로를 제안하였다. 매그나칩반도체 0.13㎛ 공정으로 제작된 256Kb MTP 메모리 웨이퍼에서 동작 모드에 맞게 정상적으로 동작하는 것을 확인할 수 있다.

• 전기학회논문지
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• 제56권12호
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• pp.2189-2195
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• 2007

In this paper, we propose a newly developed selective reset waveform of a ac PDP using the wide erase pulse technique with the control of address bias voltage. Although it is generally understood that the wide pulse erasing methode shows the narrow driving margin in an opposite discharge type ac PDP, we could obtain a moderate driving margin in a 3-electrode surface discharge type ac PDP. The obtained driving margin shows a strong dependency on the sustain voltage and the address bias voltage. The lower the sustain and the address bias voltage, the wider the driving margin. The pulse width of the proposed waveform is only $10{\mu}s$, which gives additional time to the sustain period, hence increases the brightness. The brightness and contrast ratio increase about 20% together comparing to the conventional ramp type selective reset waveform with the driving scheme of 10 subfield ADS method. The driving margin was measured with the line by line addressed pattern on the white test panel of 2inch diagonal size and the discharge gas was Ne+Xe4%, 400torr.

• International Journal of Internet, Broadcasting and Communication
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• 제13권2호
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• pp.27-35
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• 2021

NAND flash memory-based SSD needs an internal software, Flash Translation Layer(FTL) to provide traditional block device interface to the host because of its physical constraints, such as erase-before-write and large erase block. However, because useful host-side information cannot be delivered to FTL through the narrow block device interface, SSDs suffer from a variety of problems such as increasing garbage collection overhead, large tail-latency, and unpredictable I/O latency. Otherwise, the new type of SSD, open-channel SSD exposes the internal structure of SSD to the host so that underlying NAND flash memory can be managed directly by the host-level FTL. Especially, I/O data classification by using host-side information can achieve the reduction of garbage collection overhead. In this paper, we propose a new scheme to reduce garbage collection overhead of open-channel SSD by separating the journal from other file data for the journaling filesystem. Because journal has different lifespan with other file data, the Write Amplification Factor (WAF) caused by garbage collection can be reduced. The proposed scheme is implemented by modifying the host-level FTL of Linux and evaluated with both Fio and Filebench. According to the experiment results, the proposed scheme improves I/O performance by 46%~50% while reducing the WAF of open-channel SSDs by more than 33% compared to the previous one.