• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.4
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• pp.71-79
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• 2000

The original March algorithms cannot detect CMOS ADOFs(Address Decoder Open Faults) which requires separate deterministic test patterns. Modified March algorithm using DOF(Degree of Freedom) was suggested to detect these faults in addition to conventional stuck faults. This paper augments the modified march test to further capture NPSFs(Neighborhood Pattern Sensitive Faults). Complete CA(Cellular Automata) is used for address generation and Rl-LFSRs(Randomly Inversed LFSRs) for data generation. A new modified March algorithm can detect SAF, CF, TF, CMOS ADOFs, and part of NPSFs. Time complexity of this algorithm is still O(n).

• The Journal of Korean Institute of Communications and Information Sciences
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• v.22 no.7
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• pp.1394-1402
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• 1997

In this work, an efficient test algorithm and BIST architeture a for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault. Moreover, the proposed test algorithm can detect nighborhood pattern sensitive fault which could not be detected in previous march test algoarithms. The proposed test algorithm perposed test algorithm performs testing for neghborhood pattern sensitive fault using backgroung data which has been used word-oriented memory testing.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.11
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• pp.44-52
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• 2002

Since memory technology has been developed fast, test complexity and test time have been increased simultaneously. In practice, March algorithms are used widely for detecting various faults. However, March algorithms cannot detect NPSFs(Neighborhood Pattern Sensitive Faults) which must be considered for DRAMs. This paper proposes an effective algorithm for high fault coverage by modifying the conventional March algorithms.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.29A no.8
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• pp.99-109
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• 1992

First, the coupling faults of semiconductor memory are classified in detail. The chained coupling fault is introduced and defined, which results from sequential influencing of the coupling effects among memory cells, and its mapping relation is described. The linked coupling fault and its order are defined. Second, the deterministic “Algorithm GA” is proposed, which detects stuack-at faults, transition faults, address decoder faults, unlinked 2-coupling faults, and unlinked chained coupling faults. The time complexity and the fault coverage are improved in this algorithm. Third, it is proved that the march test of an address sequence can detect 97.796% of the linked 2-coupling faults with order 2. The deterministic “Algorithm NA” proposed can detect to the limit. The time complexity and the fault coverage are improved in this algorithm.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.30A no.9
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• pp.59-70
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• 1993

An efficient test method based on march test is presented to cover line leakage failures associated with bit and word lines or mega bit DRAM chips. A modified column march (Y-march) pattern is derived to improve fault coverage against the data retention failure. Time delay concept is introduced to develop a new column march test algorithm detecting various data retention failures. A built-in test circuit based on the column march pattern is designed and verified using logic simulation, confirming correct test operations.

• Journal of KIISE:Computing Practices and Letters
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• v.7 no.1
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• pp.99-107
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• 2001

In this paper, we implemented memory BIST circuit based on ION march algorithm, and the IEEE 1149.1 has been designed as main controlJer for embedded memory testing. The implemented memory BIST can be used for word-oriented memory since it adopts background data, this is avaliable for word-oriented memory. It is able to detect all stuck-at faults, transition faults, coupling faults, and address decoder faults in the word-oriented memory. Memory BIST and IEEE 1149.1 are described at RTL level in Verilog-HDL, and synthesized with the Synopsys. The synthesized circuits are fully velified using VerilogXL and memory cell generated by memory compiler.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.8
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• pp.10-22
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• 1998

To handle the density increase of SRAMs, a new parallel testing methodology based on built-in self test (BIST) is developed, which allows to access multiple cells simultaneously. The main idea is that a march algorithm is dperformed concurently in each baisc marching block hwich makes up whole memory cell array. The new parallel access method is very efficient in speed and reuqires a very thny hardware overhead for BIST circuitry. Results show that the fault coverage of the applied march algorithm can be achieved with a lower complexity order. This new paralle testing algorithm tests an .root.n *.root.n SRAM which consists of .root.k * .root.k basic marching blocks in O(5*.root.k*(.root.k+.root.k)) test sequence.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.1
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• pp.72-79
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• 2003

Due to the improvements in circuit design technique and manufacturing technique, complexity of a circuit is growing along with the demand for memories with large capacities. Likewise, as a memory capacity gets larger, testing gets harder and testing cost increases, and testing process in chip development gets larger as well. Therefore, a research on an effective test algorithm to improve the chip yield rate in a short time period is becoming an important task. This paper proposes an effective, March C-algorithm based, test algorithm that can also be applied to a dual-port memory since it considers all the fault types, which can be occurred in a single-port as well as in a dual-port memory, without increasing the test length.

• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.2
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• pp.114-121
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• 2013

As the weight of embedded memory within Systems-On-Chips(SoC) rapidly increases to 80-90% of the number of total transistors, the importance of testing embedded memory in SoC increases. This paper proposes IEEE std. 1500 wrapper based Programmable Memory Built-In Self-Test(PMBIST) architecture which can support various kinds of test algorithm. The proposed PMBIST guarantees high flexibility, programmability and fault coverage using not only March algorithms but also non-March algorithms such as Walking and Galloping. The PMBIST has an optimal hardware overhead by an optimum program instruction set and a smaller program memory. Furthermore, the proposed fault information processing scheme guarantees improvement of the memory yield by effectively supporting three types of the diagnostic methods for repair and diagnosis.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.12
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• pp.50-59
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• 2000

This paper presents a new SRAM testing method for various faults by monitoring dynamic power supply currents. The peak value of Iddt pulses when the transition write operation is performed, is prominently different from that of a fault free case. Using the observation, a new memory test algorithm is developed which consists of only write operations. The new test algorithm using dynamic power supply current testing, has length of 7n, where n is the number of cells in SRAMs. Compared to the previous March B algorithm, the test length has been reduced by 7/17, and can detect additional hard-to-detect faults.