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http://dx.doi.org/10.5573/ieek.2013.50.2.114

IEEE std. 1500 based an Efficient Programmable Memory BIST  

Park, Youngkyu (Department of Electrical and Electronic Engineering, Yonsei University)
Choi, Inhyuk (Department of Electrical and Electronic Engineering, Yonsei University)
Kang, Sungho (Department of Electrical and Electronic Engineering, Yonsei University)
Publication Information
Journal of the Institute of Electronics and Information Engineers / v.50, no.2, 2013 , pp. 114-121 More about this Journal
Abstract
As the weight of embedded memory within Systems-On-Chips(SoC) rapidly increases to 80-90% of the number of total transistors, the importance of testing embedded memory in SoC increases. This paper proposes IEEE std. 1500 wrapper based Programmable Memory Built-In Self-Test(PMBIST) architecture which can support various kinds of test algorithm. The proposed PMBIST guarantees high flexibility, programmability and fault coverage using not only March algorithms but also non-March algorithms such as Walking and Galloping. The PMBIST has an optimal hardware overhead by an optimum program instruction set and a smaller program memory. Furthermore, the proposed fault information processing scheme guarantees improvement of the memory yield by effectively supporting three types of the diagnostic methods for repair and diagnosis.
Keywords
Memory BIST; IEEE std. 1500; Test Algorithm; Diagnostic;
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