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An Effective Memory Test Algorithm for Detecting NPSFs  

Suh, Il-Seok (Samsung Electronics System LSI Division)
Kang, Yong-Seok (LG Electronics System IC Division)
Kang, Sung-Ho (Dept. of Electrical & Electronic Engineering Yonsei Univ.)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.39, no.11, 2002 , pp. 44-52 More about this Journal
Abstract
Since memory technology has been developed fast, test complexity and test time have been increased simultaneously. In practice, March algorithms are used widely for detecting various faults. However, March algorithms cannot detect NPSFs(Neighborhood Pattern Sensitive Faults) which must be considered for DRAMs. This paper proposes an effective algorithm for high fault coverage by modifying the conventional March algorithms.
Keywords
NPSF; Memory test; March algorithm;
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