• 제목/요약/키워드: Manufacturing Process Control

검색결과 1,619건 처리시간 0.028초

G-code control 을 이용한 웹 기반 금형 가공 공정 모니터링 &컨트롤 시스템 개발 (Development of Web-based Mold manufacturing process monitoring & control system using G-code control)

  • 김건희;최진화;전병철;조명우
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2004년도 추계학술대회 논문집
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    • pp.269-272
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    • 2004
  • The target of this paper is the development of Web-based monitoring & control system which is for effective and economic management of mold manufacturing process. This system has three module; G-code Control, Monitoring Module and Result analysis module. Also, as the environment of development is based on internet, this system which is possible to the remote site management of manufacturing process works on Web. To be possible to control the manufacturing monitoring by client, each module is made ActiveX control and is based on socket communication. This system makes the foundation which is possible to manage the mold manufacturing process efficiently from remote site by matching real-time monitoring with manufacturing process in factory using G-code control and displaying the result of manufacturing using Ch-CGI.

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담배 제조 공정의 통계적 관리시스템 개발 (Development of Statistical Process Control System for Tobacco Manufacturing Process)

  • 김영호;송정호
    • 한국연초학회지
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    • 제23권1호
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    • pp.53-59
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    • 2001
  • To decrease of deviations from target specifications and excessive variability around targe, we exclusively designed statistical process control system involving general manager and expert tool for cigarette manufacturing process. This system is a unique programming environment for the development of total process control software including various control charts according to data type and process capability analysis. Also this system includes the statistical analysis module to analyze defective causes immediately when inferior products are made and the module to offer regular reports. This system is customized considering the manufacture environment based on the opinions of workers.

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Applications of neural networks in manufacturing process monitoring and control

  • Cho, Hyung-Suck
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 1992년도 한국자동제어학술회의논문집(국제학술편); KOEX, Seoul; 19-21 Oct. 1992
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    • pp.11-21
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    • 1992
  • Modern manufacturing process requires machine intelligence to meet the demands for high technology products as well as intelligence-based operating skills to lessen human worker's intervene. To meet this trend there has been wide spread interest in applying artificial neural network(ANN) to the areas of manufacturing process monitoring and control. This paper addresses application problems in such processes as welding, assembly, hydroforming process and inspection of solder joints.

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PPM 관리 체제하의 탄력적인 공정관리기법 (Elastic Process Control Method under PPM Management System)

  • 류영근;신숙현;조남호
    • 한국산업정보학회:학술대회논문집
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    • 한국산업정보학회 1998년도 춘계공동학술대회 발표논문집 IMF시대의정보화 추진전략
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    • pp.129-135
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    • 1998
  • The present automated manufacturing environment is very different when the classical statiscal process control method based on batch processing were used. Therefore these must be replaced by automated statiscal process control method. In this point of view , this study intends to develop the automated statiscal process control method which can be implemented in the proesent automated manufacturing environment . Specially this study suggested modified control limit line and developed the rule to identify the special cause of the manufacturing process in the aspect of the ppm manegement.

반도체 공정에서의 APC 기법 및 이상감지 및 분류 시스템 (APC Technique and Fault Detection and Classification System in Semiconductor Manufacturing Process)

  • 하대근;구준모;박담대;한종훈
    • 제어로봇시스템학회논문지
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    • 제21권9호
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    • pp.875-880
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    • 2015
  • Traditional semiconductor process control has been performed through statistical process control techniques in a constant process-recipe conditions. However, the complexity of the interior of the etching apparatus plasma physics, quantitative modeling of process conditions due to the many difficult features constraints apply simple SISO control scheme. The introduction of the Advanced Process Control (APC) as a way to overcome the limits has been using the APC process control methodology run-to-run, wafer-to-wafer, or the yield of the semiconductor manufacturing process to the real-time process control, performance, it is possible to improve production. In addition, it is possible to establish a hierarchical structure of the process control made by the process control unit and associated algorithms and etching apparatus, the process unit, the overall process. In this study, the research focused on the methodology and monitoring improvements in performance needed to consider the process management of future developments in the semiconductor manufacturing process in accordance with the age of the APC analysis in real applications of the semiconductor manufacturing process and process fault diagnosis and control techniques in progress.

100 PPM 관리체제하의 실시간 공정관리 방안 (Real Time Process Control System under 100 PPM Management System)

  • 조남호;신숙현
    • 품질경영학회지
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    • 제25권1호
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    • pp.116-134
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    • 1997
  • The present automated manufacturing environment is very different when the classical statistical process control method based on batch processing were used. Therefore these must be replaced by automated statistical process control method. In this point of view, this paper intends to develop the automated statistical process control method which can be implemented in the present automated manufacturing environment. Specially this study developed the rules to identify the special causes of the manufacturing process in the aspect of the 100 PPM management, and a numerical example is demonstrated to verify the usefulness of these rules.

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감도분석에 의한 제조공정연구 (A Study on the manufacturing process using the sensitivity analysis of stochastic network)

  • 박기주
    • 산업경영시스템학회지
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    • 제24권63호
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    • pp.65-77
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    • 2001
  • A more technical perspective is needed in estimating the effect of the Manufacturing Process for improving the Productivity, there are many statistical evaluation methods, convenience sampling, frequencies, histogram, QC seven tools, control chart etc. It is more important for the companies to use six sigma to reduce defective and improve the process control than the technical definition as a disciplined quantitative approach for improvement of process control and a new way of quality innovation. Process network analysis is a technique which has the potentiality for a wide use to improve the manufacturing process which other techniques can't be used to analyze effectively. It has some problems to analyze the process with feedback loops. The branch probabilities during quality inspections depend upon the number of times the product has been rejected. This paper presents how to improve the manufacturing process by statistical process control using branch probabilities, Moment Generating Function(MGF) and Sensitivity Equation.

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구상흑연주철의 품질관리에 관하여 (A Study on the Quality Control of Nodular Graphite Cast Iron)

  • 강경식
    • 산업경영시스템학회지
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    • 제5권6호
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    • pp.55-62
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    • 1982
  • Mechanical characteristics of nodular graphite cast iron has found to tan higher utilization to the gray cast iron. So, Nodular graphite cast iron is used as a basic material in mechanical industry. Great demand of Nodular graphite cast iron is expected to increase due to the sharp development in mechanical and automobile industry. Therefore, Nodular graphite cast iron requires not only good quality product but experienced skills in manufacturing process. But there exist a lot of difficulties to manufacture nodular graphite cast iron than gray cast iron in manufacturing process. In this study, the following topics are studied for good quality product of nodular graphite cast iron. $\circled1$ Activities of managerial staff. $\circled2$ Qualite control method in manufacturing process. $\circled3$ Manufacturing process system. As a result of the study, a intensive Quality control activities should be applied and reinforced at each stage of manufacturing process rather that at the last stage of final product.

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반도체 수율 향상을 위한 통계적 공정 제어에 전문가 시스템의 적용에 관한 연구 (Applying Expert System to Statistical Process Control in Semiconductor Manufacturing)

  • 윤건상;최문규;김훈모;조대호;이칠기
    • 한국정밀공학회지
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    • 제15권10호
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    • pp.103-112
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    • 1998
  • The evolution of semiconductor manufacturing technology has accelerated the reduction of device dimensions and the increase of integrated circuit density. In order to improve yield within a short turn around time and maintain it at high level, a system that can rapidly determine problematic processing steps is needed. The statistical process control detects abnormal process variation of key parameters. Expert systems in SPC can serve as a valuable tool to automate the analysis and interpretation of control charts. A set of IF-THEN rules was used to formalize knowledge base of special causes. This research proposes a strategy to apply expert system to SPC in semiconductor manufacturing. In analysis, the expert system accomplishes the instability detection of process parameter, In diagnosis, an engineer is supported by process analyzer program. An example has been used to demonstrate the expert system and the process analyzer.

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SLIDING MODE MOULD LEVEL CONTROL IN CONTINUOUS CASTING PROCESS

  • Kueon, Yeong-Seob
    • 한국생산제조학회지
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    • 제7권4호
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    • pp.50-55
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    • 1998
  • Mould level control system for continuous casting process involves stick-slip friction in the sliding gate , time-delay, non-linearity, and certain uncertainties such as friction force variations between molten steel and the inner wall of mould. In this paper, sliding mode control technique was used to solve these complex control problem. The controller is then designed and implemented onto the continuous casting process. Testing result shows that sliding mode controller can decrease the fluctuating magnitude of the mould level and is superior to the existing PID controller.