• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.31 no.6
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• pp.427-432
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• 2018

High-capacity secondary batteries can cause explosion hazards owing to microcurrent variations or current surges that occur in short circuits. Consequently, complete safety cannot be achieved with general protection that is limited to a mere current fuse. Hence, in the case of secondary batteries, it is necessary for the protector to limit the inrush current in a short circuit, and to detect the current during microcurrent variations. To serve this purpose, a fuse can be employed for the secondary battery protection circuit with current detection. This study aims at designing a protection device that can stably operate in the hazardous circumstances associated with high-capacity secondary batteries. To achieve the said objective, a detecting fuse was designed from an alloy of low melting point elements for securing stability in abnormal current states. Experimental results show that the operating I-T and V-T characteristic constraints can be satisfied by employing the proposed current detecting self-contained low melting point fuse, and through the resistance of the heating resistor. These results thus verify that the proposed protection device can prevent the hazards of short circuit current surges and microcurrent variations of secondary batteries.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.53 no.3
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• pp.166-172
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• 2004

Arc Fault Current is an electric discharge which is occurred in two opposite electrode. In this Paper, arc current control algorithm is designed for the interruption of arc fault current which is occurred in the low voltage network. This arc Is one of the main causes of electric fire. Arc fault in electrical network has the characteristics of low current, high impedance and high frequency. Conventional control algorithm does not have the arc current interrupt function. Hence, Control algorithm of arc current is designed for the interruption of arc fault current which has the modified arc characteristics.

• ETRI Journal
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• v.37 no.5
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• pp.961-971
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• 2015

This paper proposes a 250 mV supply voltage digital low-dropout (LDO) regulator. The proposed LDO regulator reduces the supply voltage to 250 mV by implementing with all digital circuits in a$0.11{\mu}m$ CMOS process. The fast current tracking scheme achieves the fast settling time of the output voltage by eliminating the ringing problem. The over-voltage and under-voltage detection circuits decrease the overshoot and undershoot voltages by changing the switch array current rapidly. The switch bias circuit reduces the size of the current switch array to 1/3, which applies a forward body bias voltage at low supply voltage. The fabricated LDO regulator worked at 0.25 V to 1.2 V supply voltage. It achieved 250 mV supply voltage and 220 mV output voltage with 99.5% current efficiency and 8 mV ripple voltage at $20{\mu}A$ to $200{\mu}A$ load current.

• ETRI Journal
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• v.31 no.6
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• pp.725-731
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• 2009

In this paper, electrostatic discharge (ESD) protection circuits with an advanced substrate-triggered NMOS and a gate-substrate-triggered NMOS are proposed to provide low trigger voltage, low leakage current, and fast turn-on speed. The proposed ESD protection devices are designed using 0.13 ${\mu}m$ CMOS technology. The experimental results show that the proposed substrate-triggered NMOS using a bipolar transistor has a low trigger voltage of 5.98 V and a fast turn-on time of 37 ns. The proposed gate-substrate-triggered NMOS has a lower trigger voltage of 5.35 V and low leakage current of 80 pA.

• Journal of the Korean Institute of Telematics and Electronics T
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• v.35T no.1
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• pp.29-32
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• 1998

The low level leakage currents in silicon oxides were investigated. The low level leakage currents were composed of a transient component and a do component. The transient component was caused by the tunnel charging and discharging of the stress generated traps nearby two interfaces. The do component was caused by trap assisted tunneling completely through the oxide. The low level leakage current was proportional to the number of traps generated in the oxides. The low level leakage current may be a trap charging and discharging current. The low level leakage current will affect data retention in EEPROM.

• ETRI Journal
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• v.42 no.5
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• pp.790-798
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• 2020

Herein, a low-ripple coarse-fine digital low-dropout regulator (D-LDO) without ringing in the transient state is proposed. Conventional D-LDO suffers from a ringing problem when settling the output voltage at a large load transition, which increases the settling time. The proposed D-LDO removes the ringing and reduces the settling time using an auxiliary power stage which adjusts its output current to a load current in the transient state. It also achieves a low output ripple voltage using a comparator with a complete comparison signal. The proposed D-LDO was fabricated using a 65-nm CMOS process with an area of 0.0056 μ㎡. The undershoot and overshoot were 47 mV and 23 mV, respectively, when the load current was changed from 10 mA to 100 mA within an edge time of 20 ns. The settling time decreased from 2.1 ㎲ to 130 ns and the ripple voltage was 3 mV with a quiescent current of 75 ㎂.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.11a
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• pp.36-41
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• 2003

This paper presents the results of power spectra using the fundamental and low frequency harmonic components of leakage current waveform to study aging on contaminated EPDM insulator(was serviced during 1997-2001, region Pohang, korea) under salt fog conditions. Experiments have been conducted in the chamber salt fog and at the 16KVrms. The salt contents adjusted as 0g,25g,50g and 75g per liter of deionized water. The onset of dry-band arcing on polymer insulators could be determined by signal processing the low frequency harmonics components. A correlation has been found between the fundamental and low harmonic components of power spectra on leakage current. Where aging could be associated with an increase in the level of both the fundamental and low frequency harmonics components of leakage current. Surface aging for contaminated EPDM insulators occurred when the fundamental component of leakage current was greater then some level On the other hand, when the polymer insulator approached failure, the fundamental component of leakage current reached relatively high values and low frequency harmonics components of the leakage current trended to decrease. The results suggest that both the fundamental and low frequency harmonics of leakage current can be used as a tool to determine both the beginning of aging and before flashover, end of life EPBM insulator in salt fog.

• The Transactions of the Korean Institute of Power Electronics
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• v.8 no.1
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• pp.40-47
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• 2003

A low-cost current-sensing scheme for the motor drives with MOSFET is described. Many motor drives usually employ the common current sensors to measure current for the purpose of control or protection. These current sensors, however, significantly burden the power circuit with the size and cost. The proposed current-sensing scheme utilizes information concerning MOSFET's On-voltage and On-resistance. An analogue circuit detecting On-voltage can overcome the above disadvantages because the circuit is small and is made at a low cost, and the fuzzy inference for On-resistance is also simply designed based on MOSFET's characteristics. The validity of this scheme will be experimentally verified by adopting the current control of a battery car.

• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.387-390
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• 2002

In this paper, arc current control algorithm is designed for the interruption of arc fault current which is occurred in the low voltage and low current network. Arc in electrical network have the characteristics of low current, high impedance and high frequency. Conventional controller does not have the arc current interrupt function. Hence, In this paper, arc current control algorithm is designed for the interruption of arc fault current.

• Current Applied Physics
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• v.18 no.11
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• pp.1415-1421
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• 2018

Unlike ordinary organic field-effect transistors (OFETs), saturation current is hardly to be found in vertical OFETs (VOFETs). Moreover, the fabrication process of patterned sourced for VOFETs is quite complex. In this current work, a simple solution processed VOFET with directly deposited intermediate silver source electrode has been demonstrated. The VOFET exhibits a high leakage current that induces an inversion polarity of its transistor behavior. Interestingly, a well-defined saturation current was observed in the linear scale of transfer characteristic. The VOFET operated with high-current density > $280mA/cm^2$ at $V_d=5V$. Overview potential of the fabricated device in display application is also presented. This preliminary work does open-up a new direction in VOFET fabrication and their application.