• Title/Summary/Keyword: Line test

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Analysis and lest of On-line and off-line PD Testing for High Voltage Rotating Machines Stator Windings using Ceramic Coupler (세라믹 커플러를 이용한 고전압회전기 고정자권선의 On-line 및 off-line 부분방전 특성 시험 및 분석)

  • Oh, Bong-Keun;Kim, Hyun-Il;Kang, Seong-Hwa;Lim, Kee-Joe
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.20 no.10
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    • pp.895-900
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    • 2007
  • Partial discharge(PD) test can be performed either when the rotating machine is not operating(off-line) or during normal machine operation(on-line). This paper presents an on-line and off-line PD test on a large hydro-generator and induction motor using the same PD acquisition system(PDAS) and ceramic coupler(CC) sensor. PD signal characteristics of CC sensor proved similar with that of epoxy mica coupler(EMC) sensor as a results of PD test for simulated defect winding and frequency response test. A comparison of on-line and off-line PD test for PD characteristic parameters-phase resolved PD(PRPD), maximum PD value(Qmax) and PD occurrence energy(POE)-indicated that on-line PD test could reliably and effectively diagnose insulation conditions which were verified by off-line PD test.

Management and operation of K-AGT test line (한국형경량전철 시험선의 관리 및 운영)

  • Han, Seok-Youn;Jun, Bong-Roong;Lee, Ho-Yong;Lee, An-Ho
    • Proceedings of the KSR Conference
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    • 2006.11b
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    • pp.964-967
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    • 2006
  • Korea Railroad Research Institute (the following 'KRRI') built AGT test line in Gyeong San-city, Kyongsang-bukdo province, Korea on August, 2004. This test line is exclusively used for the test of the driverless rubber-tired AGT system, and applied with research result of AGT System Development Project like vehicles, power supply, control and signaling, track and infrastructure system. The test line is available for the test of rubber tired AGT system's performance, function, safety. In this paper, we described the operation system of test line for the test of performance, safety, reliability, and also system operation in emergency. Finally we present the operation result of test line.

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Night Visibility Evaluation of Phosphorescent Road Line Markings (축광 노면표시의 야간 시인성 평가를 위한 기초 연구)

  • Lee, Yong Mun;Kim, Sang Tae;Jeong, Wang Seong;Kim, Heung Rae
    • International Journal of Highway Engineering
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    • v.18 no.4
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    • pp.69-75
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    • 2016
  • PURPOSES : In this study, we evaluated changes in the retroreflectivity and luminance of phosphorescent road line markings with changes in glass beads and line marking thickness. METHODS : The color of line markings affects their retroreflectivity. Using a chromaticity test, we conducted the analysis of whether phosphorescent road line markings adhered to the "KS M 6080" standard. Then, we measured the dry retroreflectivity and wet retroreflectivity for various glass bead refractive indices. We conducted wet retroreflectivity test using the EN 1436 standard as the basis. We also conducted luminance tests for different glass bead refractive indices and line marking thicknesses. RESULTS : 1. Phosphorescent road line markings specimens satisfied the "KS M 6080" standard. 2. In dry retroreflectivity test, phosphorescent road line markings sprayed with glass beads satisfied the national police agency standard ($240mcd/(m^2{\cdot}Lux)$). Wet retroreflectivity test results showed that except for one type of No.1 glass beads, phosphorescent road line markings specimens sprayed with glass beads of one type of No.3 and two types of No.1 satisfied the national police agency standard ($100mcd/(m^2{\cdot}Lux)$). 3. Phosphorescent road line markings had higher retroreflectivity than non-phosphorescent road line markings in the dry condition. 4. Phosphorescent road line markings sprayed with glass beads demonstrated improved luminance. Luminance increased with higher glass bead refractive index and with increased line marking thickness. However, when the thickness crossed a certain threshold, phosphorescence ceased to increase; this is a characteristic of the phosphorescence phenomenon. CONCLUSIONS : Visibility across short distances can be ensured when phosphorescent road line markings are sprayed with glass beads, because of the retroreflection phenomenon. It is also possible to ensure far visibility using phosphorescent road line markings.

The Design of Lumped Constant Circuit for the Simulation of A Real 22.9 kV-y Distribution Line (22.9 kV-y 실긍장 배전선로 모의를 위한 집중정수회로의 설계)

  • Yun, Chul-Ho;Jeong, Yeong-Ho;Han, Yong-Huei
    • Proceedings of the KIEE Conference
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    • 1999.07c
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    • pp.1186-1188
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    • 1999
  • When we perform the test related to the power distribution system such as artificial fault test, protective coordination test, distribution automation test in short length test line, Lumped Constant Circuit, a kind of variable impedance, should be attached to the test line in order to make it equivalent to a real line in length electrically. In this paper we designed the positive sequence and zero sequence Lumped Constant Circuit with optimized inductor and resister for the modification of long, 16km, distribution line, when they are attached to the short, 4km, distribution test line.

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Artificial line for short-line fault test (근거리선로고장전류 차단시험용 Artificial line)

  • Park, Seung-Jae;Rhyou, Hyeong-Kee;Kang, Young-Sik;Koh, Heui-Seog
    • Proceedings of the KIEE Conference
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    • 2001.07c
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    • pp.1783-1785
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    • 2001
  • With the 4-MJ synthetic testing facilities completed, KERI can perform the circuit breaker testing up to 420 kV, 50 kA ratings. The short-line fault test is one of the necessary test items which are required for the circuit breaker, and in order to perform the short-line fault test KERI(Korea Electrotechnology Institute) has used the "new artificial line" which has small dimension and is easy to generate the saw-tooth wave. This paper describes the following items of the new artificial line. -Description of 4-kinds of artificial lines and determination of the circuit parameter of artificial line. -TRV characteristics of saw-tooth waves for each circuit. -KERI's artificial line.

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Tracking Performance Test of Polymer Insulator with Salt Solution which is added Surface Active Agent (계면활성제가 첨가된 염수용액에 따른 폴리머 애자의 트래킹 성능 평가)

  • Cho, Han-Goo;Han, Dong-Hee;Lee, Un-Yong;Lim, Kee-Joe;Choi, In-Hyuk
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.1121-1124
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    • 2004
  • Aging test to estimate life property of polymer insulator is executed through several international standard such as IEC 61109 and CEA tracking wheel test, but is not getting clear conclusion yet. There are two methods in the diagnosis method of polymer insulator such as off-line and on-line. The diagnosis methods in off-line are external condition analysis by the eye, contaminant analysis on surface, surface analysis, pollution withstand voltage test, power frequency flashover voltage test, lightning impulse flashover test, tensile fracture load test and flexural load test. The diagnosis methods in off-line most are the method for virgin and last aged sample. However, the diagnosis method in on-line is method that can be evaluate sample state as progressing continuously aging test in beginning, The diagnosis method in on-line is arranged as following: leakage current measurement, electric field, surface state investigation, thermal image, emitting light measurement and then so. In this paper, the tracking performance of polymer insulator with salt solution which is added surface active agent. The diagnosis of insulator sample has been analyzed by leakage current and visual examination.

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Status of Occupational Therapists on Unilateral Neglect Test Tools Usage and Symptom Classification

  • Jang, Woo-Hyuk
    • The Journal of Korean Physical Therapy
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    • v.29 no.5
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    • pp.271-275
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    • 2017
  • Purpose: The aim of this study was to investigate the current status of the use of neglect test tools and the awareness for egocentric neglect (EN) and allocentric neglect (AN). Methods: A survey questionnaire was distributed to occupational therapists attending continuing education at the Daegu-Gyeongbuk branch on April 16. A total 143 responses were collected, and with the exception of 5 incomplete responses, 138 of them were analyzed. Results: The most commonly used unilateral neglect test tools were the line bisection test (86 responses, 62.3%), cancellation test (35 responses, 25.4%), copy and drawing test (7 responses, 5.1%). In a follow-up survey of 86 respondents who used line bisection tests as the most commonly used test, the majority (82 responses, 95.3%2) were found to use the 20-line test paper. In question about the familiarity and education experience for test manual, only 20 responses (23.2%) and 3 responses (3.5%) answered 'Yes'. In a question about the experience of a manual and the article for the manual, 25 responses (29.1%) answered 'Yes'. In the question regarding the separation of EN and AN on the unilateral neglect test, 44 responses (31.9%) were 'distinction' and 94 responses (68.1%) were 'no distinction'. Conclusion: Information on the guidance and interpretation of the line bisection test is lacking and the concept of EN and AN was insufficient.

A New Test Algorithm for Bit-Line Sensitive Faults in High-Density Memories (고집적 메모리에서 BLSFs(Bit-Line Sensitive Faults)를 위한 새로운 테스트 알고리즘)

  • Kang, Dong-Chual;Cho, Sang-Bock
    • Journal of IKEEE
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    • v.5 no.1 s.8
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    • pp.43-51
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    • 2001
  • As the density of memories increases, unwanted interference between cells and coupling noise between bit-lines are increased. And testing high-density memories for a high degree of fault coverage can require either a relatively large number of test vectors or a significant amount of additional test circuitry. So far, conventional test algorithms have focused on faults between neighborhood cells, not neighborhood bit-lines. In this paper, a new test algorithm for neighborhood bit-line sensitive faults (NBLSFs) based on the NPSFs(Neighborhood Pattern Sensitive Faults) is proposed. And the proposed algorithm does not require any additional circuit. Instead of the conventional five-cell or nine-cell physical neighborhood layouts to test memory cells, a three-cell layout which is minimum size for NBLSFs detection is used. Furthermore, to consider faults by maximum coupling noise by neighborhood bit-lines, we added refresh operation after write operation in the test procedure(i.e.,$write{\rightarrow}\;refresh{\rightarrow}\;read$). Also, we show that the proposed algorithm can detect stuck-at faults, transition faults, coupling faults, conventional pattern sensitive faults, and neighborhood bit-line sensitive faults.

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Establishment of Railway Test Line - focusing on the needs & plan (철도종합시험선 구축 필요성)

  • Moon, Jae-Woo;Kim, Tae-Wook;Lee, Myung-Suk;Jung, Jang-Yong;Kim, Jong-Tae
    • Proceedings of the KSR Conference
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    • 2008.11b
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    • pp.776-781
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    • 2008
  • In this paper, comments on the needs of establishment of railway test line - capable of mid and long term performance evaluation of vehicle/infra/electricity/signal component/system - are described. Based on the previous studies, national/social/economic needs, the states of similar lines of foreign countries, concept of test line, and basic application plan are summarized. Especially, core things needed to the establishment of test line are commented.

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A Test Algorithm for Word-Line and Bit-line Sensitive Faults in High-Density Memories (고집적 메모리에서 Word-Line과 Bit-Line에 민감한 고장을 위한 테스트 알고리즘)

  • 강동철;양명국;조상복
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.4
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    • pp.74-84
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    • 2003
  • Conventional test algorithms do not effectively detect faults by word-line and bit-line coupling noise resulting from the increase of the density of memories. In this paper, the possibility of faults caused by word-line coupling noise is shown, and new fault model, WLSFs(Word-Line Sensitive Fault) is proposed. We also introduce the algorithm considering both word-line and bit-line coupling noise simultaneously. The algorithm increases probability of faults which means improved fault coverage and more effective test algorithm, compared to conventional ones. The proposed algorithm can also cover conventional basic faults which are stuck-at faults, transition faults and coupling faults within a five-cell physical neighborhood.