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A Test Algorithm for Word-Line and Bit-line Sensitive Faults in High-Density Memories  

강동철 (디오닉스)
양명국 (울산대학교 전기전자정보시스템공학부)
조상복 (울산대학교 전기전자정보시스템공학부)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.40, no.4, 2003 , pp. 74-84 More about this Journal
Abstract
Conventional test algorithms do not effectively detect faults by word-line and bit-line coupling noise resulting from the increase of the density of memories. In this paper, the possibility of faults caused by word-line coupling noise is shown, and new fault model, WLSFs(Word-Line Sensitive Fault) is proposed. We also introduce the algorithm considering both word-line and bit-line coupling noise simultaneously. The algorithm increases probability of faults which means improved fault coverage and more effective test algorithm, compared to conventional ones. The proposed algorithm can also cover conventional basic faults which are stuck-at faults, transition faults and coupling faults within a five-cell physical neighborhood.
Keywords
coupling noise; CF; NPSF; BLSF; WLSF;
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