• 한국광학회지
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• 제20권6호
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• pp.334-338
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• 2009

최근 디스플레이 기기의 수요가 증대되면서 대면적 노광에 대한 요구가 증대되고 있는데, 내부전반사(total internal reflection: TIR)홀로그래픽 리소그라피는 대면적 노광을 위한 효과적인 방법으로 연구가 진행되고 있다. TIR 홀로그래피에서는 일반적으로 레이저를 이용하여 영상을 기록하고 재생한다. 그러나 자외선 램프와 같은 비가간섭광을 이용하여 재생한다면, 가간섭성에 의해 나타나는 영상잡음을 줄일 수 있고, 대면적 노광에도 보다 용이할 것이다. TIR 홀로그램의 재생을 위하여 자외선 램프를 이용할 때, 램프의 유한한 선폭과 확산각이 재생 영상에 미치는 영향을 분석하고, 재생패턴에 나타나는 선폭 확대 결과를 실험을 통하여 검증하였다. ${\mu}m$ 규모의 선폭을 갖는 대면적 패턴을 TIR 홀로그램으로부터 얻기 위한 재생 광원으로, 가간섭성 광원인 레이저 대신 저잡음성과 경제성을 갖춘 일반적인 자외선 램프의 사용이 가능할 것으로 기대된다.

• 반도체디스플레이기술학회지
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• 제9권4호
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• pp.19-23
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• 2010

Nanoimprint lithography (NIL) is one of the most versatile and promising technology for micro/nano-patterning due to its simplicity, high throughput and low cost. Recently, one of the major trends of NIL is large-area patterning. Especially, the research of the application of NIL to TFT-LCD field has been increasing. Technical difficulties to keep the uniformity of the residual layer, however, become severer as the imprinting area increases. In this paper we performed a numerical study for a large area NIL (the $2^nd$ generation TFT-LCD glass substrate ($370{\times}470$ mm)) by using finite element method. First, a simple model considering the surrounding wall was established in order to simulate effectively and reduce the computing time. Then, the volume of fluid (VOF) and grid deformation method were utilized to calculate the free surfaces of the resist flow based on an Eulerian grid system. From the simulation, the velocity fields and the imprinting pressure during the filling process in the NIL were analyzed, and the effect of the surrounding wall and the uniformity of residual layer were investigated.

• 한국광학회지
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• 제20권1호
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• pp.23-28
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• 2009

본 논문에서는 대면적 리소그래피를 위하여 홀로그램 영상을 연결하여 기록 물질에 저장하고 이를 마스크로 이용하는 노광 방법을 제안하고 구현하였으며, 홀로그램 영상을 재생하는 과정에서 발생되는 영상 연결 부분에서의 간섭 무늬를 제거하였다. 연결하고자 하는 영상은 DMD(digital micro-mirror device)로 표시하였으며, DMD 영상은 축소 광학계를 통하여 기록 물질에 저장되었다. 기록 물질은 전동 스테이지로 이동되도록 하여, DMD로 표시되는 영상이 기록 물질에 연속적으로 저장되도록 하였다. 이러한 방법으로 저장되는 연결된 영상은 재생광에 의하여 노광에 사용되는데, 재생광의 간섭성에 의하여 연결부분에 간섭무늬가 발생된다. 간섭무늬는 노이즈로 작용하는데, 다중 노광에 의한 홀로그램 영상의 기록과 재생을 이용하여 이를 제거하였다. 본 논문에서는 DMD와 전동 스테이지를 이용하여 영상을 연결하여 기록하고, 다중 노광에 의한 영상 기록 방법을 이용하여, 간섭 무늬가 제거된 연결된 영상을 구현하고 이를 리소그래피에 적용하였다.

• 반도체디스플레이기술학회지
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• 제10권4호
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• pp.53-59
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• 2011

Recently there have been considerable attentions on nanoimprint lithography (NIL) by the display device and semiconductor industry due to its potential abilities that enable cost-effective and high-throughput nanofabrication. Although one of the current major research trends of NIL is large-area patterning, the technical difficulties to keep the uniformity of the residual layer become severer as the imprinting area increases more and more. In this paper we focused on the deformation of the $2^{nd}$ generation TFT-LCD sized ($370{\times}470mm^2$) large-area soft mold in the UV imprinting process. A mold was fabricated with PDMS(Poly-dimethyl Siloxane) layered glass back plate(t0.5). Besides, the mold includes large surrounding wall type protrusions of 1.9 mm width and the via-hole(7 ${\mu}m$ diameter) patterend area. The large surrounding wall type protrusions cause the proximity effect which severely degrades the uniformity of residual layer in the via-hole patterend area. Therefore the deformation of the mold was calculated by finite element analysis to assess the effect of large surrounding wall type protrusions and the flexiblity of the mold. The deformation of soft mold was verified by the measurements qualitatively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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• pp.699-702
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• 2004

Next generation lithography technologies, such as EBL(Electron Beam Lithography), X-ray lithography, SPL(Scanning Probe Lithography), have been studied widely for getting over line width limitation of photolithography. Among the next generation lithography technologies, SPL has been highlighted because of its high resolution advantage. But is also has problem which are slow processing time and sample size limitation. The purpose of this study is complement of present SPL system. Brand new SPL system was made. SPL test was performed with the system in ultra thin PMMA(polymethlymethacrylate) film.

• 반도체디스플레이기술학회지
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• 제11권1호
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• pp.7-11
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• 2012

One dimensional and two dimensional nano patterns were fabricated on a 4-inch substrate by Laser Interference Lithography (LIL). Mach-Zehnder interferometer was setup to obtain the interference patterns and adjusted the pattern sizes with change of incident angle. We could obtain a periodic structure with a period of 440 nm using 266 nm laser, and demonstrated a pattern size with $293{\pm}25nm$ over a 4-inch substrate.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2008년도 추계학술대회A
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• pp.1939-1943
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• 2008

Deformation of a mold is measured and analyzed in alignment and curing processes of UV-Imprint Lithography. We are focused on mold deformation caused by a UV resin, which is laminated between a mold and a target glass-panel. The UV resin is viscous in case of liquid state, and the resin will be solidified when being exposed by the ultra-violet light. The viscosity of the resin causes shear force on the mold during the alignment process. Moreover, the shrinkage during phase change from liquid to solid may cause residual stress on the mold. The experiments for measuring temperature and strain are made during alignment and curing process. Strain-gages and thermocouples are used for measuring the strain and variation of temperature on several points of the mold, respectively. The deformation of mold is also simulated and analyzed. The simulation results are compared with the experiments. Finally, sources of alignment errors in large area UV-nanoimprint lithography are discussed.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2008년도 춘계학술대회 논문집
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• pp.119-120
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• 2008

• Journal of the Optical Society of Korea
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• 제19권1호
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• pp.63-68
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• 2015

A one-step fabrication of a photonic crystal (PC) with functional defects is demonstrated. Using multi-beam phase-controlled holographic lithography with a diffracting optical element, large area one dimensional (1D) and two dimensional (2D) PCs with periodic defects were fabricated. The uniform area is up to $2mm^2$, and tens of defect channels have been introduced in the 1D and 2D PC structure. This technique gives rise to substantial reduction in the fabrication complexity and significant improvement in the spatial accuracy of introducing functional defects in photonic crystals. This method can also be used to design and fabricate three dimensional (3D) PCs with periodic defects.

• 반도체디스플레이기술학회지
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• 제9권2호
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• pp.91-96
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• 2010

In recent years there have been considerable attentions on nanoimprint lithography (NIL) by the display device and semiconductor industry due to its potential abilities that enable cost-effective and high-throughput nanofabrication. Although one of the current major research trends of NIL is large-area patterning, the technical difficulties to keep the uniformity of the residual layer become severer as the imprinting area increases more and more. In this paper we consider the roll-to-plate type imprinting process. In the process a glass mold, which is placed upon the 2nd generation TFT-LCD glass sized substrate(370${\yen}$470 mm), is rolled by a rubber roller to achieve a uniform residual layer. The pressure distribution on the glass mold by rolling of the rubber roller is crucial information to analyze mold deformation, transferred pattern quality, uniformity of residual layer and so forth. In this paper the quantitative pressure distribution induced by rolling of the rubber roller was calculated with finite element analysis under the assumption of Neo-Hookean hyperelastic constitutive relation. Additionally the numerical results were verified by the experiments.