• Title/Summary/Keyword: LSI

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A 45GHz $f_{T}\;and\;50GHz\;f_{max}$ SiGe BiCMOS Technology Development for Wireless Communication ICs (무선통신소자제작을 위한 45GHz $f_{T}$ 및 50GHZz $f_{max}$ SiGe BiCMOS 개발)

  • Hwang Seok-Hee;Cho Dae-Hyung;Park Kang-Wook;Yi Sang-Don;Kim Nam-Ju
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.42 no.9 s.339
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    • pp.1-8
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    • 2005
  • A $0.35\mu$m SiGe BiCMOS fabrication process has been timely developed, which is aiming at wireless RF ICs development and fast growing SiGe RF market. With non-selective SiGe epilayer, SiGe HBTs in this process used trapezoidal Ge base profile for the enhanced AC performance via Ge induced bandgap niuoin. The characteristics of hFE 100, $f_{T}\;45GHz,\;F_{max}\;50GHz,\;NF_{min}\;0.8dB$ have been obtained by optimizing not only SiGe base profile but also RTA condition after emitter polysilicon deposition, which enables the SiGe technology competition against the worldwide cutting edge SiGe BiCMOS technology. In addition, the process incorporates the CMOS logic, which is fully compatible with $0.35\mu$m pure logic technology. High Q passive elements are also provided for high precision analog circuit designs, and their quality factors of W(1pF) and inductor(2nH) are 80, 12.5, respectively.

마이크로 컴퓨터의 시험및 신뢰성

  • 임제탁
    • 전기의세계
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    • v.28 no.6
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    • pp.3-10
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    • 1979
  • 여기서는 마이크로컴퓨터의 시험법에 관해서 현재시판되고 있는 시험기와 함께 소개하고 단일 칩마이크로컴퓨터에 관해서 실시하고 있는 시험 패턴 설계예를 약간 상세히 기술한다. 또 마이크로컴퓨터용 LSI의 고장모우드, 고장메카니즘의 분류및 고장율, 신뢰성의 현장과 문제점에 관해서 기술함과 동시에 초기불량을 제거하여 신뢰성을 향상시키는 수단으로서의 스크리닝(screening)및 신뢰도예측에 관해서 소개하고 현장에 있어서의 문제점과 대책에 관해서 논의한다.

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A Study on Analysis of Electrostatics Destruction of Electronic Equipment (전자부품의 정전파괴(ESD) 분석에 관한 연구)

  • Lee, Du-Young
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.10 no.6
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    • pp.235-241
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    • 2010
  • The static electricity generated by friction of two objects is called frictional electricity. The main cause of troubles in electronic components for military and civil use as well as in military radar appliances is found mostly in parts like LSI memories, particularly when they lose information of function momentarily while in operation, which usually leads to a fatal cause of troubles in the equipment. Troubles occur if electric noise is caused by the spark effected from discharge of static electricity from the equipment that is used nearby.

Mechanical Behavior of Indentation Stress in Carbon Fiber Reinforced Silicon Carbide Composites with Different Densities (서로 다른 밀도를 갖는 탄소섬유강화 탄화규소 복합재료의 압흔응력에 의한 기계적 거동)

  • Lee, Kee-Sung;Kim, Il-Kyum;Kim, Tae-Woo;Kim, Se-Young;Han, In-Sub;Woo, Sang-Kuk
    • Journal of the Korean Ceramic Society
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    • v.48 no.4
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    • pp.288-292
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    • 2011
  • In this study, we investigated the mechanical behavior of carbon fiber reinforced silicon carbide composites by indentation stress. Relatively porous and dense fiber reinforced ceramic composites were fabricated by liquid silicon infiltration (LSI) process. Densification of fiber composite was controlled by hardening temperature of preform and consecutive LSI process. Load-displacement curves were obtained during indentation of WC sphere on the carbon fiber reinforced silicon carbide composites. The indentation damages at various loads were observed, and the elastic modulus were predicted from unloading curve of load-displacement curve.

Methods and Sample Size Effect Evaluation for Wafer Level Statistical Bin Limits Determination with Poisson Distributions (포아송 분포를 가정한 Wafer 수준 Statistical Bin Limits 결정방법과 표본크기 효과에 대한 평가)

  • Park, Sung-Min;Kim, Young-Sig
    • IE interfaces
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    • v.17 no.1
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    • pp.1-12
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    • 2004
  • In a modern semiconductor device manufacturing industry, statistical bin limits on wafer level test bin data are used for minimizing value added to defective product as well as protecting end customers from potential quality and reliability excursion. Most wafer level test bin data show skewed distributions. By Monte Carlo simulation, this paper evaluates methods and sample size effect regarding determination of statistical bin limits. In the simulation, it is assumed that wafer level test bin data follow the Poisson distribution. Hence, typical shapes of the data distribution can be specified in terms of the distribution's parameter. This study examines three different methods; 1) percentile based methodology; 2) data transformation; and 3) Poisson model fitting. The mean square error is adopted as a performance measure for each simulation scenario. Then, a case study is presented. Results show that the percentile and transformation based methods give more stable statistical bin limits associated with the real dataset. However, with highly skewed distributions, the transformation based method should be used with caution in determining statistical bin limits. When the data are well fitted to a certain probability distribution, the model fitting approach can be used in the determination. As for the sample size effect, the mean square error seems to reduce exponentially according to the sample size.

Improving Coagulation Performance with pH Preadjustment in Drinking Water Treatment (정수처리에서 pH 저감에 의한 응집효율향상에 관한 연구)

  • Lee, Hwan;Lee, Cheol-Hyo;Jung, Chang-Gue;Lee, Yoon-Jin
    • Journal of Environmental Health Sciences
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    • v.29 no.2
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    • pp.1-6
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    • 2003
  • This paper reports on a pilot scale comparison of PACS coagulation with and without pH preadjustment. The pH of the water was adjusted with carbon dioxide and sulfuric acid. Process performance was assessed on the basis of total organic carbon(TOC), UV absorbance, turbidity and disinfection by-product(DBP) precursors. Coagulation pH appeared to be a determining factor for maximum NOM removal. The optimum coagulation pH in order to decrease TOC and turbidity were pH 7. Preadjustment of pH 7 increased TOC removal to as much as 43, 47 percent with sulfuric acid and carbon dioxide. Moreover, coagulation at pH 7 caused a reduction in UV$_{254}$, THMFP and HAAFP compared to the baseline coagulation. For preadjustment of pH 7 with carbon dioxide, the percentage of TOC, UV$_{254}$, THMFP and HAAFP shows the reduction rate of 3.8, 0.5, 4.8, 9.4% comparing to the coagulation rendition using sulfuric acid. Acid addition to depress pH during coagulation decrease Langelier Saturation Index(LSI), potentially causing increase corrosion in water distribution systems. LSI for carbon dioxide and sulfuric acid at pH 6 was -2.3, -3.3. Therefore, carbon dioxide was more effective at controlling corrosion than sulfuric acid.

HAN-LALA : Hanyang-Layout Language (HAN-LALA : 한양 레이아웃 언어)

  • Kim, Hyun-Gon;Rhee, Byung-Ho;Chong, Jong-Wha
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.27 no.3
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    • pp.124-130
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    • 1990
  • This paper presents a new layout language, HAN-LALA (HANyang LAyout LAnguage), to automate the LSI/VLSI layout design. HAN-LALA is a C extension, which is easy to describe the layout. As HAN-LALA is directly compiled with no preprocessor, it renders easy debugging and short design time. For the technology independent layout design, the design rules and the process technologies are organized into seperate modules. The related objects are grouped and the placement is performed on the groups. Also the various routing modules including a river routing module and the one which can consider the forbidden regions make the layout design error-free without detailed descriptions of the layout.

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