• Proceedings of the Korean Society of Precision Engineering Conference
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• 2012.10a
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• pp.531-532
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• 2012

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.41 no.6
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• pp.19-24
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• 2004

A novel fast parallel NTGST is proposed for high resolution computer vision inspection of the BLUs in a LCD production line. The conventional computation- intensive NTGST algorithm is modified and its C codes are optimized into fast NTGST to be adapted to the SIMD parallel architecture. And then, the input inspection image is partitioned and allocated to each of the P processors in multi-threaded implementation, and the NTGST is executed on SIMD architecture of N data items simultaneously in each thread. Thus, the proposed inspection system can achieve the speedup of O(NP). Experiments using Dual-Pentium III processor with its MMX and extended MMX SIMD technology show that the proposed parallel NTGST is about Sp=8 times faster than the conventional NTGST, which shows the scalability of the proposed system implementation for the fast, high resolution computer vision inspection of the various sized BLUs in LCD production lines.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.23 no.2
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• pp.127-132
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• 2019

In this paper, we propose a visual inspection method of automotive parts for injection molding to improve the appearance quality and productivity of automotive parts. Exterior inspection of existing injection molding automobile parts was generally done by manual sampling inspection by human. First, we applied the edge-tolerance vision inspection algorithm ([1] - [4]) for vision inspection of electronic components (TFT-LCD and PCB) And we propose a new visual inspection method to overcome the problem. In the proposed visual inspection, the inspection images of the parts to be inspected are aligned on the basis of the reference image of good quality. Then, after partial adaptive binarization, the binary block matching algorithm is used to compare the good binary image and the test binary image. We verified the effectiveness of the edge-tolerance vision check algorithm and the proposed appearance vision test method through various comparative experiments using actual developed equipment.

• Proceedings of the KIEE Conference
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• 2008.10b
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• pp.211-212
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• 2008

본 논문에서는 LCD 구동 모들 PCB의 기능 검사를 위한 자동 검사시스템인 EVT(Emulated Vision Tester)를 제안하고 구현하였다. 기존의 대표적인 자동검사 방법으로는 전기적 검사나 영상기반 검사방식이 있으나 전기적 검사만으로는 Timing이 주요한 변수가 되는 LED 장비에서는 검출할 수 없는 구동불량이 존재하며 영상기반 검사는 영상획득에 일관성이 결여되거나 Gray Scale의 구분이 불명확하며 검출결과의 재현성이 떨어진다. EVT 시스템은 Pattern Generator에서 인가된 입력 패턴 신호라 구동모듈을 통한 후 출력되는 디지털 신호를 직접 비교하여 패턴을 검사하고 아날로그 신호 (전압, 저항, 파형)의 이상 여부도 신속 정확하게 검사할 수 있는 H/W적인 방법이다. 높은 검출 신뢰도와 빠른 처리 속도 뿐만 아니라 간결한 시스템 구성으로 원가절감 실현 등 많은 장점을 가진다.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.21 no.1
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• pp.19-27
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• 2007

In this paper, we develope and implement a TFT-LCD cell defects detection algorithm using morphology. To detect the bright line or dark line defects and the bright pixel or dark pixel defects of the TFT-LCD cells, we determine the shape of the morphology operators considering the shape characteristics of the TFT-LCD sub pixels. Using dilation, erosion, and the subtraction operators, we extract gray level defects information. Then, we apply the optimal threshold method which shows the best results in terms of several criteria. Finally, we determine the defects using labelling method. From various experiments using TFT-LCD panels, the proposed algorithm shows superior results.

• Journal of the Korean Institute of Intelligent Systems
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• v.19 no.5
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• pp.615-621
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• 2009

TFT-LCD image consists of ununiform background, random noises and target defect signal components. Defects in TFT-LCD have some intensity variations compared to background region. It is sometimes difficult for human inspectors to figure out. In this paper, we propose multi-level threshold scheme for detection of the real defect using probability density function with Parzen Window. The experimental results show that the proposed algorithms produce promising results and can be applied to automated inspection systems for finding defects in the TFT-LCD image.

• Journal of the Korean Institute of Intelligent Systems
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• v.19 no.6
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• pp.852-859
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• 2009

Normally, to extract the defect in TFT-LCD inspection system, the image is obtained by using line scan camera or area scan camera which is achieved by CCD or CMOS sensor. Because of the limited dynamic range of CCD or CMOS sensor as well as the effect of the illumination, these images are frequently degraded and the important features are hard to decern by a human viewer. In order to overcome this problem, the feature vectors in the image are obtained by using the average intensity difference between defect and background based on the weber's law and the standard deviation of the background region. The defect detection method uses non-linear SVM (Supports Vector Machine) method using the extracted feature vectors. The experiment results show that the proposed method yields better performance of defect classification methods over conveniently method.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.6
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• pp.535-542
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• 2008

This paper presents a high efficiency half-bridge DC-DC converter for an LED backlight drive system of LCD module inspection equipment. The proposed converter improves the converter efficiency using characteristics of the asymmetrical half-bridge converter and the self-driven synchronous rectifier, and thus improves the total efficiency of the LED backlight drive system. The synchronous rectifier applied to the proposed converter is the new topological synchronous rectifier, which changes slightly the transformer structure and the synchronous switch connection in the asymmetrical half-bridge converter with a conventional self-driven synchronous rectifier. Since the proposed converter utilizes the transformer leakage inductor as its resonant inductor, its structure is simplified. The proposed converter well operates under the universal DC input voltage ($250{\sim}380V$). The operational principle and a design example for a 100W prototype are discussed in detail, respectively. Experimental results are shown for the designed prototype converter under universal DC input voltage.

• Design & Manufacturing
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• v.14 no.2
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• pp.21-27
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• 2020

Recently, LCD (Liquid Crystal Display) has been replaced by OLDE (Organic Light Emitting Diode) in high resolution display industry. In the process of OLDE production, it inspects defective products by sending a signal using a probe during OLED panel inspection. At this time, the cause of the detection of failure is divided into two. One is the self-defect of the OLED panel and the other is the poor contact occurring in the process of contact between the two. The second case is unknown at the time of testing, which increases the time for retesting. To this end, we made a system that can identify in real time whether the probe is in contact during the inspection. A contact probe unit was designed for the system, and a stage system was implemented. An inspection system was constructed through S / W and circuit configuration for actual inspection. Finally, a system that can check contact and non-contact in real time was constructed.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.5
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• pp.438-443
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• 2008

In this paper, segmenting and classifying low contrast defects on flat panel display is one of the key problems for automatic inspection system in practice. Problems become more complicated when the quality of acquired image is degraded by the illumination irregularity. Many algorithms are developed and implemented successfully for the defects segmentation. However, vision algorithms are inherently prone to be dependent on parameters to be set manually. In this paper, one morphological segmentation algorithm is chosen and a technique using frequency domain analysis of input images is developed for automatically selection the morphological parameter. An extensive statistical performance analysis is performed to compare the developed algorithms.