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A study of the system that enables real-time contact confirmation of probes in OLED panel inspection  

Hwang, Mi-Sub (Department of Mechanical Engineering, Inha University)
Han, Bong-Seok (Department of Mechanical Engineering, Inha University)
Han, Yu-Jin (Department of Mechanical Engineering, Inha University)
Choi, Doo-Sun (Department of Mechanical Engineering, Inha University)
Kim, Tae-Min (Department of Mechanical Engineering, Inha University)
Park, Kyu-Bag (Department of Mechanical Engineering, Inha University)
Lee, Jeong-woo (Department of Mechanical Engineering, Inha University)
Kim, Ji-Hun (Department of Mechanical Engineering, Inha University)
Publication Information
Design & Manufacturing / v.14, no.2, 2020 , pp. 21-27 More about this Journal
Abstract
Recently, LCD (Liquid Crystal Display) has been replaced by OLDE (Organic Light Emitting Diode) in high resolution display industry. In the process of OLDE production, it inspects defective products by sending a signal using a probe during OLED panel inspection. At this time, the cause of the detection of failure is divided into two. One is the self-defect of the OLED panel and the other is the poor contact occurring in the process of contact between the two. The second case is unknown at the time of testing, which increases the time for retesting. To this end, we made a system that can identify in real time whether the probe is in contact during the inspection. A contact probe unit was designed for the system, and a stage system was implemented. An inspection system was constructed through S / W and circuit configuration for actual inspection. Finally, a system that can check contact and non-contact in real time was constructed.
Keywords
Flat-panel display; LCD; OLED; Panel inspection; Test Probe;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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