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http://dx.doi.org/10.5207/JIEIE.2007.21.1.019

On the TFT-LCD Cell Defect Inspection Algorithm using Morphology  

Kim, Yong-Kwan (호서대학교 정보통신공학과)
Yu, Sang-Hyun (호서대학교 일반대학원 정보통신공학과)
Publication Information
Journal of the Korean Institute of Illuminating and Electrical Installation Engineers / v.21, no.1, 2007 , pp. 19-27 More about this Journal
Abstract
In this paper, we develope and implement a TFT-LCD cell defects detection algorithm using morphology. To detect the bright line or dark line defects and the bright pixel or dark pixel defects of the TFT-LCD cells, we determine the shape of the morphology operators considering the shape characteristics of the TFT-LCD sub pixels. Using dilation, erosion, and the subtraction operators, we extract gray level defects information. Then, we apply the optimal threshold method which shows the best results in terms of several criteria. Finally, we determine the defects using labelling method. From various experiments using TFT-LCD panels, the proposed algorithm shows superior results.
Keywords
Machine vision; Defects detection; Morphology; Erosion; Dilation; TFT-LCD; Cell; Subpixel;
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