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NTGST-Based Parallel Computer Vision Inspection for High Resolution BLU  

김복만 (경북대학교 전자전기컴퓨터학부)
서경석 (경북대학교 전자전기컴퓨터학부)
최흥문 (경북대학교 전자전기컴퓨터학부)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SP / v.41, no.6, 2004 , pp. 19-24 More about this Journal
Abstract
A novel fast parallel NTGST is proposed for high resolution computer vision inspection of the BLUs in a LCD production line. The conventional computation- intensive NTGST algorithm is modified and its C codes are optimized into fast NTGST to be adapted to the SIMD parallel architecture. And then, the input inspection image is partitioned and allocated to each of the P processors in multi-threaded implementation, and the NTGST is executed on SIMD architecture of N data items simultaneously in each thread. Thus, the proposed inspection system can achieve the speedup of O(NP). Experiments using Dual-Pentium III processor with its MMX and extended MMX SIMD technology show that the proposed parallel NTGST is about Sp=8 times faster than the conventional NTGST, which shows the scalability of the proposed system implementation for the fast, high resolution computer vision inspection of the various sized BLUs in LCD production lines.
Keywords
NTGST; SIMD;
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Times Cited By KSCI : 1  (Citation Analysis)
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