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http://dx.doi.org/10.5391/JKIIS.2009.19.5.615

TFT-LCD Defect Detection Using Multi-level Threshold and Probability Density Function  

Kim, Se-Yun (경북대학교 전자전기컴퓨터학부)
Jung, Chang-Do (경북대학교 수학과)
Yun, Byoung-Ju (경북대학교 전자전기컴퓨터학부)
Joo, Young-Bok (연세대학교 컴퓨터과학과)
Choi, Byung-Jae (대구대학교 전자공학부)
Park, Kil-Houm (경북대학교 전자전기컴퓨터학부)
Publication Information
Journal of the Korean Institute of Intelligent Systems / v.19, no.5, 2009 , pp. 615-621 More about this Journal
Abstract
TFT-LCD image consists of ununiform background, random noises and target defect signal components. Defects in TFT-LCD have some intensity variations compared to background region. It is sometimes difficult for human inspectors to figure out. In this paper, we propose multi-level threshold scheme for detection of the real defect using probability density function with Parzen Window. The experimental results show that the proposed algorithms produce promising results and can be applied to automated inspection systems for finding defects in the TFT-LCD image.
Keywords
Computer Vision; TFT-LCD; Multi-level Threshold; Parzen Window;
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