• Title/Summary/Keyword: In-plane variation

Search Result 536, Processing Time 0.028 seconds

Out-of-plane Deformation Measurement of Spherical Glasses Lens Using ESPI (ESPI를 이용한 구면 안경렌즈의 면외 변형 측정)

  • Yang, Seung-Pill;Kim, Kyoung-Suk;Jang, Ho-Sub;Kim, Hyun-Min
    • Journal of Korean Ophthalmic Optics Society
    • /
    • v.12 no.4
    • /
    • pp.77-81
    • /
    • 2007
  • The spherical lens is typically classified by the refractive power into two groups such as (+) diopter lens and (-) diopter lens. The deformation occurred by the external force that is applied to a lens is caused by the increase or the decrease in the diopter of a lens. In this paper, the deformation of the lens was quantitatively measured by using ESPI (Electronic Speckle Pattern Interferometry) which have been used in the optical measurement field for past few years. ESPI has an advantage that the deformation of an object can be measured precisely by using coherence of the light. The experiment was carried out to the totally 16 types of plastic lens. It was confirmed that the deformation was decreased by increasing the diopter of the lens when same displacement was applied to the lens in case of (+) diopter lens and was increased by decreasing the diopter of the lens in case of (-) diopter lens. Also, it was found that the deformation of (+) diopter lens is less than that of (-) diopter lens. Therefore, with these results, it is expected that the possibility of the quantitative measurement for variation of the optical defect caused by the deformation of a lens when the deformation is occurred to the various types of the lens can be presented and that the application in the lens industrial field can be performed.

  • PDF

Different crystalline properties of undoped-GaN depending on the facet of patterns fabricated on a sapphire substrate

  • Lee, Kwang-Jae;Kim, Hyun-June;Park, Dong-Woo;Jo, Byoung-Gu;Kim, Jae-Su;Kim, Jin-Soo;Lee, Jin-Hong;Noh, Young-Min
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2010.02a
    • /
    • pp.173-173
    • /
    • 2010
  • Recently, a patterned sapphire substrate (PSS) has been intensively used as one of the effective ways to reduce the dislocation density for the III-nitride epitaxial layers aiming for the application of high-performance, especially high-brightness, light-emitting diodes (LEDs). In this paper, we analyze the growth kinetics of the atoms and crystalline quality for the undopped-GaN depending on the facets of the pattern fabricated on a sapphire substrate. The effects of the PSS on the device characteristics of InGaN/GaN LEDs were also investigated. Several GaN samples were grown on the PSS under the different growth conditions. And the undoped-GaN layer was grown on a planar sapphire substrate as a reference. For the (002) plane of the undoped-GaN layer, as an example, the line-width broadening of the x-ray diffraction (XRD) spectrum on a planar sapphire substrate is 216.0 arcsec which is significantly narrower than that of 277.2 arcsec for the PSS. However, the line-width broadening for the (102) plane on the planar sapphire substrate (363.6 arcsec) is larger than that for the PSS (309.6 arcsec). Even though the growth parameters such as growth temperature, growth time, and pressure were systematically changed, this kind of trend in the line-width broadening of XRD spectrum was similar. The emission wavelength of the undoped-GaN layer on the PSS was red-shifted by 5.7 nm from that of the conventional LEDs (364.1 nm) under the same growth conditions. In addition, the intensity for the GaN layer on the PSS was three times larger than that of the planar case. The spatial variation in the emission wavelength of the undoped-GaN layer on the PSS was statistically ${\pm}0.5\;nm$ obtained from the photoluminescence mapping results throughout the whole wafer. These results will be discussed in terms of the mixed dislocation depending on the facets and the period of the patterns.

  • PDF

Lamb Wave Technique for Ultrasonic Nonlinear Characterization in Elastic Plates (판재의 초음파 비선형 특성평가를 위한 Lamb Wave 기법)

  • Lee, Tae-Hun;Kim, Chung-Seok;Jhang, Kyung-Young
    • Journal of the Korean Society for Nondestructive Testing
    • /
    • v.30 no.5
    • /
    • pp.458-463
    • /
    • 2010
  • Since the acoustic nonlinearity is sensitive to the minute variation of material properties, the nonlinear ultrasonic technique(NUT) has been considered as a promising method to evaluate the material degradation or fatigue. However, there are certain limitations to apply the conventional NUT using the bulk wave to thin plates. In case of plates, the use of Lamb wave can be considered, however, the propagation characteristics of Lamb wave are completely different with the bulk wave, and thus the separate study for the nonlinearity of Lamb wave is required. For this work, this paper analyzed first the conditions of mode pair suitable for the practical application as well as for the cumulative propagation of quadratic harmonic frequency and summarized the result in for conditions; (1) phase matching, (2) non-zero power flux, (3) group velocity matching, and (4) non-zero out-of-plane displacement. Experimental results in aluminum plates showed that the amplitude of the secondary Lamb wave and nonlinear parameter growed up with increasing propagation distance at the mode pair satisfying the above all conditions and that the ration of nonlinear parameters measured in Al6061-T6 and Al1100-H15 was closed to the ratio of the absolute nonlinear parameters.

Study for Multi Channel Radiation Detector Using of Microfilm and Carbon Electrode (탄소막 마이크로필름을 이용한 다채널 전리함 개발에 관한 연구)

  • Shin Kyo Chul;Yun Hyong Geun;Jeong Dong Hyeok;Oh Yong Kee;Kim Jhin Kee;Kim Ki Hwan;Kim Jeung Kee
    • Progress in Medical Physics
    • /
    • v.16 no.3
    • /
    • pp.111-115
    • /
    • 2005
  • We have designed the multi channel detector for the quality assurance of clinical photon beams. The detector was composed of solid phantom inserted by six plane-parallel ionization chambers at different depth. The chamber as a mini plane parallel chamber was made of carbon coated microfilms. In this study the electrical characteristics of the six chambers in the solid phantom were evaluated using 6 MV photon beam. The leakage currents were less than 0.5 pA, reproducibility was less than 0.5$\%$, linearity was less than 0.5$\%$, and dose rate effect was less than 0.7$\%$. In addition the effect of dose variation from other chambers was estimated to maximum 0.8$\%$ approximately. The developed detector can be used for quality determination in output dosimetry or measurement of percentage depth dose approximately for clinical photon beam.

  • PDF

Effect of Head Positioning in Panoramic Radiography on the Vertical and Horizontal Magnification : Displacement along the Sagittal and Transverse Plane (파노라마방사선사진에서 환자의 머리 위치가 하악 수직, 수평 확대율에 미치는 영향 : 전후방 및 좌우 이동)

  • Kim, Yong-Gun;Lee, Young-Kyun;An, Seo-Young
    • Journal of Dental Rehabilitation and Applied Science
    • /
    • v.29 no.3
    • /
    • pp.249-258
    • /
    • 2013
  • The purpose of this study was to investigate how image magnification in dental panoramic radiography is influenced by object position. Five metal balls (4 mm in diameter, 2 for the anterior and 3 for the posterior region on the right side) were placed above alveolar crest of dry skull considering extraction socket and dental arch. Dry skull was radiographed using OP-100D (Instrumentarium Imaging Co., Tuusula, Finland) at proper and displaced position along the sagittal and transverse plane at 3 mm, 6 mm, 9 mm, 12 mm and 15 mm using special mount which can control precise movement. Images were stored in DICOM files and were measured by ruler equipped within INFINITT PACS software (Infinitt Co., Ltd., Seoul, Korea). The mean horizontal magnification was 1.224-1.439 and mean vertical magnification was 1.286 - 1.345 at proper position. Vertical magnification resulted in less variation (1.245-1.418) than horizontal magnification (0.798-6.297) according to the sagittal and transverse displacements. Head positioning is important for linear measurement on panoramic radiography and inclusion of standard object (for instance, metal ball) is helpful to anticipate exact magnification of panoramic radiographs at various location.

Biaxial Buckling Analysis of Magneto-Electro-Elastic(MEE) Nano Plates using the Nonlocal Elastic Theory (비국소 탄성이론을 이용한 자기-전기-탄성 나노 판의 2방향 좌굴 해석)

  • Han, Sung-Cheon;Park, Weon-Tae
    • Journal of the Computational Structural Engineering Institute of Korea
    • /
    • v.30 no.5
    • /
    • pp.405-413
    • /
    • 2017
  • In this paper, we study the biaxial buckling analysis of nonlocal MEE(magneto-electro-elastic) nano plates based on the first-order shear deformation theory. The in-plane electric and magnetic fields can be ignored for MEE(magneto-electro-elastic) nano plates. According to magneto-electric boundary condition and Maxwell equation, the variation of magnetic and electric potentials along the thickness direction of the MME plate is determined. In order to reformulate the elastic theory of MEE(magneto-electro-elastic) nano-plate, the nonlocal differential constitutive relations of Eringen is used. Using the variational principle, the governing equations of the nonlocal theory are discussed. The relations between nonlocal and local theories are investigated by computational results. Also, the effects of nonlocal parameters, in-plane load directions, and aspect ratio on structural responses are studied. Computational results show the effects of the electric and magnetic potentials. These computational results can be useful in the design and analysis of advanced structures constructed from MEE(magneto-electro-elastic) materials and may be the benchmark test for the future study.

Microstructural analysis of the single crystalline AlN and the effect of the annealing on the crystalline quality (단결정 AlN의 미세구조 분석 및 어닐링 공정이 결정성에 미치는 영향)

  • Kim, Jeoung Woon;Bae, Si-Young;Jeong, Seong-Min;Kang, Seung-Min;Kang, Sung;Kim, Cheol-Jin
    • Journal of the Korean Crystal Growth and Crystal Technology
    • /
    • v.28 no.4
    • /
    • pp.152-158
    • /
    • 2018
  • PVT (Physical Vapor Transport) method has advantages in producing high quality, large scale wafers where many researches are being carried out to commercialize nitride semiconductors. However, complex process variables cause various defects when it had non-equilibrium growth conditions. Annealing process after crystal growth has been widely used to enhance the crystallinity. It is important to set appropriate temperature, pressure, and annealing time to improve crystallinity effectively. In this study, the effect of the annealing conditions on the crystalline structure variation of the AlN single crystal grown by PVT method was investigated with synchrotron whitebeam X-ray topography, electron backscattered diffraction (EBSD), and Rietveld refinement. X-ray topography analysis showed secondary phases, sub-grains, impurities including carbon inclusion in the single crystal before annealing. EBSD analyses identified that sub-grains with slightly tilted basal plane appeared and the overall number of grains increased after the annealing process. Rietveld refinement showed that the stress caused by the temperature gradient during the annealing process between top and bottom in the hot zone not only causes distortion of grains but also changes the lattice constant.

MIRIS: Science Programs

  • Jeong, Woong-Seob;Matsumoto, Toshio;Seon, Kwangil;Pyo, Jeonghyun;Lee, Dae-Hee;Park, Youngsik;Ree, Chang Hee;Moon, Bongkon;Park, Sung-Joon;Nam, Uk-Won;Park, Jang-Hyun;Lee, Duk-Hang;Cha, Sang-Mok;Lee, Sungho;Yuk, In-Soo;Ahn, Kyungjin;Cho, Jungyeon;Lee, Hyung Mok;Han, Wonyong
    • The Bulletin of The Korean Astronomical Society
    • /
    • v.37 no.2
    • /
    • pp.97.2-97.2
    • /
    • 2012
  • The main payload of Science and Technology Satellite 3 (STSAT-3), Multipurpose InfraRed Imaging System (MIRIS) is the first Korean infrared space mission to explore the near-infrared sky with a small astronomical instrument developed by KASI. The 8-cm passively cooled telescope with a wide field of view (3.67 deg. ${\times}$ 3.67 deg.) will be operated in the wavelength range from 0.9 to $2{\mu}m$. It will carry out wide-band imaging and the Paschen-${\alpha}$ emission line survey. After the calibration of MIRIS in our laboratory, MIRIS has been delivered to SaTReC and successfully assembled into the STSAT-3. The main purposes of MIRIS are to perform the observation of Cosmic Infrared Background (CIB) at two wide spectral bands (I and H band) and to survey the Galactic plane at $1.88{\mu}m$ wavelength, the Paschen-${\alpha}$ emission line. CIB observation enables us to reveal the nature of degree-scale CIB fluctuation detected by the IRTS (Infrared Telescope in Space) mission and to measure the absolute CIB level. The MIRIS will continuously monitor the seasonal variation of the zodiacal light towards the both north and south ecliptic poles for the purpose of calibration as well as the effective removal of zodiacal light. The Pashen-${\alpha}$ emission line survey of Galactic plane helps us to understand the origin of Warm Ionized Medium (WIM) and to find the physical properties of interstellar turbulence related to star formation. Here, we also discuss the observation plan with MIRIS.

  • PDF

Normalization of Face Images Subject to Directional Illumination using Linear Model (선형모델을 이용한 방향성 조명하의 얼굴영상 정규화)

  • 고재필;김은주;변혜란
    • Journal of KIISE:Software and Applications
    • /
    • v.31 no.1
    • /
    • pp.54-60
    • /
    • 2004
  • Face recognition is one of the problems to be solved by appearance based matching technique. However, the appearance of face image is very sensitive to variation in illumination. One of the easiest ways for better performance is to collect more training samples acquired under variable lightings but it is not practical in real world. ]:n object recognition, it is desirable to focus on feature extraction or normalization technique rather than focus on classifier. This paper presents a simple approach to normalization of faces subject to directional illumination. This is one of the significant issues that cause error in the face recognition process. The proposed method, ICR(illumination Compensation based on Multiple Linear Regression), is to find the plane that best fits the intensity distribution of the face image using the multiple linear regression, then use this plane to normalize the face image. The advantages of our method are simple and practical. The planar approximation of a face image is mathematically defined by the simple linear model. We provide experimental results to demonstrate the performance of the proposed ICR method on public face databases and our database. The experimental results show a significant improvement of the recognition accuracy.

3-D Analysis of Slope by Tension Wire Sensing (Tension Wire 계측을 통한 비탈면의 3차원 거동 분석)

  • Shin, Taeju;Kim, Taesoo;Hwang, Sanggoo;Han, Heuisoo
    • Journal of the Korean GEO-environmental Society
    • /
    • v.16 no.3
    • /
    • pp.41-48
    • /
    • 2015
  • Several sensor systems are used to estimate and predict the slope behaviors, however though slope sensing systems are much up-to-dated compared to before, they are mainly focused on the hardware developing. It means the analyzing software is deficient to apply the examining slope behavior for slope stability. In real case, slope behavior shows the 3-dimensional movement and failure; however the modeling methods for 3-D behavior are more difficult and need more variables. 1-D analysis shows only the length variation, however the real slope makes the 3-D behaviors. To fix the 3-D space coordinate, three values should be determined such as length, horizontal angle and vertical angle. Therefore if the 3-D coordinate system were composed by the points considered of two directions and length, the 3-D space could be separated into horizontal plane and vertical plane. The data from DY-slope in Chungbuk province was analyzed to the developed 3-D coordinate system. It is concluded from the results of 3-D analysis, the slope is generally moving to transverse direction, also the displacements are happening to road and vertical direction at the same time. Presently, the accumulated displacement between sensing points shows small value within 4.3 cm, and the displacements of all sensing points show the similar directions and magnitudes.