• Title/Summary/Keyword: Imaging Ellipsometer

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Measurement of Thin Film Thickness of Patterned Samples Using Spectral Imaging Ellipsometry (분광결상 타원계측법을 이용한 패턴이 형성된 나노박막의 두께측정)

  • 제갈원;조용재;조현모;김현종;이윤우;김수현
    • Journal of the Korean Society for Precision Engineering
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    • v.21 no.6
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    • pp.15-21
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    • 2004
  • 반도체 제조산업과 나노, 바이오 산업의 비약적 발전에 따라 게이트 산화막(gate oxide)과 같이 반도체 제조공정에서 사용되는 유전체 박막(dielectric film)의 두께는 수 $\mu\textrm{m}$에서 수 nm 에 이르기까지 다양할 뿐 아니라 얇아지고 있으며, 또한 이러한 박막들이 다층으로 복잡하게 적층된 다층 박막의 응용이 높아지는 추세이다. 따라서, 반도체 및 광통신 소자, 발광소자, 바이오 칩 어레이 등과 같은 나노박막을 이용하는 산업에서는 박막의 두께 측정을 더욱 정확하고, 보다 빠르며 효율적으로 측정할 수 있는 박막 두께 측정용 계측기가 요구된다.(중략)

Ellipsometry를 이용한 193 nm photoresist에서의 물의 흡수 연구

  • Lee Hyeong-Ju;Lee Jeong-Hwan;Seo Ju-Bin;Gyeong Jae-Seon;An Il-Sin
    • Proceedings of the Korean Society Of Semiconductor Equipment Technology
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    • 2006.05a
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    • pp.172-176
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    • 2006
  • 본 논문에서는 물을 이용한 193nm immersion lithography에서 물이 photoresist(PR)에 흡수되는 현상을 측정하기 위하여 타원해석기(Ellipsometer)의 응용 가능성을 연구하였다. 물이 PR 에 흡수됨에 따라 swelling 현상이 발생하여 두께 증가로 나타났는데 이는 실시간 타원해석기를 적용하여 시간에 따른 두께 변화를 분석함으로써 그 반응정도를 분석해 낼 수 있었다. 또한 짧은 시간에 발생하는 물의 흡수 현상은 imaging 타원해석기론 이용하여 규명할 수가 있었다.

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An Ellipsometry Study of Water Absorption in the 193 nm photoresist (Ellipsometry를 이용한 193 nm photoresist에서의 물의 흡수 연구)

  • Lee, Hyoung-Joo;Lee, Jung-Hwan;Seo, Ju-Bin;Kyoung, Jai-Sun;An, Il-Sin
    • Journal of the Semiconductor & Display Technology
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    • v.5 no.2 s.15
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    • pp.37-39
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    • 2006
  • We employed in-situ spectroscopic ellipsometry(SE) and imaging ellipsometry(IE) to study the interaction of water and photoresist(PR) in 193 immersion lithography. Real time measurement of SE showed thickness increase when PR was immerged in water indicating swelling effect. From the temporal evolution we could observe its reaction-limited behavior. Meanwhile, IE could identify the modification of PR surface by contact of water even for a short period of a second.

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Study on Refractive Index and Thickness of Human Stem Cells by Using Imaging Ellipsometry (영상 타원법을 이용한 인간 줄기세포의 굴절률과 두께 분포 연구)

  • Choi, Joong-Kyu;Shim, Woo-Young;Lee, Gwang;Kim, Sang-Youl;Park, Sang-Uk;CheGal, Won;Cho, Hyun-Mo;Cho, Yong-Jai
    • Korean Journal of Optics and Photonics
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    • v.20 no.1
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    • pp.53-56
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    • 2009
  • We applied an ellipsometric technique to get quantitative information about the thickness and refractive index of human Mesenchymal Stem Cells (hMSCs). The images of ellipsometric constants $\Delta$, $\Psi$ for the nucleus region and for the cell body region of hMSCs were obtained by using an Imaging Ellipsomter (IE) for their in vitro state. A numerical inversion method was applied to deduce the refractive index and the thickness of hMSCs from the measured $\Delta$, $\Psi$. Thus the images of the refractive index and those of the thickness of hMSCs for the nucleus region and for the cell body region are reported.

A Study on the Anti-Reflection Coating Effects of Polymer Eyeglasses Lens (폴리머 안경렌즈의 반사방지 코팅효과 연구)

  • Kim, Ki-Chul
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.18 no.1
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    • pp.216-221
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    • 2017
  • Reducing optical reflection in the visible light range, in order to increase the share of transmitted light and avoid the formation of ghost images in imaging, is important for polymer lens applications. In this study, polymer lenses with refractive indices of n=1.56, 1.60, and 1.67 were fabricated by the injection-molding method with a polymer lens monomer, dibutyltin dichloride as the catalyst and an alkyl phosphoric ester as the release agent. To investigate their anti-reflection (AR) effects, various AR coating structures, viz. a multi-layer AR coating structure, tri-layer AR coating structure with a discrete approximation Gaussian gradient-index profile, and tri-layer AR coating structure with a quarter-wavelength approximation, were designed and coated on the polymer lens by an E-beam evaporation system. The optical properties of the polymer lenses were characterized by UV-visible spectrometry. The material properties of the thin films, refractive index and surface roughness, were analyzed by ellipsometry and AFM, respectively. The most effective AR coating structure of the polymer lens with low refractive index, n=1.56, was the both side coating of multi-layer AR coating structure. However, both side coating of the tri-layered discrete approximation Gaussian gradient-index profile AR coating structure gave comparable results to the both side coating of the multi-layer AR coating structure for the polymer lens with a high refractive index of n=1.67.