• 제목/요약/키워드: HBTs

검색결과 59건 처리시간 0.021초

THE EFFECT OF DOPANT OUTDIFFUSION ON THE NEUTRAL BASE RECOMBINATION CURRENT IN Si/SiGe/Si HETEROJUNCTION BIPOLAR TRANSISTORS

  • Ryum, Byung-R.;Kim, Sung-Ihl
    • ETRI Journal
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    • 제15권3_4호
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    • pp.61-69
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    • 1994
  • A new analytical model for the base current of Si/SiGe/Si heterojunction bipolar transistors(HBTs) has been developed. This model includes the hole injection current from the base to the emitter, and the recombination components in the space charge region(SCR) and the neutral base. Distinctly different from other models, this model includes the following effects on each base current component by using the boundary condition of the excess minority carrier concentration at SCR boundaries: the first is the effect of the parasitic potential barrier which is formed at the Si/SiGe collector-base heterojunction due to the dopant outdiffusion from the SiGe base to the adjacent Si collector, and the second is the Ge composition grading effect. The effectiveness of this model is confirmed by comparing the calculated result with the measured plot of the base current vs. the collector-base bias voltage for the ungraded HBT. The decreasing base current with the increasing the collector-base reverse bias voltage is successfully explained by this model without assuming the short-lifetime region close to the SiGe/Si collector-base junction, where a complete absence of dislocations is confirmed by transmission electron microscopy (TEM)[1].The recombination component in the neutral base region is shown to dominate other components even for HBTs with a thin base, due to the increased carrier storage in the vicinity of the parasitic potential barrier at collector-base heterojunction.

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AlGaAs/GaAs HBT의 DC 파라미터에 미치는 온도영향의 해석 (Analysis of temperature effects on DC parameters of AlGaAs/GaAs HBT)

  • 김득영;박재홍;송정근
    • 전자공학회논문지A
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    • 제33A권12호
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    • pp.39-46
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    • 1996
  • In AlGaAs/GaAs HBT the temperature dependence of DC parameters was investigated over the temperature range between 95K and 580K. The temperature dependence of DC parameters depends on the relative contribution of each of the current components suc as emitter-injection-current, base-injection-current, bulk recombination current, interface recombination curretn, thermal generation ecurrent and avalanche current due to impact ionization within the collector space charge layer in a specific temperature. In this paper we investigated the temperature effects on DC parameters such as V$_{BE,ON}$ current gain, input and output characteristics, V$_{CE, OFF}$, R$_{E}$, R$_{C}$ and analyzed the origins, and extracted the qualitativ econditions for a stable HBTs against the temperature variation. Finally, in order to keep HBTs stable with respect to the variation of temperature, the valance-band-energy-discontinuity at emitter-base heterojunction should be large enough to enhance the effect of carrier suppression at a relatively high temperature. In addition the recombination centers, especially around collector junction, should be removed and the area of emitter and collector junction should be identical as well.

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A 10-Gbit/s Limiting Amplifier Using AlGaAs/GaAs HBTs

  • Park, Sung-Ho;Lee, Tae-Woo;Kim, Yeong-Seuk;Kim, Il-Ho;Park, Moon-Pyung
    • Journal of Electrical Engineering and information Science
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    • 제2권6호
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    • pp.197-201
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    • 1997
  • To realize 10-Gbit/s optical transmission systems, we designed and fabricated a limiting amplifier with extremely high operation frequencies over 10-GHz using AlGaAs/GaAs heterojunction bipolar transistors (HBTs), and investigated their performances. Circuit design and simulation were performed using SPICE and LABRA. A discrete AlGaAs/GaAs HBT with the emitter area of 1.5${\times}$10$\mu\textrm{m}$$^2$, used for the circuit fabrication, exhibited the cutoff frequency of 63GHz and maximum oscillation frequency of 50GHz. After fabrication of MMICs, we observed the very wide bandwidth of DC∼15GHz for a limiting amplifier from the on-wafer measurement. Ceramic-packaged limiting amplifier showed the excellent eye opening, the output voltage swing of 750mV\ulcorner, and the rise/fall time of 40ps, measured at the data rates of 10-Gbit/s.

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바이어스 스트레스에 의한 실리콘-게르마늄 이종접합 바이폴라 트랜지스터의 열화 현상 (The degradation phenomena in SiGe hetero-junction bipolar transistors induced by bias stress)

  • 이승윤;유병곤
    • 한국진공학회지
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    • 제14권4호
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    • pp.229-237
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    • 2005
  • 바이어스 스트레스 인가 후에 발생하는 실리콘-게르마늄 이종접합 바이폴라 트랜지스터(SiGe HBT)의 열화현상을 고찰하였다. SiGe HBT가 바이어스 스트레스에 일정 시간 노출되면 소자 내부의 변화에 의하여 소자 파라미터가 원래 값으로부터 벗어나게 된다. 에미터-베이스 접합에 역방향 바이어스 스트레스가 걸리면 전기장에 의해 가속된 캐리어가 재결합 중심을 생성하여 베이스 전류가 증가하고 전류이득이 감소한다. $140^{\circ}C$ 이상의 온도에서 높은 에미터 전류를 흘려주는 순방향 바이어스 전류 스트레스가 가해지면 Auger recombination이나 avalancHe multiplication에 의해 형성된 핫 캐리어가 전류이득의 변동을 유발한다. 높은 에미터 전류와 콜렉터-베이스 전압이 동시에 인가되는 mixed-mode 스트레스가 가해지면 에미터-베이스 역방향 바이어스 스트레스의 경우와 마찬가지로 베이스 전류가 증가한다. 그러나 miked-mode 스트레스 인가 후에는 inverse mode Gummel 곡선에서 베이스 전류 증가가 관찰되고 perimeter-to-area(P/A) 비가 작은 소자가 심각하게 열화되는 등 에미터-베이스 역방향 바이어스 스트레스와는 근본적으로 다른 신뢰성 저하 양상이 나타난다.

DC - 18GHz의 광대역 레이저 구동회로 제작 및 특성 (Farbrication and perfomance of a laser driver IC with broad bandwidth of DC - 18 GHz)

  • 박성호;이태우;기현철;김충환;김일호;박문평
    • 전자공학회논문지D
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    • 제35D권1호
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    • pp.34-40
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    • 1998
  • For applicating to 10-Gbit/s optical transimission systems, we have designed and fabricated a laser driver IC with extremely-high-operation-frequencies using AlGaAs/GaAs heterojunction bipolar transistors (HBTs), and have investigated its performances. Circuits design andsimulation were performed using SPICE and LIBRA. A discrete AlGaAs/GaAs HBT with the emitter area of 1.5*10 .mu.m$^{2}$, used for the circuit fabrication, exhibited cutoff frequency of 63 GHz andmaximum osciallation frquency of 50 GHZ. After fabrication of MMICs, we observed the very wide bandwidth of DC~18 GHz and the S$_{21}$ gain of 17 dB for a laser driver IC from the on-wafer measurement. Metal-packaged laser driver IC showed the excellent eye opening, the modulation currents of 32 mA, the rise/fall time of 40 ps, measured at the data rates of 10-Gbit/s.

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온도변화에 따른 AlGaAs/GaAs HBT의 전류이득 특성 (Current Gain Characteristics of AlGaAs/GaAs HBTs with different Temperatures)

  • 김종규;안형근;한득영
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 하계학술대회 논문집
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    • pp.840-843
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    • 2001
  • In this study, temperature dependency of current gain for AlGaAs/GaAs/GaAs HBT is analytically proposed over the temperature range between 300K and 600K. Energy bandgap, effective mass, intrinsic carrier concentration are considered as temperature dependent parameters. Collector current which is numerically calculated is then analytically expressed to enhance the speed of calculation for current gain. From the results, current gain decreases as the temperature increases. These results will be used to expect the unity current gain frequency f$_{T}$ in conjunction with emitter-base and collector- base capacitances.s.

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$WN_{x}$ 에미터 전극을 갖는 자기정렬 AlGaAs/GaAs HBT의 제작과 특성 (Fabrication and Character istics of self-aligned AlGaAs/GaAs HBT using $WN_{x}$ as emitter metal)

  • 이종민;이태우;박문평;최인훈;박성호;박철순
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 하계종합학술대회논문집
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    • pp.461-464
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    • 1998
  • Self-aligned AlGaAs/GaAs HBTs with the emitter area of 1.5*10.mu.$m^{2}$ were fabricated usng $WN_{x}$ as emitter metal. Their DC and RF characteristics were investigated. The common emitter current gain was 45 at $J_{c}$ = 6*$10^{4}$A/$cm^{2}$. From the Gummel plot, the ideality factors of $I_{c}$ and $I_{B}$ were 1.18 and 1.70, respectively. Emitter and base resistance were extracted from voltage drop region in gummel plot, and their values were 5.3.ohm. and 38.2.ohm.. The extrapolated $f_{T}$ = 72GHz and $f_{max}$ = 81GHz were obtained at $V_{CE}$ = 2V.

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등방성 언더컷 식각에 의한 에어-브리지 소자 격리 구조를 갖는 AaGaAs/GaAs HBT의 제작에 관한 연구 (A study of the fabrication of AlGaAs/GaAs HBT with an air-bridge isolation structure induced by isotropic undercut etching)

  • 김연태;이제희;윤상호;권오섭;반용찬;원태영
    • 전자공학회논문지D
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    • 제35D권5호
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    • pp.40-47
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    • 1998
  • This paper report sthe design, fabrication and characterization of an AlGaAs/GaAs HBT (heterojunction bipolar transistor) with an air-bridge isolation structure which is made to improve high frequency characteristics for the application to the mobile communication system in the next genration. We found that the size, shape and structure of HBT have an effect on the high frequency operation. The measured dc and ac characteristics of the four type HBTs were compared and analyzed. An E-type HBT with an air-bridge structure by undercut etching exhibited .beta.=56, $V_{off-set}$ = 0.3 V, B $V_{CEO}$=7.0V with $f_{T}$=40 GHz and $f_{max}$=45GHz at a collector current density of 7.1*10$^{4}$ A/c $m^{2}$.>.

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이종접합 바이폴라 트랜지스터에 관한 소신호 등가회로의 정확한 모델링 (Accurate modeling of small-signal equivalent circuit for heterojunction bipolar transistors)

  • 이성현
    • 전자공학회논문지A
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    • 제33A권7호
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    • pp.156-161
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    • 1996
  • Accurate equivalent circuit modeling using multi-circuit optimization has been perfomred for detemining small-signal model of AlGaAs/GaAs HBTs. Three equivalent circuits for a cutoff biasing and two active biasing at different curretns are optimized simultaneously to fit gheir S parameters under the physics-based constrain that current-dependent elements for one of active circuits are connected to those for another circit multiplied by the ratio of two currents. The cutoff mode circuit and the physical constrain give the advantage of extracting physically acceptable parameters, because the number of unknown variables. After this optimization, three ses of optimized model S-parameters agree well with their measured S-parameters from 0.045 GHz to 26.5GHz.

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ITO 에미터 투명전극을 갖는 InP/InGaAs HPT 제작 (Fabrication of InP/InGaAs HPT's with ITO Emitter Contacts)

  • 강민수;한교용
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제51권11호
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    • pp.546-550
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    • 2002
  • In this paper, Heterojunction phototransistors(HPT's) with an optically transparent ITO emitter contacts were fabricated. The ITO ohmic contacts were realized by employing thin imdium layer between the ITO and $n^+$-InP layers. The ITO contact was annealed at $250^{\circ}C$. The specific contact resistance of about $6.6{\times}10^{-4}{\Omega}cm^2$ was measured by use of the transmission line model (TLM). Heterojunction bipolar transistors (HBTs) having the same device layout were fabricated to compare with HPTs. The DC characteristics of the InP/InGaAs HPT showed the similar electrical characteristics of the HBT. Emitter contact resistance($R_E$) of about $6.4{\Omega}$ was extracted, which was very similar to that of the HBT. The optical characteristics of HPT's were generated by illuminating the device with light from $1.3{\mu}m$ light. It showed that HPT's can be controlled optically.