• Title/Summary/Keyword: Gate characteristics

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Design of RF Receiver using Independent-Gate-Mode Double-Gate MOSFET (Independent-Gate-Mode Double-Gate MOSFET을 이용한 RF Receiver 설계)

  • Jeong, Na-Rae;Kim, Yu-Jin;Yun, Ji-Sook;Park, Sung-Min;Shin, Hyung-Soon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.10
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    • pp.16-24
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    • 2009
  • Independent-gate-mode double-gate(IGM-DG) MOSFET overcomes the limitation of 3-terminal device structure, and enables to operate with different voltages for front-gate and back-gate. Therefore, circuit designs becomes not only simple, but also area-efficient due to the controllability of the 4th terminal provided by IGM-DG MOSFETs. In this paper, an RF receiver utilizing IGM-DG MOSFETs is presented and also, the circuit performance is verified by the HSPICE simulations. Besides, the circuit analysis and optimization are performed for various IGM-DG characteristics.

Study on Characteristics of Organic Thin Film Transistors with Rubbed Organic Gate Insulators

  • Lee, Jong-Hyuk;Kang, Chang-Heon;Choi, Jong-Sun;Lee, Sin-Doo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2002.08a
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    • pp.717-720
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    • 2002
  • In this work, the electrical characteristics of organic thin film transistors with the surface-treated organic gate insulators have been studied. For the surface treatment, the simple rubbing technique was used. The field effect mobilities of the devices with PVP gate insulator was improved about four times as high as those of TFTs without the insulator surface treatment.

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Electrical Characteristics of Thin Film Transistor According to the Schottky Contacts (쇼키컨텍에 의한 박막형 트랜지스터의 전기적 특성)

  • Oh, Teresa
    • Korean Journal of Materials Research
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    • v.24 no.3
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    • pp.135-139
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    • 2014
  • To obtain the transistor with ambipolar transfer characteristics, IGZO/SiOC thin film transistor was prepared on SiOC with various polarities as a gate insulator. The interface between a channel and insulator showed the Ohmic and Schottky contacts in the bias field of -5V ~ +5V. These contact characteristics depended on the polarities of SiOC gate insulators. The transfer characteristics of TFTs were observed the Ohmic contact on SiOC with polarity, but Schottky contact on SiOC with low polarity. The IGZO/SiOC thin film transistor with a Schottky contact in a short range bias electric field exhibited ambipolar transfer characteristics, but that with Ohmic contact in a short range electric field showed unipolar characteristics by the trapping phenomenon due to the trapped ionized defect formation.

Fabrication of Sputtered Gated Silicon Field Emitter Arrays with Low Gate Leakage Currents by Using Si Dry Etch

  • Cho, Eou Sik;Kwon, Sang Jik
    • Transactions on Electrical and Electronic Materials
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    • v.14 no.1
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    • pp.28-31
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    • 2013
  • A volcano shaped gated Si-FEA (silicon field emitter array) was simply fabricated using sputtering as a gate electrode deposition and lift-off for the removal of the oxide mask, respectively. Due to the limited step coverage of well-controlled sputtering and the high aspect ratio in Si dry etch caused by high RF power, it was possible to obtain Si FEAs with a stable volcano shaped gate structure and to realize the restriction of gate leakage current in field emission characteristics. For 100 tip arrays and 625 tip arrays, gate leakage currents were restricted to less than 1% of the anode current in spite of the volcano-shaped gate structure. It was also possible to keep the emitters stable without any failure between the Si cathode and gate electrode in field emission for a long time.

Fluorine Effects on NMOS Characteristics and DRAM Refresh

  • Choi, Deuk-Sung
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.12 no.1
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    • pp.41-45
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    • 2012
  • We observed that in chemical vapor deposition (CVD) tungsten silicide (WSix) poly gate scheme, the gate oxide thickness decreases as gate length is reduced, and it intensifies the roll-off properties of transistor. This is because the fluorine diffuses laterally from WSix to the gate sidewall oxide in addition to its vertical diffusion to the gate oxide during gate re-oxidation process. When the channel length is very small, the gate oxide thickness is further reduced due to a relative increase of the lateral diffusion than the vertical diffusion. In DRAM cells where the channel length is extremely small, we found the thinned gate oxide is a main cause of poor retention time.

Investigation of Junction-less Tunneling Field Effect Transistor (JL-TFET) with Floating Gate

  • Ali, Asif;Seo, Dongsun;Cho, Il Hwan
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.17 no.1
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    • pp.156-161
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    • 2017
  • This work presents a novel structure for junction-less tunneling field effect transistor (JL-TFET) with a floating gate over the source region. Introduction of floating gate instead of fixed metal gate removes the limitation of fabrication process suitability. The proposed device is based on a heavily n-type-doped Si-channel junction-less field effect transistor (JLFET). A floating gate over source region and a control-gate with optimized metal work-function over channel region is used to make device work like a tunnel field effect transistor (TFET). The proposed device has exhibited excellent ID-VGS characteristics, ION/IOFF ratio, a point subthreshold slope (SS), and average SS for optimized device parameters. Electron charge stored in floating gate, isolation oxide layer and body doping concentration are optimized. The proposed JL-TFET can be a promising candidate for switching performances.

Analysis of Transient Characteristics for IGBTs with Gate resistances (게이트저항에 따른 IGBT의 과도 특성 해석)

  • Ryu, Se-Hwan;Lee, Myung-Soo;Won, Chang-Sub;An, Hyung-Keun;Han, Deuk-Young
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.173-174
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    • 2006
  • In this paper we proposed transient model for NPT(Non Punch-Through) IGBT(Insulated Gate Bipolar Transistor) with gate resistances. As gate resistance increases, turn-off time increases. But If gate resistance is small, overshoot voltage increase. To analyze the effect of gate resistance, the transient model is made and the experiments are conducted. We used gate resistances of values; 8[$\Omega$], 140[$\Omega$], 810[$\Omega$] for simulations and experiments. We compared theoretical and experimental results and obtained good agreements.

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A Study on the Characteristics of Hospitality through Limits of the Front Gate in Korea, China and Japan - Focused on Levinas' Ethical Theory - (한·중·일의 대문경계를 통해서 본 타자에 대한 환대 특성 연구 - 레비나스의 타자윤리적 측면을 중심으로 -)

  • An, Eun-Hi;Park, Chong-Ku
    • Korean Institute of Interior Design Journal
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    • v.26 no.4
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    • pp.84-92
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    • 2017
  • Just as the front gate is located at the meeting point between the house and the street, the Subject and the Other face each other the same way. This study examines the relationship between House(subject) and Stree (other) at the boundary of the Front Gate-Face. Pursuing the aspects of the changing Front Gate-Face accordingly to the attitude of the Subject facing the Other, this study tries to analyze the possibilities and significance of the hospitality Front Gate-Face with the ethical point of view of Levinas. As architectural instance, results of examining the Front Gate-Face of traditional houses in Korea, China and Japan are as follows. Front Gate-Face of China is characterized by self-centered introversion to interact with the external world (the other). Front Gate-Face of Japan is characterized by a humble submission to the group. Front Gate-Face of Korea shows however more flexible relationship orientations in terms of hospitality, compared to Japan or China. When looking through hospitality factors, accordingly to the above mentioned Korean hospitality characteristics, the possibilities seem not be exclusively bordered inside the conceptual category perimeter suggested by Levinas' concept of hospitality. It is almost impossible for the nowadays ever-strong privacy culture to not allow room for the architectural structure of an absolute hospitality toward others. However, this impossibility not being absolute, still yields a space for a significant possibility to explore.

Effect of Channel and Gate Structures on Electrical Characteristics of Oxide Thin-Film Transistors (Channel과 gate 구조에 따른 산화물 박막트랜지스터의 전기적 특성 연구)

  • Kong, Heesung;Cho, Kyoungah;Kim, Jaybum;Lim, Junhyung;Kim, Sangsig
    • Journal of IKEEE
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    • v.26 no.3
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    • pp.500-505
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    • 2022
  • In this study, we designed oxide thin-film transistors (TFTs) with dual gate and tri layered split channels, and investigated the structural effect of the TFTs on the electrical characteristics. The dual gates played a key role in increasing the driving current, and the channel structure of tri layers and split form contributed to the increase in the carrier mobility. The tri layered channels consisting of the a-ITGZO and two ITO layers inserted between the gate dielectric and a-ITGZO led to the increase in the on-current by using ITO layers with high conductivity, and the split channels lowered series resistance of the channels. Compared with the mobility (15 cm2/V·s) of the single gate a-ITGZO TFT, the mobility (134 cm2/V·s) of the dual gate tri-layer split channel TFT was remarkably enhanced by the structural effect.