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http://dx.doi.org/10.5573/JSTS.2017.17.1.156

Investigation of Junction-less Tunneling Field Effect Transistor (JL-TFET) with Floating Gate  

Ali, Asif (Department of Electronic Engineering, Myongji University)
Seo, Dongsun (Department of Electronic Engineering, Myongji University)
Cho, Il Hwan (Department of Electronic Engineering, Myongji University)
Publication Information
JSTS:Journal of Semiconductor Technology and Science / v.17, no.1, 2017 , pp. 156-161 More about this Journal
Abstract
This work presents a novel structure for junction-less tunneling field effect transistor (JL-TFET) with a floating gate over the source region. Introduction of floating gate instead of fixed metal gate removes the limitation of fabrication process suitability. The proposed device is based on a heavily n-type-doped Si-channel junction-less field effect transistor (JLFET). A floating gate over source region and a control-gate with optimized metal work-function over channel region is used to make device work like a tunnel field effect transistor (TFET). The proposed device has exhibited excellent ID-VGS characteristics, ION/IOFF ratio, a point subthreshold slope (SS), and average SS for optimized device parameters. Electron charge stored in floating gate, isolation oxide layer and body doping concentration are optimized. The proposed JL-TFET can be a promising candidate for switching performances.
Keywords
Tunneling field effect transistor; junction-less field effect transistor; band to band tunneling; floating gate; high-k dielectric;
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