• 한국항해항만학회:학술대회논문집
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• 한국항해항만학회 2002년도 춘계학술대회논문집
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• pp.13-19
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• 2002

In inner harbour of Inchon Port, there are two lock gates (50KT, 10KT) which have two gates per lock gate in inner/outer sides except a gate in inner harbour side 7f 10KT. Due to the lack of the fore-mentioned gate, the use of 10KT lock gate Is suspended in every 3 years for regular maintenance. Now an additional gate is under construction in order to improve the efficiency of the 10KT lock gate. This paper will be aimed to evaluate the operational utilization levels of lock gates in present and future. The present operational utilization levels of lock gates are 0.2119 in 10KT lock gate, 0.2051 in 50KT lock gate which were considered the 46.5 closed days every 3 years for 10KT regular maintenance. The levels are estimated to 0.2246(10KT), 0.2539(50KT) in 2006 and 0.2241(10KT), 0.2560(50KT) in 2011. The levels of 50KT lock gate are evaluated to be more rapidly increased up to 24.5% in 2011.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1987년도 정기총회 및 창립40주년기념 학술대회 학회본부
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• pp.193-196
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• 1987

We reported that hot electron phenomena in submicron nMOSFET by Monte Carlo method. In order to predict the influence of the hot electron effects on the device reliability, either simple analytical model or a complete two dimensional numerical simulation has been adopted. Results of numerical simulation, based on the static mobility model, may be inaccurate when gate length of MOSFET is scaled down to less than 1um. Most of device simulation packages utilize the static nobility model. Monte Carlo method based on stochastic analysis of carrier movement may be a powerful tool to characterize hot electrons. In this work, energy and velocity distribution of carriers were obtained to predict the relative degree of short channel effects for different device parameters. Our analysis shows a few interesting results when $V_{ds}$ is 5 volt, average electron energy does not increase with gate bias as evidenced by substrate current.

• 한국산학기술학회논문지
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• 제16권7호
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• pp.4411-4417
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• 2015

플라스틱 제품의 사출금형을 위한 게이트 위치의 최적 설계는 다양한 설계에 대한 3차원 사출성형 분석으로 도출할 수 있다. 이 논문은 사출금형에서 게이트 위치의 영향에 관한 연구이다. 게이트 위치는 플라스틱 제품의 생산성과 품질에 결정적인 영향을 미친다. 논문의 목적은 사출기를 사용한 자동차 에어 클리너 상부커버의 제조과정 중에 수지충전, 웰드라인, 사출압력에 대한 게이트의 영향을 분석하기 위한 것이다. 따라서 이 논문에서 이러한 문제들을 분석하기 위한 게이트의 위치는 4가지 경우로 변화를 주었다. 논문에서 각각의 게이트 위치 변화를 고려한 CAE 시뮬레이션은 사출금형공정에서 제품에 나타나는 결함의 원인을 예견하기 위하여 수행되었다.

• 대한전자공학회논문지SD
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• 제43권4호
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• pp.23-30
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• 2006

본 연구에서는 나노 스케일 MuGFET(Mutiple-Gate FETs)의 단채널 효과와 corner effect를 3차원 시뮬레이션을 통하여 분석하였다. 문턱전압 모델을 이용하여 게이트 숫자(Double-gate=2, Tri-gate=3, Pi-gate=3.14, Omega-gate=3.4, GAA=4)를 구하였으며 추출된 게이트 숫자를 이용하여 각각의 소자 구조에 맞는 natural length($\lambda$)값을 얻을 수 있었다. Natural length를 통하여 MuGFET의 단채널 효과를 피할 수 있는 최적의 소자 구조(실리콘 두께, 게이트 산화막의 두께 등)를 제시 하였다. 이러한 corner effect를 억제하기 위해서는 채널 불순물의 농도를 낮게 하고, 게이트 산화막의 두께를 얇게 하며, 코너 부분을 약 17%이상 라운딩을 해야 한다는 것을 알 수 있었다.

• 전기전자학회논문지
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• 제25권2호
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• pp.381-387
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• 2021

과거 주로 게임과 동영상 재생에 있어 리얼함을 극대화하기 위해 사용되었던 HMD(Head Mount Display)의 수요가 증가하고, 그 활용 범위가 교육과 훈련 등으로 확대되면서, 기존 HMD의 성능을 향상시킬 수 있는 방안에 대한 관심이 높아지고 있다. 본 논문에서는 HMD의 각 화소 회로에 제어 신호를 보내는 gate driver의 성능을 향상시키기 위해 CNT를 포함한 트랜지스터를 활용하는 방법에 대해 논하고자 한다. 기존 gate driver의 버퍼부를 구성하는 트랜지스터를 CNT를 포함한 트랜지스터로 교체하는 회로 설계 방법을 제안하고, 그 성능을 회로 시뮬레이션을 통해 기존 트랜지스터로만 구성된 gate driver의 성능과 비교해 보고자 한다. 시뮬레이션 결과, gate driver에 CNT를 포함할 경우 12.5 GHz의 속도로 기존 gate driver 대비 약 0.3V 증가된 출력 전압(1.1V)을 얻을 수 있었으며, 최대 20배의 gate width를 줄일 수 있었다.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1998년도 추계종합학술대회 논문집
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• pp.723-726
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• 1998

Fault dropping is a very important part of test generation process. It is used to reduce test generation time. Test generation systems use fault simulation for the purpose of fault dropping by identifying detectable faults with generated test patterns. Two kinds of delay fault model is used in practice, path delay fault model and gate delay fault model. In this paper we propose an efficient method for gate delay test generation which shares second test vector.

• 전기학회논문지
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• 제59권9호
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• pp.1611-1614
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• 2010

The explosion of a nuclear weapon radiates a gamma-ray in the form of a transient pulse. If the gamma-ray introduces to semiconductor devices, much Electron-Hole Pairs(EHPs) are generated in depletion region of the devices[7]. as a consequence of that, high photocurrent is created and causes upset, latchup and burnout of semiconductor devices[8]. This phenomenon is known for Transient Radiation Effects on Electronics(TREE), also called dose-rate effects. In this paper 3D structure of inverter and NAND gate device was designed and transient pulse gamma-ray was modeled. So simulation for transient radiation effect on inverter and NAND gate was accomplished and mechanism for upset and latchup was analyzed.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1994년도 하계학술대회 논문집 A
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• pp.237-239
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• 1994

The MOS-controlled thyristor(MCT) is a new power semi-conductor device that combines four layers thyristor structure presenting regenerative action and MOS-gate providing controlled turn-on and turn-off. The MCT has very fast switching speed owing to voltage controlled MOS-gate, and very low on-state voltage drop resulting from regenerative action of four layers thyristor structure. In addition, because of a higher dv/dt rating and di/dt rating, gate drive circuit and snubber circuit can be simpler comparing to other power switching devices. So recently much interest and endeavor is being applied to develop the performance and ratings of the MCT. This paper describes the switching characteristic of the MCT for its practical applications and presents a model for PSPICE circuit simulation. The model for PSPICE circuit simulation is compared to the experimental result using MCTV75P60F1 made by Harris co..

• ETRI Journal
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• 제32권4호
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• pp.530-539
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• 2010

As the conventional silicon metal-oxide-semiconductor field-effect transistor (MOSFET) approaches its scaling limits, quantum mechanical effects are expected to become more and more important. Accurate quantum transport simulators are required to explore the essential device physics as a design aid. However, because of the complexity of the analysis, it has been necessary to simulate the quantum mechanical model with high speed and accuracy. In this paper, the modeling of double gate MOSFET based on an adaptive neuro-fuzzy inference system (ANFIS) is presented. The ANFIS model reduces the computational time while keeping the accuracy of physics-based models, like non-equilibrium Green's function formalism. Finally, we import the ANFIS model into the circuit simulator software as a subcircuit. The results show that the compact model based on ANFIS is an efficient tool for the simulation of nanoscale circuits.

• 센서학회지
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• 제24권5호
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• pp.353-357
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• 2015

A new SPICE-compatible model for a gate/body-tied PMOSFET photodetector (GBT PD) with an overlapping control gate is presented. The proposed SPICE-compatible model of a GBT PD with an overlapping control gate makes it possible to control the photocurrent. Research into GBT PD modeling was proposed previously. However, the analysis and simulation of GBT PDs is not lacking. This SPICE model concurs with the measurement results, and it is simpler than previous models. The general GBT PD model is a hybrid device composed of a MOSFET, a lateral bipolar junction transistor (BJT), and a vertical BJT. Conventional SPICE models are based on complete depletion approximation, which is more applicable to reverse-biased p-n junctions; therefore, they are not appropriate for simulating circuits that are implemented with a GBT PD with an overlapping control gate. The GBT PD with an overlapping control gate can control the sensitivity of the photodetector. The proposed sensor is fabricated using a $0.35{\mu}m$ two-poly, four-metal standard complementary MOS (CMOS) process, and its characteristics are evaluated.