• 제목/요약/키워드: FET Device

검색결과 257건 처리시간 0.034초

유기물과 유무기 혼합 폴리머 게이트 절연체를 사용한 유기 박막 트랜지스터의 특성 (Characteristics of Organic Thin Film Transistors with Organic and Organic-inorganic Hybrid Polymer Gate Dielectric)

  • 배인섭;임하영;조수헌;문송희;최원석
    • 한국전기전자재료학회논문지
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    • 제22권12호
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    • pp.1009-1013
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    • 2009
  • In this study, we have been synthesized the dielectric layer using pure organic and organic-inorganic hybrid precursor on flexible substrate for improving of the organic thin film transistors (OTFTs) and, design and fabrication of organic thin-film transistors (OTFTs) using small-molecule organic semiconductors with pentacene as the active layer with record device performance. In this work OTFT test structures fabricated on polymerized substrates were utilized to provide a convenient substrate, gate contact, and gate insulator for the processing and characterization of organic materials and their transistors. By an adhesion development between gate metal and PI substrate, a PI film was treated using $O_2$ and $N_2$ gas. The best peel strength of PI film is 109.07 gf/mm. Also, we have studied the electric characteristics of pentacene field-effect transistors with the polymer gate-dielectrics such as cyclohexane and hybrid (cyclohexane+TEOS). The transistors with cyclohexane gate-dielectric has higher field-effect mobility, $\mu_{FET}=0.84\;cm^2/v_s$, and smaller threshold voltage, $V_T=-6.8\;V$, compared with the transistor with hybrid gate-dielectric.

SiON buffer layer를 이용한 MFIS Capacitor의 제작 및 특성 (Fabrications and properties of MFIS capacitor using SiON buffer layer)

  • 정상현;정순원;인용일;김광호
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 하계학술대회 논문집
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    • pp.70-73
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    • 2001
  • MFIS(Metal-ferroelectric-insulator- semiconductor) structures using silicon oxynitride(SiON) buffer layers were fabricatied and demonstrated nonvolatile memory operations. Oxynitride(SiON) films have been formed on p-Si(100) by RTP(rapid thermal process) in O$_2$+N$_2$ ambient at 1100$^{\circ}C$. The gate leakage current density of Al/SiON/Si(100) capacitor was about the order of 10$\^$-8/ A/cm$^2$ at the range of ${\pm}$ 2.5 MV/cm. The C-V characteristics of Al/LiNbO$_3$/SiON/Si(100) capacitor showed a hysteresis loop due to the ferroelectric nature of the LiNbO$_3$ thin films. Typical dielectric constant value of LiNbO$_3$ film of MFIS device was about 24. The memory window width was about 1.2V at the electric field of ${\pm}$300 kV/cm ranges.

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Full-Chip Power/Performance Benefits of Carbon Nanotube-Based Circuits

  • Song, Taigon;Lim, Sung Kyu
    • Journal of information and communication convergence engineering
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    • 제13권3호
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    • pp.180-188
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    • 2015
  • As a potential alternative to the complementary metal-oxide semiconductor (CMOS) technology, many researchers are focusing on carbon-nanotube field-effect transistors (CNFETs) for future electronics. However, existing studies report the advantages of CNFETs over CMOS at the device level by using small-scale circuits, or over outdated CMOS technology. In this paper, we propose a methodology of analyzing CNFET-based circuits and study its impact at the full-chip scale. First, we design CNFET standard cells and use them to construct large-scale designs. Second, we perform parasitic extraction of CNFET devices and characterize their timing and power behaviors. Then, we perform a full-chip analysis and show the benefits of CNFET over CMOS in 45-nm and 20-nm designs. Our full-chip study shows that in the 45-nm design, CNFET circuits achieve a 5.91×/3.87× (delay/power) benefit over CMOS circuits at a density of 200 CNTs/µm. In the 20-nm design, CNFET achieves a 6.44×/3.01× (delay/power) benefit over CMOS at a density of 200 CNTs/µm.

3.3V 동작 68% 효율, 디지털 휴대전화기용 고효율 GaAs MESFET 전력소자 특성 (A 3.3V, 68% power added efficieny, GaAs power MESFET for mobile digital hand-held phone)

  • 이종남;김해천;문재경;이재진;박형무
    • 전자공학회논문지A
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    • 제32A권6호
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    • pp.41-50
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    • 1995
  • A state-of-the-arts GaAs power metal semiconductor field effect transistor (MESFET) for 3.3V operation digital hand-held phone at 900 MHz has been developed for the first time, The FET was fabricated using a low-high doped structures grown by molecular beam epitaxy (MBE). The fabricated MESFETs with a gate width of 16 mm and a gate length of 0.8 .mu.m shows a saturated drain current (Idss) of 4.2A and a transconductance (Gm) of around 1700mS at a gate bias of -2.1V, corresponding to 10% Idss. The gate-to-drain breakdown voltage is measured to be 28 V. The rf characteristics of the MESFET tested at a drain bias of 3.3 V and a frequencyof 900 MHz are the output power of 32.3 dBm, the power added efficiency of 68%, and the third-ordr intercept point of 49.5 dBm. The power MESFET developed in this work is expected to be useful as a power amplifying device for digital hand-held phone because the high linear gain can deliver a high power added efficiency in the linear operation region of output power and the high third-order intercept point can reduce the third-order inter modulation.

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터널링 전계효과 트랜지스터의 고주파 파라미터 추출과 분석 (Analyses for RF parameters of Tunneling FETs)

  • 강인만
    • 대한전자공학회논문지SD
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    • 제49권4호
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    • pp.1-6
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    • 2012
  • 본 논문에서는 고주파에서 동작하는 터널링 전계효과 트랜지스터 (TFET)의 소신호 파라미터 추출과 이에 대한 분석을 다루고 있다. 시뮬레이션으로 구현된 TFET의 채널 길이는 50 nm에서 100 nm 사이에서 변화되었다. Conventional planar MOSFET 기반의 quasi-static 모델을 이용하여 TFET의 파라미터 추출이 이루어졌으며 다른 채널 길이를 갖는 TFET에 대한 소신호 파라미터의 값을 게이트 바이어스 변화에 따라서 추출하였다. 추출 결과로부터 effective gate resistance와 transconductance, source-drain conductance, gate capacitance 등 주요 파라미터의 채널 길이 변화에 따른 경향성이 conventional MOSFET과 상당히 다른 것을 확인하였다. 그리고 $f_T$는 MOSFET과 달리 게이트 길이 역수의 값에 정확히 반비례하는 특성을 보였으며 TFET의 고주파 특성 향상을 transconductance의 개선이 아닌 gate capacitance의 감소에 의하여 가능함을 알 수 있었다.

Highly Sensitive Flexible Organic Field-Effect Transistor Pressure Sensors Using Microstructured Ferroelectric Gate Dielectrics

  • 김도일;이내응
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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    • pp.277.2-277.2
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    • 2014
  • For next-generation electronic applications, human-machine interface devices have recently been demonstrated such as the wearable computer as well as the electronic skin (e-skin). For integration of those systems, it is essential to develop many kinds of components including displays, energy generators and sensors. In particular, flexible sensing devices to detect some stimuli like strain, pressure, light, temperature, gase and humidity have been investigated for last few decades. Among many condidates, a pressure sensing device based on organic field-effect transistors (OFETs) is one of interesting structure in flexible touch displays, bio-monitoring and e-skin because of their flexibility. In this study, we have investigated a flexible e-skin based on highly sensitive, pressure-responsive OFETs using microstructured ferroelectric gate dielectrics, which simulates both rapidly adapting (RA) and slowly adatping (SA) mechanoreceptors in human skin. In SA-type static pressure, furthermore, we also demonstrate that the FET array can detect thermal stimuli for thermoreception through decoupling of the input signals from simultaneously applied pressure. The microstructured highly crystalline poly(vinylidene fluoride-trifluoroethylene) possessing piezoelectric-pyroelectric properties in OFETs allowed monitoring RA- and SA-mode responses in dyanamic and static pressurizing conditions, which enables to apply the e-skin to bio-monitoring of human and robotics.

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스위치의 선형영역을 이용한 무효전력보상기의 돌입전류 억제 방안 (Inrush Current Suppression Method of the Reactive Power Compensator by using a Linear Region of the Switch)

  • 박성미;강성현;박성준
    • 조명전기설비학회논문지
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    • 제27권3호
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    • pp.55-64
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    • 2013
  • In this paper, a new topology which can add a small reactor in series to a condenser-bank type reactive power compensator to limit current is proposed. And also the proposed topology can add or remove a power condenser safely without any addition of inrush-current suppression resistance. The proposed method tests variable resistance of the drain source of a switching device which is controlled by gate voltage in a two-way switch with a diode rectifier and FET switch. In other words, the proposed method is a inrush-current suppression method with the structure of variable resistance. In particular, the proposed method creates smooth current without any resonance in inrush-current as well as is not limited by the time of switch on and off.

A Brief Review on Recent Developments in MAPbI3 Perovskite-Based Transistors

  • Padi, Siva Parvathi;Kim, Taeyong;Rabelo, Matheus;Yi, Junsin
    • 한국전기전자재료학회논문지
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    • 제34권5호
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    • pp.348-356
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    • 2021
  • Field-effect transistors (FETs) are the key elements of conventional electronics; hence, have drawn a lot of research and commercial interests. In recent years, metal halide perovskite materials have achieved a remarkable efficiency of 29.15% in the field of photovoltaics, and have drawn the scientific community's attention to promote their use in the field of optoelectronics, such as FETs and phototransistors. The MAPbI3 (methylammonium lead iodide) perovskite TFT has achieved a record hole mobility of 21.41 cm2/V-s in the year 2020. In this review, we will briefly discuss the physical structure of MAPbI3 perovskite and the essential factors that stimulate these devices, together with the role of defects, the ion migration concept, and the implication of both dielectric and electrode materials on the device's performance.

Electrical Characteristic of IGZO Oxide TFTs with 3 Layer Gate Insulator

  • Lim, Sang Chul;Koo, Jae Bon;Park, Chan Woo;Jung, Soon-Won;Na, Bock Soon;Lee, Sang Seok;Cho, Kyoung Ik;Chu, Hye Yong
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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    • pp.344-344
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    • 2014
  • Transparent amorphous oxide semiconductors such as a In-Ga-Zn-O (a-IGZO) have advantages for large area electronic devices; e.g., uniform deposition at a large area, optical transparency, a smooth surface, and large electron mobility >10 cm2/Vs, which is more than an order of magnitude larger than that of hydrogen amorphous silicon (a-Si;H).1) Thin film transistors (TFTs) that employ amorphous oxide semiconductors such as ZnO, In-Ga-Zn-O, or Hf-In-Zn-O (HIZO) are currently subject of intensive study owing to their high potential for application in flat panel displays. The device fabrication process involves a series of thin film deposition and photolithographic patterning steps. In order to minimize contamination, the substrates usually undergo a cleaning procedure using deionized water, before and after the growth of thin films by sputtering methods. The devices structure were fabricated top-contact gate TFTs using the a-IGZO films on the plastic substrates. The channel width and length were 80 and 20 um, respectively. The source and drain electrode regions were defined by photolithography and wet etching process. The electrodes consisting of Ti(15 nm)/Al(120 nm)/Ti(15nm) trilayers were deposited by direct current sputtering. The 30 nm thickness active IGZO layer deposited by rf magnetron sputtering at room temperature. The deposition condition is as follows: a rf power 200 W, a pressure of 5 mtorr, 10% of oxygen [O2/(O2+Ar)=0.1], and room temperature. A 9-nm-thick Al2O3 layer was formed as a first, third gate insulator by ALD deposition. A 290-nm-thick SS6908 organic dielectrics formed as second gate insulator by spin-coating. The schematic structure of the IGZO TFT is top gate contact geometry device structure for typical TFTs fabricated in this study. Drain current (IDS) versus drain-source voltage (VDS) output characteristics curve of a IGZO TFTs fabricated using the 3-layer gate insulator on a plastic substrate and log(IDS)-gate voltage (VG) characteristics for typical IGZO TFTs. The TFTs device has a channel width (W) of $80{\mu}m$ and a channel length (L) of $20{\mu}m$. The IDS-VDS curves showed well-defined transistor characteristics with saturation effects at VG>-10 V and VDS>-20 V for the inkjet printing IGZO device. The carrier charge mobility was determined to be 15.18 cm^2 V-1s-1 with FET threshold voltage of -3 V and on/off current ratio 10^9.

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고조파 제어 회로를 이용한 X-대역 전력 증폭기의 효율 개선에 관한 연구 (A Study on Efficiency Improvement of X-Band Power Amplifier Using Harmonic Control Circuit)

  • 김형종;최진주;김동윤;나형기
    • 한국전자파학회논문지
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    • 제21권9호
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    • pp.987-994
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    • 2010
  • 본 논문에서는 간단하면서도 효과적인 능동적인 로드 풀(active load-pull) 방법을 제시하고, 고조파의 임피던스 성분을 제어하는 회로를 사용하여, X-대역 전력 증폭기의 효율을 개선시킬 수 있는 방법에 관하여 연구하였다. 제안된 능동적인 로드 풀 시스템은 크게 방향성 결합기와 위상 변위기, 단락 회로, 그리고 전력 증폭기로 구성되어 있으며, 전통적인 능동적인 로드 풀 방법에 비해 반사 계수가 1인 지점까지 임피던스를 쉽게 가져다 놓을 수 있다. 본 논문에서 사용된 소자는 Mitsubishi사의 GaAs FET인 MGF1801이며, 9 GHz의 동작 주파수에서 class-A일 때, 21.65 dBm의 출력 전력과 24.9 %의 드레인 효율을 얻었고, class-AB일 때, 21.46 dBm의 출력 전력과 53.3%의 드레인 효율을 얻었다. 고조파 제어 회로는 실험에 사용된 초고주파 부품의 주파수 대역폭의 한계로 인해, 2차와 3차 항 성분까지만 고려하여 설계하였으며, class-AB에서, 6.4 %의 효율이 증가된 것을 확인하였다.