• Title/Summary/Keyword: Etching resistance

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The Electrical Properties of OLED by surface Etching methode of ITO (ITO 표면 처리방법에 따른 OLED의 전기적 특성)

  • Yang, Myoung-Hak;Ki, Hyun-Chul;Min, Yong-Ki;Hong, Kyung-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.455-456
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    • 2008
  • In this study, we report that an electrical properties of OLEDs was investigated by the surface etching method of ITO Layer. The electrical properties of OLEDs was measured by IVL and optical properties by EL spectrum. The fundamental structure of OLEDs was ITO anode/TPD(400$\breve{A}$)/$Alq_3(600\breve{A})$/LiF(5$\breve{A}$)/Al(1200$\breve{A}$) cathode. The threshold voltage was low value according to the low resistance of surface. The luminance was increased by decreased surface resistance.

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Resist characteristics and molecular structure control of polystyrene by plasma polymerization method (플라즈마중합법에 의한 폴리스티렌의 분자구조 제에 및 레지스트 특성 조사)

  • 박종관;김영봉;김보열;임응춘;이덕출
    • The Transactions of the Korean Institute of Electrical Engineers
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    • v.45 no.3
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    • pp.438-443
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    • 1996
  • The effect of plasma polymerization conditions on the structure of the plasma polymerized styrene were investigated by using Fourier Transform Infrared Ray(FT-IR), Differential Scanning Calorimetry (DSC), Gel Permeation Chromatography(GPC). Plasma polymerized thin film was prepared using an interelectrode inductively coupled gas-flow-type reactor. We show that polymerization parameters of thin film affect sensitivity and etching resistance of plasma polymerized styrene is 1.41~3.93, and deposition rate of that are 32~383[.angs./min] with discharge power. Swelling and etching resistance becomes more improved with increasing discharge power during plasma polymerization. (author). 11 refs., 10 figs., 1 tab.

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Effect of Chemically Etched Surface Microstructure on Tribological Behaviors

  • Hye-Min Kwon;Sung-Jun Lee;Chang-Lae Kim
    • Tribology and Lubricants
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    • v.40 no.3
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    • pp.84-90
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    • 2024
  • This study investigates the effect of the surface microstructure on the tribological characteristics of glass substrates. Chemical etching using hydrofluoric acid and ammonium hydrogen fluoride was employed to create controlled asperity structures on glass surfaces. By varying the etching time from 10 to 50 min, different surface morphologies were obtained and characterized using optical microscopy, surface roughness measurements, and water contact angle analysis. Friction tests were performed using a stainless steel ball as the counter surface to evaluate the tribological behavior of the etched specimens. The results showed that the specimen etched for 20 min exhibited the lowest and most stable friction coefficient, which was attributed to the formation of a uniform and dense asperity structure that effectively reduced the stress concentration and wear at the contact interface. In contrast, specimens etched for shorter (10 min) or longer (30-50 min) durations displayed higher friction coefficients and accelerated wear owing to nonuniform asperity structures that led to local stress concentration. Optical microscopy of the wear tracks further confirmed the superior wear resistance of the 20-minute etched specimen. These findings highlight the importance of optimizing the etching process parameters to achieve the desired surface morphology for enhanced tribological performance, suggesting the potential of chemical etching as a surface modification technique for various materials in tribological applications.

Etch Resistance of Mask Layer modified by AFM-based Tribo-Nanolithography in Aqueous Solution (AFM 기반 액중 Tribo nanolithography 에서의 마스크 층 내식각성에 관한 연구)

  • Park Jeong-Woo;Lee Deug-Woo;Kawasegi Noritaka;Morita Noboru
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.10a
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    • pp.268-271
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    • 2005
  • Etch resistance of mask layer on silicon substrate modified by AFM-based Tribo-Nanolithography (TNL) in Aqueous Solution in an aqueous solution was demonstrated. n consists or sequential processes, nano-scratching and wet chemical etching. The simple scratching can form a mask layer on the silicon substrate, which acting as an etching mask. For TNL, a specially designed cantilever with diamond tip, allowing the formation of mask layer on silicon substrate easily by a simple scratching process, has been applied instead of conventional silicon cantilever fur scanning. This study demonstrates how the TNL parameters can affect the etch resistance of mask layer, hence introducing a new process of AFM-based maskless nanolithography in aqueous solution.

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Superconducting Flux flow Transistor using Plasma Etching (플라즈마 식각을 이용한 초전도 자속 흐름 트랜지스터)

  • 강형곤;고석철;최명호;한윤봉;한병성
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.5
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    • pp.424-428
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    • 2003
  • The channel of a superconducting flux flow transistor has been fabricated with plasma etching method using a inductively coupled plasma etching. The ICP conditions then were ICP Power of 450 W, rf chuck power of 150 W, the pressure in chamber of 5 mTorr, and Ar : Cl$_2$=1:1. Especially, over the 5 mTorr, the superconducting thin films were not etched. The channel etched by plasma gas showed the critical temperature over 85 K. The critical current of the SFFT was altered by varying the external applied current. As the external applied current increased from 0 to 12 mA, the critical current decreased from 28 to 22 mA. Then the obtained trans-resistance value was smaller than 0.1 $\Omega$ at a bias current of 40 mA.

Microfluidic LOC System (Microfluidic LOC 시스템)

  • Kim, Hyun-Ki;Gu, Hong-Mo;Lee, Yang-Du;Lee, Sang-Yeol;Yoon, Young-Soo;Ju, Byeong-Kwon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.906-911
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    • 2004
  • In this paper, we used only PR as etching mask, while it used usually Cr/AU as etching mask, and in order to fabricate a photosensor has the increased sensitivity, we investigated on the sensitivity of general type and p-i-n type diode. we designed microchannel size width max 10um, min 5um depth max 10um, reservoir size max 100um, min 2mm. Fabrication of microfluidic devices in glass substrate by glass wet etching methods and glass to glass fusion bonding. The p-i-n diode has higher sensitivity than photodiode. Considering these results, we fabricated p-i-n diodes on the high resistive($4k{\Omega}{\cdot}cm$) wafer into rectangle and finger pattern and compared internal resistance of each pattern. The internal resistance of p-i-n diode can be decreased by the application of finger pattern has parallel resistance structure from $571\Omega$ to $393\Omega$.

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Effects of Fluorine Addition on Thermal Properties and Plasma Resistance of MgO-Al2O3-SiO2 Glass (MgO-Al2O3-SiO2계 유리 열물성 및 내플라즈마 특성에 대한 Fluorine 첨가의 영향)

  • Yoon, Ji Sob;Choi, Jae Ho;Jung, YoonSung;Min, Kyung Won;Kim, Hyeong-Jun
    • Journal of the Semiconductor & Display Technology
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    • v.21 no.1
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    • pp.119-126
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    • 2022
  • MAS-based glass, which has been studied to replace the ceramic material used in the plasma etching chamber, has problems such as forming and processing due to its high melting temperature. To solve this problem, in this study, fluoride was added to the existing MAS-based glass to increase the workability in the glass manufacturing and to improve the chemical resistance to CF4/Ar/O2 plasma gas. Through RAMAN analysis, the structural change of the glass according to the addition of fluoride was observed. In addition, it was confirmed that high-temperature viscosity and thermal properties decreased as the fluoride content increased and plasma resistance was maintained, it showed an excellent etching rate of up to 11 times compared to quartz glass.

Characterization of chemical vapor deposition-grown graphene films with various etchants

  • Choi, Hong-Kyw;Kim, Jong-Yun;Jeong, Hu-Young;Choi, Choon-Gi;Choi, Sung-Yool
    • Carbon letters
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    • v.13 no.1
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    • pp.44-47
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    • 2012
  • We analyzed the effect of etchants for metal catalysts in terms of the characteristics of resulting graphene films, such as sheet resistance, hall mobility, transmittance, and carrier concentration. We found the residue of $FeCl_3$ etchant degraded the sheet resistance and mobility of graphene films. The residue was identified as an iron oxide containing a small amount of Cl through elemental analysis using X-ray photoelectron spectroscopy. To remove this residue, we provide an alternative etching solution by introducing acidic etching solutions and their combinations ($HNO_3$, HCl, $FeCl_3$ + HCl, and $FeCl_3+HNO_3$). The combination of $FeCl_3$ and acidic solutions (HCl and $HNO_3$) resulted in more enhanced electrical properties than pure etchants, which is attributed to the elimination of left over etching residue, and a small amount of amorphous carbon debris after the etching process.

A Comparative Study on the Influence of Etchant upon the Etching Rate and Quality in Laser Induced Wet Etching of Fused Silica (식각액에 따른 용융실리카의 레이저 습식 식각 특성 비교 연구)

  • 이종호;이종길;전병희
    • Transactions of Materials Processing
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    • v.13 no.3
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    • pp.268-272
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    • 2004
  • Transparent materials such as fused silica are widely utilized in optical and optoelectronics field because of its outstanding properties, such as transparency in a wide wavelength range, strong damage resistance for laser irradiation, and high thermal and chemical stability. In this study, we made a few micro patterns on the surface of fused silica plate using laser induced wet etching. KrF excimer laser was used as a light source. There were no burrs and micro cracks on the etched surface of fused silica and the flatness of the etched surface was fairly good. We investigated the influence of etchant upon the etch rate and quality in laser induced wet etching. Pyrene-acetone solution and toluene were used as etchant. In the side of etch rate, toluene solution was better than pyrene-acetone solution. But we made in wider range of energy density using pyrene-acetone solution. But pyrene-acetone solution gave us wider window of energy density for successful micro patterning.

Microstructural Characterization and Plasma Etching Resistance of Thermally Sprayed $Al_2O_3$ and $Y_2O_3$ Coatings

  • Baik, Kyeong-Ho;Lee, Young-Ra
    • Proceedings of the Korean Powder Metallurgy Institute Conference
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    • 2006.09a
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    • pp.234-235
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    • 2006
  • In this study, the plasma sprayed $Al_2O_3$ and $Y_2O_3$ coatings have been investigated for applications of microelectronic components. The plasma sprayed coatings had a well-defined splatted lamellae microstructure, intersplat pores and a higher amount of microcracks within the splats. The plasma sprayed $Y_2O_3$ coating had a relatively lower hardness of 300-400Hv, compared to 650-800Hv for $Al_2O_3$ coating, and would be readily damaged by mechanical attacks such as erosion, wear and friction. For a reactive ion etching against F-containing plasmas, however, the $Y_2O_3$ coating had a much higher resistance than the $Al_2O_3$ coating because of the reduced erosion rate of by-products.

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