• Title/Summary/Keyword: Electronic and thermal properties

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The Relaxation of Nonlinear Optical Properties in a Poled Polymer (극화된 고분자에서 비선형 광학특성의 완화)

  • Jung, Chi-Sup
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.23 no.6
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    • pp.491-496
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    • 2010
  • The relaxation behavior of aligned electric dipoles in a mixed polymer of P2ANS with P(VDF-TrFE) is studied with optical second harmonic generation (SHG). In this work, a macroscopic noncentrosymmetry of the spin coated film was achieved by an electrical poling. The relaxation of induced polar order of nonlinear optic(NLO) chromophores after poling leads to an insufficient long-term stability of NLO properties. In this work, we develop a new technique to suppress such kind of dipole relaxation in a poled polymer. We found that the poled dipoles in a NLO polymer were effectively immobilized by the internal electric field created by a thermally annealed ferroelectric polymer. The long-term stability in a mixed system of NLO polymer/ferroelectric polymer was successively accomplished by a series of thermal treatments applied to the mixed polymer system at a temperature of $140^{\circ}C$ for at least 1hour after poling.

Structural Properties of P(VDF-TrFE) LB Films (P(VDF-TrFE) LB박막의 구조특성)

  • Kwak, Eun-Hwi;Lee, Jin-Ho;Jung, Chi-Sup
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.8
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    • pp.698-703
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    • 2009
  • We report the studies on the structrural properties of Langmuir Blodgett (LB) films fabricated from the copolymer of vinylidenefluoride (VDF) with trifluoroethylene(TrFE). The formation of nanomesas induced by thermal annealing at $135\;^{\circ}C$ for 1 hour was investigated with the atomic force microscope (AFM) and the X-ray diffractometer (XRD). From the result of surface morphology change in 30 monolayer LB film, we find that the annealing treatment on the P(VDF-TrFE) LB film result in the plastic deformation of crystalline polymer. The ${\beta}$ phase crytalline structure in annealed LB film was clearly confirmed from the XRD peak at $19.7^{\circ}$.

Synthesis, Characterization, and Properties of Fully Aliphatic Polyimides and Their Derivatives for Microelectronics and Optoelectronics Applications

  • Mathews Anu Stella;Kim Il;Ha Chang-Sik
    • Macromolecular Research
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    • v.15 no.2
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    • pp.114-128
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    • 2007
  • Polyimides are one of the most important classes of polymers used in the microelectronics and photoelectronics industries. Because of their high thermal stability, chemical resistance, and good mechanical and electric properties, polyimides are often applied in photoresists, passivation and dielectric films, soft print circuit boards, and alignment films within displays. Recently, fully aliphatic and alicyclic polyimides have found applications as optoelectronics and inter layer dielectric materials, due to their good transparencies and low dielectric constants $(\varepsilon)$. The low molecular density, polarity and rare probability of forming inter- or intra-molecular charge transfers, resulting in lowering of the dielectric constant and high transparency, are the most striking characteristics of aliphatic polyimide. However, the ultimate end use of polyimides derived from aliphatic monomers is in their targeted applications that need less stringent thermal requirements. Much research effort has been exerted in the development of aliphatic polyimide with increased thermal and mechanical stabilities, while maintaining their transparencies and low dielectric constants, by the incorporation of rigid moieties. In this article, the recent research process in synthesizing fully aliphatic polyimides, with improved dimensional stability, high transparency and low $\delta$values, as well as the characterizations and future scope for their application in micro electric and photo-electronic industries, is reviewed.

Investigation on the Dielectric, Physical and Chemical Properties of Palm Oil and Coconut Oil under Open Thermal Ageing Condition

  • Mohamad, Nur Aqilah;Azis, Norhafiz;Jasni, Jasronita;Kadir, Mohd Zainal Abidin Ab;Yunus, Robiah;Ishak, Mohd Taufiq;Yaakub, Zaini
    • Journal of Electrical Engineering and Technology
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    • v.11 no.3
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    • pp.690-698
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    • 2016
  • In this paper, a study is carried out to investigate the dielectric, physical and chemical properties of Palm Oil (PO) and Coconut Oil (CO) under open thermal ageing condition. The type of PO used in this study is Refined Bleached and Deodorized Palm Oil (RBDPO) Olein. The ageing experiment was carried out at 85 ℃ and 115 ℃ for 1, 3, 5, 7 and 14 days. Several parameters were measured such as AC breakdown voltage, dielectric dissipation factor, relative permittivity, resistivity, viscosity, moisture and acidity throughout the ageing duration. Based on the study, it is found that there are no significant changes on the AC breakdown voltages and relative permittivities for both RBDPO and CO. At ageing temperature of 115℃, there are clear reduction trends of dielectric dissipation factor for CO and resistivities for most of RBDPO. On the other hand, no clear trends are observed for viscosities, moisture and acidities of RBDPO and CO throughout the ageing duration.

Study on Joint of Micro Solder Bump for Application of Flexible Electronics (플렉시블 전자기기 응용을 위한 미세 솔더 범프 접합부에 관한 연구)

  • Ko, Yong-Ho;Kim, Min-Su;Kim, Taek-Soo;Bang, Jung-Hwan;Lee, Chang-Woo
    • Journal of Welding and Joining
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    • v.31 no.3
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    • pp.4-10
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    • 2013
  • In electronic industry, the trend of future electronics will be flexible, bendable, wearable electronics. Until now, there is few study on bonding technology and reliability of bonding joint between chip with micro solder bump and flexible substrate. In this study, we investigated joint properties of Si chip with eutectic Sn-58Bi solder bump on Cu pillar bump bonded on flexible substrate finished with ENIG by flip chip process. After flip chip bonding, we observed microstructure of bump joint by SEM and then evaluated properties of bump joint by die shear test, thermal shock test, and bending test. After thermal shock test, we observed that crack initiated between $Cu_6Sn_5IMC$ and Sn-Bi solder and then propagated within Sn-Bi solder and/or interface between IMC and solder. On the other hands, We observed that fracture propated at interface between Ni3Sn4 IMC and solder and/or in solder matrix after bending test.

The Thermal and Optical Properties of Te-based Antireflection structure for Optical Recording (광기록을 위한 Te-based Antireflection구조의 열적, 광학적 특성)

  • Lee, S.J.;Lee, H.Y.;Chung, H.J.;Lee, Y.J.
    • Proceedings of the KIEE Conference
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    • 1993.07b
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    • pp.1256-1258
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    • 1993
  • Optical data storage offer high density storage and archival storage capability. In this study, we selected the ablation mechanism-one of an irreversible recording system-using the antireflection trilayer(ART) structure. Optical recording medium is a $(Te_{86}Se_{14})_{50}Bi_{50}$ thin films. Actually, ART structure is fabricated and compared to monolayer structure. ART structure leads to the reduction of recording power as well as an increase in the effciency compared to the monolayer structure.

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Thermoelectric Properties of P-type (Ce1-zYbz)0.8Fe4-xCoxSb12 Skutterudites

  • Choi, Deok-Yeong;Cha, Ye-Eun;Kim, Il-Ho
    • Korean Journal of Metals and Materials
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    • v.56 no.11
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    • pp.822-828
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    • 2018
  • P-type Ce/Yb-filled skutterudites were synthesized, and their charge transport and thermoelectric properties were investigated with partial double filling and charge compensation. In the case of $(Ce_{1-z}Yb_z)_{0.8}Fe_4Sb_{12}$ without Co substitution, the marcasite ($FeSb_2$) phase formed alongside the skutterudite phase, but the generation of the marcasite phase was inhibited by increasing Co concentration. The electrical conductivity decreased with increasing temperature, exhibiting degenerate semiconductor behavior. The Hall and Seebeck coefficients were positive, which confirmed that the specimens were p-type semiconductors with holes as the major carriers. The carrier concentration decreased as the concentration of Ce and Co increased, which led to decreased electrical conductivity and increased Seebeck coefficient. The thermal conductivity decreased due to a reduction in electronic thermal conductivity via Co substitution, and due to decreased lattice thermal conductivity via double filling of Ce and Yb. $(Ce_{0.25}Yb_{0.75})_{0.8}Fe_{3.5}Co_{0.5}Sb_{12}$ exhibited the greatest dimensionless figure of merit (ZT = 0.66 at 823 K).

Thermal Stress Analysis of Functuonally Graded Ceramic/Metal Composites(II) (경사기능성 세라믹/금속 복합재료의 열응력해석)

  • Lim, Jae-Kyoo;Song, Jun-Hee
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.21 no.10
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    • pp.1571-1579
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    • 1997
  • The development of a new material which should be continuously use under severe environment of very high temperature has been urgently requested. For the development of such super-heat resistant materials, the main problem is not only to make the superior thermal barrier properties but also to actively release thermal stress. So, a new concept of functionally graded material(FGM) has been proposed to overcome this problem. A composition and microstructure of FGM are varied continuously from place to place in ways designed to provide it with the maximum function of mitigating the induced thermal stress. So, FGM can be applied in the aerospace, the electronic and the medical field, etc.. In this study, thermal stress analysis of sintering PSZ/NiCrAlY graded material was conducted theoretically using a finite-element program. The temperature condition was sintering temperature assuming a cooling-down process up to room temperature. Fracture damage mechanism was anlayzed by the parameters of residual stress. It could be known that FGM provided with the function of mitigating the induced thermal stress.

Structural Properties of Nickel Manganite Thin Films Fabricated by Metal Organic Decomposition (금속유기분해법으로 제조한 니켈 망가나이트 박막의 구조적 특성)

  • Lee, Kui Woong;Jeon, Chang Jun;Jeong, Young Hun;Yun, Ji Sun;Nam, Joong Hee;Cho, Jeong Ho;Paik, Jong Hoo;Yoon, Jong-Won
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.27 no.4
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    • pp.226-231
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    • 2014
  • Thin thermistor films of solutions with nickel and manganese oxides were prepared by metal-organic decomposition (MOD). The structural properties of the thin films were investigated as a function of annealing temperature. Field emission scanning electron microscope (FE-SEM) results indicated that the thin films had a thin thickness, smooth and dense surface. The crystallization temperature of $414.9^{\circ}C$ was confirmed from thermogavimetric-differential thermal analysis (TG-DTA) curve. A single phase of cubic spinel structure was obtained for the thin film annealed from $700^{\circ}C$ to $800^{\circ}C$, which was confirmed from the X-ray diffraction (XRD). From the selected area electron diffraction (SAED) in high resolution transmission electron microscope (HRTEM), the nano grains (2~3 nm) of spinel phase with (311) and (222) planes were detected for the thin film annealed at $500^{\circ}C$, which could be applicable to read-out integrated circuit (ROIC) substrate of the uncooled microbolometer with low processing temperature.

The post annealing effect on the properties of AZO films (AZO 박막의 후 열처리에 따른 특성변화)

  • Ko, Ki-Han;Seo, Jae-Keun;Kim, Jae-Kwang;Cho, Hyung-Jun;Hong, Byung-You;Choi, Won-Seok
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.457-458
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    • 2009
  • In this work, transparent conducting Al-doped zinc oxide (AZO) films were prepared on Coming glass substrate by RF magnetron sputtering using an Al-doped ZnO target (Al: 2 wt.%) at room temperature and all films were deposited with athickness of 150 nm. We investigated the effects of the post-annealing temperature and the annealing ambient on structural, electrical and optical properties of AZO films. The films were annealed at temperatures ranging from 300 to $500^{\circ}C$ in steps of $100^{\circ}C$ using rapid thermal annealing equipment in oxygen. The thickness of the film was observed by field emission scanning electron microscopy (FE-SEM) and grain size was calculated from the XRD spectra using the Scherrer equation and their electrical properties were investigated using a hole measurement and the reflectance of AZO films was investigated by UV-VIS spectrometry.

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