• Journal of information and communication convergence engineering
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• 제12권4호
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• pp.221-227
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• 2014

In this paper, we analyze the effect of the coherence bandwidth of wireless channels on leakage suppression methods for discrete Fourier transform (DFT)-based channel estimation in orthogonal frequency division multiplexing (OFDM) systems. Virtual carriers in an OFDM symbol cause orthogonality loss in DFT-based channel estimation, which is referred to as the leakage problem. In order to solve the leakage problem, optimal and suboptimal methods have already been proposed. However, according to our analysis, the performance of these methods highly depends on the coherence bandwidth of wireless channels. If some of the estimated channel frequency responses are placed outside the coherence bandwidth, a channel estimation error occurs and the entire performance worsens in spite of a high signal-to-noise ratio.

• 전기학회논문지
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• 제56권4호
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• pp.745-750
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• 2007

In this paper, we propose a new gate modification method using the input vector maximizes the number of gates in WLS within the optimum range of the minimum leakage power. We prove that MLV is not always the optimal solution, and that the leakage power and area can decrease when modifying the gates using the input vector for which the number of gates in WLS is maximized within the optimum range of the minimum leakage power for the circuits applying the IVC technique and gate modification method. Using the proposed method, the gate-level description circuit can be converted to the modified circuit which reduces the leakage power by chip designer, and the modified circuit can be applied without any modification in design flow.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 하계학술대회 논문집
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• pp.855-858
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• 2001

The stress induced leakage currents of thin silicon oxides is investigated in the VLSI implementation of a self learning neural network integrated circuits using a linearity synapse transistor. The channel current for the thickness dependence of stress current, transient current, and stress induced leakage currents has been measured in oxides with thicknesses between 41 ${\AA}$, 86${\AA}$, which have the channel width ${\times}$ length 10 ${\times}$1${\mu}$m, 10 ${\times}$0.3${\mu}$m respectively. The stress induced leakage currents will affect data retention in synapse transistors and the stress current, transient current is used to estimate to fundamental limitations on oxide thicknesses. The synapse transistor made by thin silicon oxides has represented the neural states and the manipulation which gaves unipolar weights. The weight value of synapse transistor was caused by the bias conditions. Excitatory state and inhitory state according to weighted values affected the channel current. The stress induced leakage currents affected excitatory state and inhitory state.

• 한국전기전자재료학회논문지
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• 제29권10호
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• pp.595-600
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• 2016

In this paper, the oxide currents of thin silicon oxides is investigated. The oxide currents associated with the on time of applied voltage were used to measure the distribution of voltage stress induced traps in thin silicon oxide films. The stress induced leakage currents were due to the charging and discharging of traps generated by stress voltage in the silicon oxides. The stress induced leakage current will affect data retention in memory devices. The oxide current for the thickness dependence of stress current and stress induced leakage currents has been measured in oxides with thicknesses between $109{\AA}$, $190{\AA}$, $387{\AA}$, and $818{\AA}$ which have the gate area $10^{-3}cm^2$. The oxide currents will affect data retention and the stress current, stress induced leakage current is used to estimate to fundamental limitations on oxide thicknesses.

• 한국전기전자재료학회논문지
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• 제17권9호
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• pp.1013-1021
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• 2004

This paper presents the results of spectrum analysis of leakage current waveforms on contaminated polymer insulators under fog conditions. This is a basic study on development of a monitoring for aging degree and surface pollution state using distortion rate(%) of 3rd and 5th harmonics according fundamental frequency[60Hz] under environment conditions. Arcing on the surface was always associated with distortion in the leakage current ; hence the low frequency components of the leakage current can be used as a means to evaluate the surface degradation. The results indicate that the distortion rate by spectrum analysis is available for the monitoring of contamination condition of EPDM Polymer insulators.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제53권7호
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• pp.364-369
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• 2004

In this Paper, a flashover prediction method using the leakage current in the contaminated EPDM distribution polymer insulator is proposed. The leakage currents on the insulator were measured simultaneously with the different salt fog application such as 25g, 50g, and 75g per liter of deionized water. Then, the measured leakage currents were enveloped and transformed as the CDFS using the Hilbert transform and the level crossing rate, respectively. The obtained CDFS having different gradients(angles) were used as a important factor for the flashover prediction of the contaminated polymer insulator. Thus, the average angle change with an identical salt fog concentration was within a range of 20 degrees, and the average angle change among the different salt fog concentrations was 5 degrees. However, it is hard to be distinguished each other because the gradient differences among the CDFS were very small. So, the new weighting value was defined and used to solve this problem. Through simulation, it Is verified that the proposed method has the capability of the flashover prediction.

• 한국조명전기설비학회:학술대회논문집
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• 한국조명전기설비학회 2004년도 춘계학술대회 논문집
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• pp.392-396
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• 2004

Experimental equipments for long-term outdoor tests of EHV insulators in outdoor were constructed. The testing insulators have been energized with 89 [kV] phase-to-ground AC voltage under identical condition at station, and the investigation was carried out for leakage current and various environments such as temperature, relative humidity and wind velocity. The test results of leakage current wave trends have forms on distorted waves including harmonics. The porcelain and glass insulators have low leakage current in case of daytime because moisture and humidity have relative low values. In comparison with these conditions, high leakage current was shown at dawn and rainy day due to high humidity. However, leakage current of polymer insulators was shown approximately $129[{\mu}m]$ without relation to the weather due to hydrophobicity on their surface.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 제37회 하계학술대회 논문집 C
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• pp.1572-1573
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• 2006

This paper presents electrical properties of Zinc Oxide(ZnO) surge arrester blocks under the power frequency AC voltages and various temperatures. The leakage current, $I_{R}-V$ curios and power dissipation for the fine and aged ZnO surge arrester blocks were measured as a function of the temperatures and applied voltages. When the temperature is increased from $50\;[^{\circ}C]$ to $150\;[^{\circ}C]$, the total leakage current significantly increased at the sane applied voltage level. Also, the resistive leakage currents and power dissipation were increased with increasing temperature. The leakage current and power dissipation of the aged ZnO arrester blocks were higher than the fine ZnO arrester blocks.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 춘계학술대회 논문집 방전 플라즈마 유기절연재료 초전도 자성체연구회
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• pp.65-68
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• 2004

This paper researched leakage current characteristics of artificially contaminated EHV insulators through construction of long-term testing facility. Insulators were contaminated and classified into the ESDD contaminated levels under IEC standards method. As the test results of contaminated insulators was carried out several experiments, leakage current greatly increased during initial rainfall. After contaminated insulators were naturally washed by rain, leakage current was not increased.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
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• pp.1166-1170
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• 2004

The leakage currents of transmission insulator were investigated as a function of environmental conditions, such as temperature, humidity, and rainfall. The insulators were artificially contaminated with insoluble yellow soil and kaolin which helped salt to stick on the surface of insulator. The insulators contaminated with the grade of B, C, and D were installed in the KoChang Testing Center. The leakage currents were measured and compared with non-contaminated insulators. The results indicated that the most important factor affecting leakage current was humidity. After heavy rain, the artificially contaminated salt was dissolved, resulting in similar characteristics between with and without contamination