• 제목/요약/키워드: Double sampling

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Adjusting Practical Aims in Optimal Extended Double Sampling Plans

  • Ko, Seoung-gon
    • Communications for Statistical Applications and Methods
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    • 제6권1호
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    • pp.143-150
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    • 1999
  • Ko(1998) proposed a procedure to enhance the efficiency of double sampling plans by allowing second-stage sample size and critical region to depend on first-stage evidence using constraint optimization approaches. In this study further developments of such plans by incorporating several practically possible researcher's aims into the optimization are considered. Comparisons are made with the optimal ordinary double sampling plan and also among them It is observed that it is to some extent possible to match the details of the optimization to certain qualitative methodological aims.

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전환규칙을 적용한 조정형 샘플링 검사의 종류 (Revised KS Standards for Acceptance Sampling By Attribute and By Variable Based On Switching Rule)

  • 최성운
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2008년도 추계학술대회
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    • pp.517-526
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    • 2008
  • This paper introduces fourteen single, double, multiple and sequential acceptance sampling plans based on switching rule. Revised KS standards for acceptance sampling by attribute and by variable such as KSA ISO 2859-0, 1:2001 2859-2:2001, 8422:2001, 3951:2006, 8423:2001, MIL-STD-105E:1989, 414:1968 and ANSI/ASQ Z1.4, Z1.9:2003 are presented.

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KS개정 선별형 계수이산 샘플링 검사 계획 (Revised KS Standards for Acceptance Sampling By Attribute Based On Screening)

  • 최성운
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2008년도 추계학술대회
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    • pp.241-246
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    • 2008
  • This paper introduces nine acceptance sampling plans by attribute based on screening (sorting, rectifying). Revised KS standards for single and double acceptance sampling by attribute such as Dodge - Romig : 1998, KSA ISO 2859 - 2 : 2001, 13448 - 1, 2, MIL - STD - 105E : 1989, KSA IEC 60410 and ANSI/ASQ Z1. 4 : 2003 are presented.

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선별형 2회 샘플링 검사방식의 최적설계를 위한 알고리즘 개발 (An Algorithm for Determining Double Rectifying Inspection Plans)

  • 강보철;조재립
    • 품질경영학회지
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    • 제24권4호
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    • pp.207-223
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    • 1996
  • These days, customers have attached great importance to the function of product liability and quality assurance. In Korea, the single rectifying sampling inspection for attribute (KS A 3105) has been used. But this inspection plan given by tables (KS A 3105) has some defects. There are limitations in the range of applications and irrationality of approximate probability and the double rectifying sampling inspection is not mentioned. Moreover, ATI (average total inspection) does not reflect sampling costs and the loss of nonconforming item. Therefore, the objectives of this study is to develope new algorithms and computer program that provide the optimal sampling inspection plan based on minimum linear costs (single & double inspection plan). The result of this study revealed that the new algorithm is less than KS A 3105 in ATI and basically, double inspection plan is more economical. Also it comes over restrictions in KS A 3105. So, it is definite that the optimal solution can be obtained considering cost factors in manufacturing and sampling process, and costs can be saved in the long term.

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Ratio Cum Regression Estimator for Estimating a Population Mean with a Sub Sampling of Non Respondents

  • Kumar, Sunil
    • Communications for Statistical Applications and Methods
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    • 제19권5호
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    • pp.663-671
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    • 2012
  • In the present study, a combined ratio cum regression estimator is proposed to estimate the population mean of the study variable in the presence of a non-response using an auxiliary variable under double sampling. The expressions of bias and mean squared error(MSE) based on the proposed estimator is derived under double (or two stage) sampling to the first degree of approximation. Some estimators are also derived from the proposed class by allocating the suitable values of constants used. A comparison of the proposed estimator with the usual unbiased estimator and other derived estimators is carried out. An empirical study is carried out to demonstrate the performance of the suggested estimator and of others; it is endow that the empirical results backing the theoretical study.

더블 샘플링 기법을 사용한 10bit 1MS/s 0.5mW 축차 비교형 아날로그-디지털 변환기 (A 10bit 1MS/s 0.5mW SAR ADC with Double Sampling Technique)

  • 이호규;김무영;김철우
    • 전기학회논문지
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    • 제60권2호
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    • pp.325-329
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    • 2011
  • This paper introduces the 10b 1MS/s SAR ADC with double sampling technique to reduce the power consumption. The SAR ADC is implemented in CMOS 1P8M 65nm technology and occupies 0.11um2. The maximum sampling rate is 1MS/s. The simulated SNDR and SFDR are 55.6dB and 62.7dB at 484kHz input frequency, respectively. The implemented data converter consumes 507uW with 1.2-V supply.

Dual Sampling-Based CMOS Active Pixel Sensor with a Novel Correlated Double Sampling Circuit

  • Jo, Sung-Hyun;Bae, Myung-Han;Jung, Joon-Taek;Choi, Pyung;Shin, Jang-Kyoo
    • 센서학회지
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    • 제21권1호
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    • pp.7-12
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    • 2012
  • In this paper, we propose a 4-transistor active pixel sensor(APS) with a novel correlated double sampling(CDS) circuit for the purpose of extending dynamic range. Dual sampling techniques can overcome low-sensitivity and temporal disparity problems at low illumination. To accomplish this, two images are obtained at the same time using different sensitivities. The novel CDS circuit proposed in this paper contains MOS switches that make it possible for the capacitance of a conventional CDS circuit to function as a charge pump, so that the proposed APS exhibits an extended dynamic range as well as reduced noise. The designed circuit was fabricated by using $0.35{\mu}m$ 2-poly 4-metal standard CMOS technology and its characteristics have been evaluated.

A Study on the Design of a Current Type ROIC for Uncooled Bolometer Thermal Image Sensor Using Correlated Double Sampling

  • Kwak, Sang-Hyeon;Lee, Po;Jung, Eun-Sik;Sung, Man-Young
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 하계학술대회 논문집
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    • pp.7-8
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    • 2009
  • In the presence of infrared light, a CMOS Readout IC (ROIC) for a microbolometer typed infrared sensor detects the voltage or current that is caused by the changing in resistance in the bolometer sensor. A serious problem in designing the ROIC is how the value of the bolometer and reference resistors vary because of variations in manufacturing process. Since different pixel have different, resistance values, sensor operations must contend with fixed pattern noise (FPN) problems. In this paper, we propose a novel technique to compensate for the fluctuation in reference resistance by tiling into account the process variation. By using constant current source basing and correlated double sampling, we solved FPN.

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Generalized Ratio-Cum-Product Type Estimator of Finite Population Mean in Double Sampling for Stratification

  • Tailor, Rajesh;Lone, Hilal A.;Pandey, Rajiv
    • Communications for Statistical Applications and Methods
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    • 제22권3호
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    • pp.255-264
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    • 2015
  • This paper addressed the problem of estimation of finite population mean in double sampling for stratification. This paper proposed a generalized ratio-cum-product type estimator of population mean. The bias and mean square error of the proposed estimator has been obtained upto the first degree of approximation. A particular member of the proposed generalized estimator was identified and studied from a comparison point of view. It is observed that the identified particular estimator is more efficient than usual unbiased estimator and Ige and Tripathi (1987) estimators. An empirical study was conducted in support of the theoretical findings.