• 한국신뢰성학회지:신뢰성응용연구
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• 제14권1호
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• pp.53-57
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• 2014

In the fields of reliability application, the most commonly used test methods for reliability demonstration are zero-failure acceptance tests since they require fewer test samples and less test time compared to other test methods that guarantee the same reliability with a given confidence level. For products with lognormal lifetime distribution, the value of scale parameter is usually assumed to be known in designing reliability demonstration tests. It is important to select correct values of scale parameters to guarantee the specified reliability with given confidence level exactly. The effect of using wrong values of scale parameters in designing reliability demonstration test for products with lognormal lifetime distribution is examined and selecting proper values of scale parameters for conservative reliability demonstration is discussed.

• 한국신뢰성학회지:신뢰성응용연구
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• 제14권4호
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• pp.220-224
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• 2014

A Bayesian zero-failure reliability demonstration test method for products with Weibull lifetime distribution is presented. Inverted gamma prior distribution for the scale parameter of the Weibull distribution is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantee specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.

• 한국신뢰성학회지:신뢰성응용연구
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• 제13권1호
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• pp.1-10
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• 2013

A Bayesian zero-failure reliability demonstration test method for products with exponential lifetime distribution is presented. Beta prior distribution for reliability of a product is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantees specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.

• 산업경영시스템학회지
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• 제35권2호
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• pp.98-105
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• 2012

This paper describes the Bayesian approach for reliability demonstration test based on the samples from a finite population. The Bayesian approach involves the technical method about how to combine the prior distribution and the likelihood function to produce the posterior distribution. In this paper, the hypergeometric distribution is adopted as a likelihood function for a finite population. The conjugacy of the beta-binomial distribution and the hypergeometric distribution is shown and is used to make a decision about whether to accept or reject the finite population judging from a viewpoint of faulty goods. A numerical example is also given.

• 한국신뢰성학회지:신뢰성응용연구
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• 제15권3호
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• pp.170-175
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• 2015

Reliability demonstration tests (RDT's) are widely employed in design verification and process validation stages of industry. New mixed attribute-variable RDT plans that compromise demerits of the corresponding zero and zero or one failure plans which are common in practice are developed for the exponential distribution. The proposed mixed plans are compared with the typical RDT plans in terms of probability of acceptance and expected test termination time. A numerical example is provided to illustrate the mixed plans and a procedure to extend these plans to the Weibull distribution with known shape parameter is also presented.

• Nuclear Engineering and Technology
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• 제48권3호
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• pp.711-718
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• 2016

Steady-state operation of a fusion power plant requires external current drive to minimize the power requirements, and a high fraction of bootstrap current is required. One of the external sources for current drive is lower hybrid current drive, which has been widely applied in many tokamaks. Here, using lower hybrid simulation code, we calculate electron distribution function, electron currents and phase velocity changes for two options of demonstration reactor at the launched lower hybrid wave frequency 5 GHz. Two plasma scenarios pertaining to two different demonstration reactor options, known as pulsed (Option 1) and steady-state (Option 2) models, have been analyzed. We perceive that electron currents have major peaks near the edge of plasma for both options but with higher efficiency for Option 1, although we have access to wider, more peripheral regions for Option 2. Regarding the electron distribution function, major perturbations are at positive velocities for both options for flux surface 16 and at negative velocities for both options for flux surface 64.

• 대한산업공학회지
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• 제43권2호
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• pp.147-153
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• 2017

In order to demonstrate a target reliability with a specified confidence level, a new two-stage Bayesian Reliability Demonstration Test (RDT) plans that is known to be more effective than a corresponding single-stage one is proposed and developed by Bayesian framework with beta prior distribution for Weibull life time distribution. A numerical example is provided to illustrate the proposed RDT plans and compared with other non-Bayesian and Bayesian plans. Comparative results show that the proposed Bayesian two-stage plans have some merits in terms of required and expected testing time and probability of acceptance.

• 한국신뢰성학회지:신뢰성응용연구
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• 제12권1호
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• pp.47-56
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• 2012

Reliability demonstration tests with zero-failure acceptance criterion are most commonly used in the field of reliability application since they require fewer test samples and less test time compared to other test methods that guarantee the same reliability with a given confidence level. For products with lognormal lifetime distribution, an economic zero-failure test plan is developed that minimizes the total cost related to perform a life test to guarantee a specified reliability of a product with a given confidence level. A numerical example is provided to illustrate the use of the proposed test plan.

• 전기학회논문지
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• 제61권7호
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• pp.966-973
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• 2012

In microgrid demonstration site, distributed generations can make bidirectional power flows on the system. If an accident occurs, the fault current from the inverter based distributed generation is small. However, the conventional protection scheme in distribution network is designed to operate at high fault current. This means that the traditional protection of distribution network is no longer applicable and new protection methods must be developed. In this paper, for two cases, algorithms for protection coordination of demonstration site is proposed and verified through PSCAD/EMTDC simulation. In first case, protection devices are assumed to have the abilities of directional relaying and communication. In second case, protection devices do not have those abilities. Proposed protection coordination algorithms detect the fault locations and protect the microgrid fairly well.

• 품질경영학회지
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• 제39권2호
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• pp.313-319
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• 2011

In design verification and process validation stages, reliability demonstration tests(RDT's) are common practice in industry, A new two-stage RDT that is known to be more efficient than a corresponding single-stage one in terms of expected test duration for Weibull distribution is proposed. Zero or one failure two-stage plans to minimize expected test duration under Type I and hybrid censoring subject to satisfying consumer's risk at a specified reliability target are developed and a numerical example is provided to illustrate the proposed two-stage RDT plans and compared with other one- and two-stage plans.