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A Statistical Design of Bayesian Two-Stage Reliability Demonstration Test for Product Qualification in Development Process

개발단계의 제품 인증을 위한 베이지언 2단계 신뢰성 실증시험의 통계적 설계

  • Seo, Sun-Keun (Department of Industrial & Management Systems Engineering, Dong-A University)
  • 서순근 (동아대학교 산업경영공학과)
  • Received : 2016.10.28
  • Accepted : 2017.02.02
  • Published : 2017.04.15

Abstract

In order to demonstrate a target reliability with a specified confidence level, a new two-stage Bayesian Reliability Demonstration Test (RDT) plans that is known to be more effective than a corresponding single-stage one is proposed and developed by Bayesian framework with beta prior distribution for Weibull life time distribution. A numerical example is provided to illustrate the proposed RDT plans and compared with other non-Bayesian and Bayesian plans. Comparative results show that the proposed Bayesian two-stage plans have some merits in terms of required and expected testing time and probability of acceptance.

Keywords

References

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