• The Transactions of The Korean Institute of Electrical Engineers
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• v.67 no.6
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• pp.745-752
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• 2018

ICs(Integrated circuits) for nuclear power plant exposed to radiation environment occur malfunctions and data errors by the TID(Total ionizing dose) effects among radiation-damage phenomenons. In order to protect ICs from the TID effects, this paper proposes a radiation-hardening of the logic circuit(D-latch) which used for the data synchronization and the clock division in the ICs design. The radiation-hardening technology in the logic device(NAND) that constitutes the proposed RH(Radiation-hardened) D-latch is structurally more advantageous than the conventional technologies in that it keeps the device characteristics of the commercial process. Because of this, the unit cell based design of the RH logic device is possible, which makes it easier to design RH ICs, including digital logic circuits, and reduce the time and cost required in RH circuit design. In this paper, we design and modeling the structure of RH D-latch based on commercial $0.35{\mu}m$ CMOS process using Silvaco's TCAD 3D tool. As a result of verifying the radiation characteristics by applying the radiation-damage M&S (Modeling&Simulation) technique, we have confirmed the radiation-damage of the standard D-latch and the RH performance of the proposed D-latch by the TID effects.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.3
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• pp.1-6
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• 2011

Low-power logic gates, i.e. inverter, NAND, and NOR, are proposed employing only n-channel oxide thin film transistors (TFTs). The proposed circuits were designed to prevent the pull-up and pull-down switches from being turned on simultaneously by using asymmetric feed-through and bootstrapping, thereby exhibited same output voltage swing as the input signal and no static current. The inverter is composed of 5 TFTs and 2 capacitors. The NAND and the NOR gates consist of 10 TFTs and 4 capacitors respectively. The operations of the logic gates were confirmed successfully by SPICE simulation using oxide TFT model.

• Proceedings of the KAIS Fall Conference
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• 2003.06a
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• pp.208-210
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• 2003

In spite of the presence of various kind of Integrated Circuits it's not always easy to get the right part. Besides, it is hard to find a vendor fer a small quantity consumers like who develop prototype applications. In this study, we've tried to get the logical signals from the PC based device we've developed that correspondents with the real ICs. It can emulate decoder ICs, multiplexers, demultiplexers and basic logic gates.

• Proceedings of the KIEE Conference
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• 2004.07d
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• pp.2487-2488
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• 2004

In suite or the presence or various kind of Integrated Circuits it's not always easy to get the right part. Besides, it is hard to find a vendor for a small quantity consumers like who develop prototype applications. In this study, we've tried to get the logical signals from the PC based device we've developed that correspondents with the real ICs. It can emulate decoder ICs, multiplexers, demultiplexers and basic logic gates.

• Proceedings of the KIEE Conference
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• 2000.07d
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• pp.2802-2803
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• 2000

In spite of the presence of various kind of Integrated Circuits it's not always easy to get the right part. Besides, it is hard to find a vendor for a small Quantity consumers like who develop prototype applications. In this study, we've tried to get the logical signals from the PC based device we've developed that correspondents with the real ICs. It can emulate decoder ICs, multiplexers, demultiplexers and basic logic gates.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.16 no.4
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• pp.301-308
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• 1991

In this paper, we have proposed a demodulation circuit of radio data receiver system and calculated the error probability of the digital transmitted signal corrupted under noise environment. And we have evaluated the error performance of the proposed system. The designed demodulation circuits have been implemented by using the general random logic and PLL circuits, which can be possible for the integrated circuit design of the radio data receiver system. In addition calculation of bit error rate in recovered digital signal has been accomplished ans we have confirmed that the proposed system hsa the equivalent performance with already existing ones.

• 제어로봇시스템학회:학술대회논문집
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• 2001.10a
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• pp.107.1-107
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• 2001

In this paper, a digital signal processing circuit for Position Sensitive Detectors(PSDs) is introduced to substitute the conventional analog signal processing circuit and to compensate disadvantages of the PSD. In general, the analog circuits have the problems such as noise accumulation, sensitivity for environmental changes, and high cost for manufacturing. Moreover, the intrinsic nonlinearity problem of the PSD makes it hard to measure the position accurately because it is difficult to be overcome the problem by using the conventional analog circuits, which can be solved by using the digital signal processing circuit. The circuit is implemented by using a Field Programmable Gate Array (FPGA). The Pulse Amplitude Modulation(PAM) method is used for reducing the environmental noise effect, and a linear interpolation logic is used to compensate the ...

• Proceedings of the KIEE Conference
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• 1999.11c
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• pp.784-787
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• 1999

The 74LS49 and 74LS47 chips are MSI circuits and are used for decoding the BCD input and driving seven-segment displays. The logic of these chips are often used not only as component chips in the commercial digital systems, but are used as library components in fairly complicated ASIC designs. Thus, the understanding of the logic characteristics of these chips is beneficial for future applications. It was analyzed reversely that the design of these chips includes a special logic minimization technique, which neither documented nor reported. This paper is to analyze the function of the logic and the special minimization technique adapted in the design of 74LS49 and 74LS47 chips.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.6
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• pp.206-219
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• 1996

This paper describes a data structure and evaluation algorithm to improve the perofmrances MOS logic-with-timing simulation in computation and accuracy. In order to efficiently simulate the logic and timing of driver-load networks, (1) a tree data structure to represent the mutual interconnection topology of switches and nodes in the driver-lod network, and (2) an algebraic modeling to efficiently deal with the new represetnation, (3) an evaluation algorithm to compute the linear resistive and capacitive behavior with the new modeling of driver-load networks are developed. The higher modeling presented here supports the structural and functional compatibility with the linear switch-level to simulate the logic-with-timing of digital MOS circuits at a mixed-level. This research attempts to integrate the new approach into the existing simulator RSIM, which yield a mixed-klevel logic-with-timing simulator MIXIM. The experimental results show that (1) MIXIM is a far superior to RSIM in computation speed and timing accuracy; and notably (2) th etiming simulation for driver-load netowrks produces the accuracy ranged within 17% with respect ot the analog simulator SPICE.

• ETRI Journal
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• v.43 no.4
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• pp.728-745
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• 2021

Carbon nanotube field-effect transistors (CNTFETs) have been widely studied as a promising technology to be included in post-complementary metal-oxide-semiconductor integrated circuits. Despite significant advantages in terms of delay and power dissipation, the fabrication process for CNTFETs is plagued by fault occurrences. Therefore, developing a fast and accurate method for estimating the reliability of CNTFET-based digital circuits was the main goal of this study. In the proposed method, effects related to faults that occur in a gate's transistors are first represented as a probability transfer matrix. Next, the target circuit's graph is traversed in topological order and the reliabilities of the circuit's gates are computed. The accuracy of this method (less than 3% reliability estimation error) was verified through various simulations on the ISCAS 85 benchmark circuits. The proposed method outperforms previous methods in terms of both accuracy and computational complexity.