• Journal of Life Science
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• v.12 no.2
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• pp.208-212
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• 2002

Human $\varepsilon$-globin DNA fragment was used to determine the thermal stabilities of base pairs at d(CXG) and d(GXC) by Temperature Gradient Gel Electrophoresis(TGGE). The base pair stability depends on the hydrogen bonding interaction and base stacking interaction of neighbor base sequence. The orders of base pair stabilities were T.AG.A = A.G>C.T>T.C>C.A>A.C for d(GXC).d(GYC).

• Journal of KIISE:Computer Systems and Theory
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• v.36 no.5
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• pp.344-350
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• 2009

In this paper, we propose a new interconnection network, hierarchical odd network HON($C_d,C_d$), which used the odd network as basic modules. We investigate various topological properties of HON($C_d,C_d$), including connectivity, routing algorithm, diameter and broadcasting. We show that HON($C_d,C_d$) outperforms the three networks, i.e. the odd network, HCN(m,m), and HFN(m,m).

• Journal of applied mathematics & informatics
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• v.42 no.3
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• pp.511-520
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• 2024

In this paper, we introduce the concept of split and non-split tree (D, C)- set of a connected graph G and its associated color variable, namely split tree (D, C) number and non-split tree (D, C) number of G. A subset S ⊆ V of vertices in G is said to be a split tree (D, C) set of G if S is a tree (D, C) set and ⟨V - S⟩ is disconnected. The minimum size of the split tree (D, C) set of G is the split tree (D, C) number of G, γ_χST (G) = min{|S| : S is a split tree (D, C) set}. A subset S ⊆ V of vertices of G is said to be a non-split tree (D, C) set of G if S is a tree (D, C) set and ⟨V - S⟩ is connected and non-split tree (D, C) number of G is γ_χST (G) = min{|S| : S is a non-split tree (D, C) set of G}. The split and non-split tree (D, C) number of some standard graphs and its compliments are identified.

• Journal of the Korean Mathematical Society
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• v.45 no.1
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• pp.249-271
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• 2008

We prove the Hyers-Ulam stability of linear d-isometries in linear d-normed Banach modules over a unital $C^*-algebra$ and of linear isometries in Banach modules over a unital $C^*-algebra$. The main purpose of this paper is to investigate d-isometric $C^*-algebra$ isomor-phisms between linear d-normed $C^*-algebras$ and isometric $C^*-algebra$ isomorphisms between $C^*-algebras$, and d-isometric Poisson $C^*-algebra$ isomorphisms between linear d-normed Poisson $C^*-algebras$ and isometric Poisson $C^*-algebra$ isomorphisms between Poisson $C^*-algebras$. We moreover prove the Hyers-Ulam stability of their d-isometric homomorphisms and of their isometric homomorphisms.

• Bulletin of the Korean Mathematical Society
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• v.37 no.4
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• pp.803-810
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• 2000

Let N($d_1,...,{\;}d_n;c_1,...,{\;}c_n$) be the number of solutions $(x_1,...,{\;}x_n){\in}F^{n}_p$ of the diagonal equation $c_lx_1^{d_1}+c_2x_2^{d_2}+{\cdots}+c_nx_n^{d_n}{\;}={\;}0{\;}n{\geq},{\;}c_j{\;}{\in}{\;}F^{*}_q,{\;}j=1,2,...,{\;}n$ where $d_j{\;}>{\;}1{\;}and{\;}d_j{\;}$\mid${\;}q{\;}-{\;}1$ for all j = 1,2,..., n. In this paper, we find all n-tuples ($d_1,...,{\;}d_n$) such that the reduced form of ($d_1,...,{\;}d_n$) and N($d_1,...,{\;}d_n;c_1,...,{\;}c_n$) are the same as in the theorem obtained by Sun Qi [3]. Improving this, we also get an explicit formula for the number of solutions of the diagonal equation, unver a certain natural restriction on the exponents.

• Korean Journal of Mathematics
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• v.27 no.2
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• pp.437-444
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• 2019

For c > -1, let ${\nu}_c$ denote a weighted radial measure on ${\mathbb{C}}$ normalized so that ${\nu}_c(D)=1$. For $c_1,c_2>-1$ and $f{\in}L^1(D^2,\;{\nu}_{c_1}{\times}{\nu}_{c_2})$, we define the weighted Berezin transform $B_{c_1,c_2}f$ on $D^2$ by $$(B_{c_1,c_2})f(z,w)={\displaystyle{\smashmargin2{\int\nolimits_D}{\int\nolimits_D}}}f({\varphi}_z(x),\;{\varphi}_w(y))\;d{\nu}_{c_1}(x)d{\upsilon}_{c_2}(y)$$. This paper is about the space $M^p_{c_1,c_2}$ of function $f{\in}L^p(D^2,\;{\nu}_{c_1}{\times}{\nu}_{c_2})$ ) satisfying $B_{c_1,c_2}f=f$ for $1{\leq}p<{\infty}$. We find the identity operator on $M^p_{c_1,c_2}$ by using invariant Laplacians and we characterize some special type of functions in $M^p_{c_1,c_2}$.

• Journal of the Korean Vacuum Society
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• v.5 no.3
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• pp.229-238
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• 1996

The electromigration phenomena and the characterizations of the conductor lifetime (Time-To-Failure, TTF) in Al-1%Si thin film interconnections under D.C. and Pulsed D.C. conditions were investigated . Meander type test patterns were fabricated with the dimensions of 21080$mu \textrm{m}$ length, 3$\mu\textrm{m}$ width, 0.7$\mu\textrm{m}$ thickness and the 0.1$\mu\textrm{m}$/0.8$\mu\textrm{m}$($SiO_2$/PSG)dielectric overlayer. The current densities of $2 \times10^6 A/\textrm{cm}^2$ and $1 \times10^7 A/\textrm{cm}^2$ were stressed in Al-1%Si thin film interconnection s under a D.C. condition. The peak current densities of $2 \times10^6 A/\textrm{cm}^2$ and $1 \times10^7 A/\textrm{cm}^2$ were also applied under a Pulsed D.C. condition at frequencies of 200KHz, 800KHz, 1MHz, and 4MHz with the duty factor of 0.5. THe time-to-failure under a Pulsed D.C.($TTF_{pulsed D.C}$) was appeared to be larger than that under a D.C. condition. It was found that the TTF under both a D.C. and a Pulsed D.C. condition. It was found that the TTF under both a D.C. and a Pulsed D.C. condition largely depends upon the appiled current densities respectively . This can be explained by a relaxation mechanism view due to a duty cycle under a Pulsed D.C. related to the wave on off. The relaxation phenomena during the pulsed off period result in the decayof excess vacancies generated in the Al-1%Si thin film interconnections because of the electrical and mechanical stress gradient . Hillocks and voids formed by an electromigration were observed by using a SEM (Scanning Electron Microscopy).

• Korean Journal of Mathematics
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• v.18 no.4
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• pp.335-342
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• 2010

Let D be an integral domain with quotient field K,$\mathcal{I}(D)$ be the set of nonzero ideals of D, and $w$ be the star-operation on D defined by $I_w=\{x{\in}K{\mid}xJ{\subseteq}I$ for some $J{\in}\mathcal{I}(D)$ such that J is finitely generated and $J^{-1}=D\}$. The D is called a Pr$\ddot{u}$fer $v$-multiplication domain if $(II^{-1})_w=D$ for all nonzero finitely generated ideals I of D. In this paper, we show that D is a Pr$\ddot{u}$fer $v$-multiplication domain if and only if $(A{\cap}(B+C))_w=((A{\cap}B)+(A{\cap}C))_w$ for all $A,B,C{\in}\mathcal{I}(D)$, if and only if $(A(B{\cap}C))_w=(AB{\cap}AC)_w$ for all $A,B,C{\in}\mathcal{I}(D)$, if and only if $((A+B)(A{\cap}B))_w=(AB)_w$ for all $A,B{\in}\mathcal{I}(D)$, if and only if $((A+B):C)_w=((A:C)+(B:C))_w$ for all $A,B,C{\in}\mathcal{I}(D)$ with C finitely generated, if and only if $((a:b)+(b:a))_w=D$ for all nonzero $a,b{\in}D$, if and only if $(A:(B{\cap}C))_w=((A:B)+(A:C))_w$ for all $A,B,C{\in}\mathcal{I}(D)$ with B, C finitely generated.

• Korean Journal of Mathematics
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• v.19 no.1
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• pp.17-24
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• 2011

Let X, Y be vector spaces. It is shown that if an even mapping $f:X{\rightarrow}Y$ satisfies f(0) = 0, and $$2(_{2d-2}C_{d-1}-_{2d-2}C_d)f\({\sum_{j=1}^{2d}}x_j\)+{\sum_{{\iota}(j)=0,1,{{\small\sum}_{j=1}^{2d}}{\iota}(j)=d}}\;f\({\sum_{j=1}^{2d}}(-1)^{{\iota}(j)}x_j\)=2(_{2d-1}C_d+_{2d-2}C_{d-1}-_{2d-2}C_d){\sum_{j=1}^{2d}}f(x_j)$$ for all $x_1$, ${\cdots}$, $x_{2d}{\in}X$, then the even mapping $f:X{\rightarrow}Y$ is quadratic. Furthermore, we prove the Hyers-Ulam stability of the above functional equation in Banach spaces.

• Korean Journal of Mathematics
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• v.20 no.4
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• pp.371-379
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• 2012

Let D be an integral domain, $\bar{D}$ be the integral closure of D, * be a star operation of finite character on D, $*_w$ be the so-called $*_w$-operation on D induced by *, X be an indeterminate over D, $N_*=\{f{\in}D[X]{\mid}c(f)^*=D\}$, and $Kr(D,*)=\{0\}{\cup}\{\frac{f}{g}{\mid}0{\neq}f,\;g{\in}D[X]$ and there is an $0{\neq}h{\in}D[X]$ such that $(c(f)c(h))^*{\subseteq}(c(g)c(h))^*$}. In this paper, we show that D is a *-quasi-Pr$\ddot{u}$fer domain if and only if $\bar{D}[X]_{N_*}=Kr(D,*_w)$. As a corollary, we recover Fontana-Jara-Santos's result that D is a Pr$\ddot{u}$fer *-multiplication domain if and only if $D[X]_{N_*} = Kr(D,*_w)$.